Detachable probe card interface

1. A probe card interface, comprising:

a space transformer including a plurality of first electrical contacts and a plurality of second electrical contacts, wherein the first electrical contacts are coupled to the second electrical contacts through one or more layers of the space transformer;

a deformable connector including a plurality of conductive particles arranged in columns coinciding with the plurality of second electrical contacts, wherein the conductive particles are configured to compress with one another when one or more forces are exerted on the deformable connector; and

a carrier board, disposed between the space transformer and the deformable connector, to add rigidity to the space transformer and prevent the space transformer from bending under external forces, the carrier board including:

a plurality of vias aligned with the plurality of second electrical contacts on the space transformer; and

a plurality of conductors disposed within the vias, wherein each of the conductors is coupled to a respective one of the second electrical contacts and protrudes into the deformable connector to establish a transmission path between the second electrical contact and one or more columns of the conductive particles.

2. The probe card interface of claim 1 , wherein the deformable connector further comprises:

an elastic shield disposed around each column of the conductive particles, wherein the elastic shield is configured to deform when the one or more forces are exerted on the deformable connector.

3. The probe card interface of claim 1 , wherein the columns of conductive particles are configured to establish a transmission path along a cross-section of the deformable connector when the one or more forces are exerted on the deformable connector.

4. The probe card interface of claim 1 , wherein the one or more forces are provided, at least in part, by the plurality of conductors protruding into the deformable connector.

5. The probe card interface of claim 1 , wherein the carrier board comprises a layer of ceramic material to provide structural support for the space transformer.

6. A probe head assembly, comprising:

a probe head including a plurality of pins;

a space transformer including a plurality of first electrical contacts and a plurality of second electrical contacts, wherein the first electrical contacts are coupled to the second electrical contacts through one or more layers of the space transformer;

a deformable connector including a plurality of conductive particles arranged in columns coinciding with the plurality of second electrical contacts, wherein the conductive particles are configured to compress with one another when one or more forces are exerted on the deformable connector; and

a carrier board, disposed between the space transformer and the deformable connector, to add rigidity to the space transformer and prevent the space transformer from bending under external forces, the carrier board including:

a plurality of vias aligned with the plurality of second electrical contacts on the space transformer; and

a plurality of conductors disposed within the vias, wherein each of the conductors is coupled to a respective one of the second electrical contacts and protrudes into the deformable connector to establish a transmission path between the second electrical contact and one or more columns of the conductive particles.

7. The probe head assembly of claim 6 , wherein the deformable connector further comprises:

an elastic shield disposed around each column of the conductive particles, wherein the elastic shield is configured to deform when the one or more forces are exerted on the deformable connector.

8. The probe head assembly of claim 6 , wherein the columns of conductive particles are configured to establish a transmission path along a cross-section of the deformable connector when the one or more forces are exerted on the deformable connector.

9. The probe head assembly of claim 6 , wherein the one or more forces are provided, at least in part, by the plurality of conductors protruding into the deformable connector.

10. The probe head assembly of claim 6 , wherein the carrier board comprises a layer of ceramic material to provide structural support for the space transformer.

11. The probe head assembly of claim 6 , wherein the first electrical contacts on the space transformer are aligned with the plurality of pins in the probe head.

12. A probe card, comprising:

a first circuit including a plurality of electrical traces;

a probe head including a plurality of pins;

a space transformer including a plurality of first electrical contacts and a plurality of second electrical contacts, wherein the first electrical contacts are coupled to the second electrical contacts through one or more layers of the space transformer;

a deformable connector including a plurality of conductive particles arranged in columns coinciding with the plurality of second electrical contacts, wherein the conductive particles are configured to compress with one another when one or more forces are exerted on the deformable connector; and

a carrier board, disposed between the space transformer and the deformable connector, to add rigidity to the space transformer and prevent the space transformer from bending under external forces, the carrier board including:

a plurality of vias aligned with the plurality of second electrical contacts on the space transformer; and

a plurality of conductors disposed within the vias, wherein each of the conductors is coupled to a respective one of the second electrical contacts and protrudes into the deformable connector to establish a transmission path between the second electrical contact and one or more columns of the conductive particles.

13. The probe card of claim 12 , wherein the deformable connector further comprises:

an elastic shield disposed around each column of the conductive particles, wherein the elastic shield is configured to deform when the one or more forces are exerted on the deformable connector.

14. The probe card of claim 12 , wherein the columns of conductive particles are configured to establish a transmission path along a cross-section of the deformable connector when the one or more forces are exerted on the deformable connector.

15. The probe card of claim 12 , wherein the one or more forces are provided, at least in part, by the plurality of conductors protruding into the deformable connector.

16. The probe card of claim 12 , wherein the carrier board comprises a layer of ceramic material to provide structural support for the space transformer.

17. The probe card of claim 12 , wherein the first electrical contacts on the space transformer are aligned with the plurality of pins in the probe head of the probe card.

18. The probe card of claim 12 , wherein the first electrical contacts on the space transformer are aligned with the plurality of pins in the probe head, and wherein the second electrical contacts on the space transformer are aligned with the electrical traces on the first circuit.

19. The probe card of claim 12 , wherein an electrical connection is established between each of the plurality of pins and a respective one of the plurality of electrical traces when the one or more forces are exerted on the deformable connector.

20. The probe card of claim 12 , wherein the one or more forces are provided, at least in part, by one or more mechanisms used to mechanically couple the probe head to the first circuit.