Semiconductor device manufacturing method and recording medium

1. A method of manufacturing a semiconductor device, comprising:

preparing a substrate processing apparatus including:

a substrate process chamber having a plasma generation space where a supplied nitrogen-containing gas is plasma-excited and a substrate process space where a substrate is mounted at the time of processing the substrate in communication with the plasma generation space;

an inductive coupling structure including a coil installed to be wound around an outer periphery of the plasma generation space and an impedance matching circuit connected to the coil, wherein an electric field combining the coil and the impedance matching circuit has a length of an integer multiple of a wavelength of an applied high-frequency power;

a substrate mounting table configured to mount the substrate at a position under a lower end of the coil; and

an elevating mechanism configured to move the substrate mounting table up and down to adjust a distance between the substrate mounted on the substrate mounting table and the lower end of the coil;

mounting the substrate, on which a structure having an aspect ratio of 10 or greater is formed, on the substrate mounting table;

adjusting, by the elevating mechanism, the distance between the substrate and the lower end of the coil to become a predetermined distance that falls within a range of 40 to 200 mm;

supplying the nitrogen-containing gas into the substrate process chamber;

starting a plasma excitation of the nitrogen-containing gas in the plasma generation space by applying the high-frequency power to the coil; and

nitriding a surface of the substrate with an active species containing a nitrogen element generated by the plasma excitation, the nitrogen element being derived from the nitrogen-containing gas in the plasma generation space, the active species being supplied into the structure on the substrate to react with at least a bottom surface and a side surface of the structure,

wherein in the act of nitriding the surface of the substrate, an internal pressure of the substrate process chamber is set to fall within a range of 1 to 100 Pa such that at least the bottom surface and the side surface of the structure are uniformly nitrided, and

wherein in the act of adjusting the distance between the substrate and the lower end of the coil, the predetermined distance is adjusted to adjust a film thickness of a nitride film that is formed in the act of nitriding the surface of the substrate.

2. The method of claim 1 , wherein the surface of the substrate includes at least one selected from the group consisting of a silicon-containing film, a metal-containing film, and a high-k film.

3. The method of claim 1 , in the act of nitriding the surface of the substrate, wherein the internal pressure of the substrate process chamber is set to fall within a range of 3 to 10 Pa.

4. The method of claim 1 , wherein the substrate mounting table includes a heater configured to heat the mounted substrate, and

in the act of nitriding the surface of the substrate, the substrate is heated to a temperature which falls within a range of 650 to 900 degrees C. by the heater.

5. The method of claim 1 , in the act of supplying the nitrogen-containing gas into the substrate process chamber, wherein a nitrogen gas alone is supplied into the substrate process chamber.

6. The method of claim 1 , wherein the nitrogen-containing gas is a mixture of a nitrogen gas and a hydrogen gas.

7. The method of claim 6 , wherein a ratio of flow rate of the nitrogen gas and the hydrogen gas is 1:1.

8. The method of claim 1 , wherein the nitrogen-containing gas is a nitrogen gas, an ammonia gas, or a mixture of the nitrogen gas and the ammonia gas.

9. A non-transitory computer-readable recording medium storing a program that causes a computer to perform a process, in a substrate processing apparatus including:

a substrate process chamber having a plasma generation space where a supplied nitrogen-containing gas is plasma-excited and a substrate process space where a substrate is mounted at the time of processing the substrate in communication with the plasma generation space;

an inductive coupling structure including a coil installed to be wound around an outer periphery of the plasma generation space and an impedance matching circuit connected to the coil, wherein an electric field combining the coil and the impedance matching circuit has a length of an integer multiple of a wavelength of an applied high-frequency power;

a substrate mounting table configured to mount the substrate at a position under a lower end of the coil; and

an elevating mechanism configured to move the substrate mounting table up and down to adjust a distance between the substrate mounted on the substrate mounting table and the lower end of the coil, the process comprising;

mounting the substrate, on which a structure having an aspect ratio of 10 or greater is formed, on the substrate mounting table;

adjusting, by the elevating mechanism, the distance between the substrate and the lower end of the coil to become a predetermined distance that falls within a range of 40 to 200 mm;

supplying the nitrogen-containing gas into the substrate process chamber;

starting a plasma excitation of the nitrogen-containing gas in the plasma generation space by applying the high-frequency power to the coil; and

nitriding a surface of the substrate with an active species containing a nitrogen element generated by the plasma excitation, the nitrogen element being derived from the nitrogen-containing gas in the plasma generation space, the active species being supplied into the structure on the substrate to react with at least a bottom surface and a side surface of the structure,

wherein in the act of nitriding the surface of the substrate, an internal pressure of the substrate process chamber is set to fall within a range of 1 to 100 Pa such that at least the bottom surface and the side surface of the structure are uniformly nitrided, and

wherein in the act of adjusting the distance between the substrate and the lower end of the coil, the predetermined distance is adjusted to adjust a film thickness of a nitride film that is formed in the act of nitriding the surface of the substrate.