Lateral support for downhole electronics
Apparatus include a downhole tool comprising an outer member; and a probe body positioned inside the outer member; an electronics carrier positioned inside the probe body; and a lateral support system, including members cooperating to maintain a relative position of the electronics carrier with respect to the probe body, and a biasing member. The plurality of members may include an outer support ring having an axial passage therethrough for receiving the electronics carrier, the outer support ring having an inner surface; and an inner support ring within the probe body having an axial passage therethrough for receiving the electronics carrier, the inner support ring having an outer surface. The biasing member may be configured to urge a member of the plurality of members against an inner surface of the probe body by urging the outer surface of the inner support ring against the inner surface of the outer support ring.
1. An apparatus for use in a borehole intersecting an earth formation, the apparatus comprising:
a downhole tool comprising an outer member configured for conveyance in the borehole;
a probe body positioned inside the outer member;
an electronics carrier positioned inside the probe body; and
a lateral support system comprising:
a plurality of members cooperating to maintain a relative position of the electronics carrier with respect to the probe body, the plurality of members comprising:
an outer support ring within the probe body having an axial passage therethrough for receiving a portion of the electronics carrier, the outer support ring having an inner surface;
an inner support ring within the probe body having an axial passage therethrough for receiving a second portion of the electronics carrier, the inner support ring having an outer surface; and
a biasing member configured to urge a member of the plurality of members against an inner surface of the probe body by urging the outer surface of the inner support ring against the inner surface of the outer support ring, and thereby maintaining separation of the probe body and the electronics carrier.
2. The apparatus of claim 1 , wherein the outer surface of the inner support ring comprises a frustoconical section.
3. The apparatus of claim 1 , wherein the inner surface comprises an angled seat for receiving the inner support ring such that the outer support ring deforms upon receiving the inner support ring at the seat.
4. The apparatus of claim 1 , wherein the member urged against the inner surface of the probe body is the outer support ring.
5. The apparatus of claim 1 , wherein at least one of the outer support ring and the inner support ring is made up of a polyaryletherketone material.
6. The apparatus of claim 1 , wherein at least one of the inner support ring and the outer support ring comprises at least one slot.
7. The apparatus of claim 1 , further comprising a constraint restricting axial movement of the outer support ring with respect to the electronics carrier without restricting the axial movement of the outer support ring with respect to the probe body.
8. The apparatus of claim 7 , wherein the constraint comprises at least one of:
i) an upset on the outer support ring configured to engage a groove in an outer surface of the electronics carrier, and
ii) a band on the outer surface of the electronics carrier configured to engage a groove in the outer support ring.
9. The apparatus of claim 1 , wherein the biasing member is made of metal.
10. The apparatus of claim 9 , wherein the metal is non-magnetic.
11. The apparatus of claim 1 , wherein the biasing member is confined to an annular space defined by the probe body and the electronics carrier by a shoulder.
12. The apparatus of claim 11 , wherein the shoulder comprises a circumferential dovetail on the electronics carrier.
13. The apparatus of claim 1 , further comprising a constraint restricting axial movement of the inner support ring with respect to the electronics carrier.
14. The apparatus of claim 13 , wherein the constraint comprises an upset on the inner support ring configured to engage a groove in an outer surface of the electronics carrier, wherein the groove is defined by a ledge comprising a circumferential dovetail.
15. The apparatus of claim 1 , wherein the probe body comprises a pressure barrel.