Field effect transistor devices having gate contacts formed in active region overlapping source/drain contacts

1. A method for fabricating a semiconductor device, comprising:

forming a field effect transistor (FET) device on a semiconductor substrate, the FET device comprising a source/drain layer, and a gate structure comprising a gate electrode layer, a gate capping layer, and a gate sidewall spacer;

forming a first interlevel dielectric (ILD) layer;

forming a vertical source/drain contact in the first ILD layer in contact with the source/drain layer of the FET device;

forming a source/drain contact capping layer on an upper surface of the vertical source/drain contact;

forming a second ILD layer over the first ILD layer and the source/drain contact capping layer, wherein the second ILD layer is formed of a material which comprises etch selectivity with respect to the source/drain contact capping layer;

etching the second ILD layer to form a gate contact opening in the second ILD layer, wherein the gate contact opening exposes a portion of the gate structure and a portion of the source/drain contact capping layer, wherein the etching of the second ILD layer is performed selective to the source/drain capping layer so that source/drain capping layer is not etched when etching the second ILD layer to form the gate contact opening; and

forming a vertical gate contact in the gate contact opening of the second ILD layer, wherein a portion of the vertical gate contact overlaps a portion of the vertical source/drain contact, and wherein the source/drain contact capping layer electrically insulates the overlapping portions of the vertical gate contact and the vertical source/drain contact.

2. The method of claim 1 , wherein forming the source/drain contact capping layer comprises:

recessing an upper surface of the vertical source/drain contact down to a target depth below an upper surface of the first ILD layer;

depositing a layer of insulating material to cover the recessed surface of the vertical/source drain contact; and

performing a planarizing process to remove an overburden portion of the layer of insulating material down to an upper surface of the first ILD layer, wherein a remaining portion of the layer of insulating material forms the source/drain contact capping layer.

3. The method of claim 1 , wherein the source/drain contact capping layer is formed of silicon oxycarbide (SiCO).

4. The method of claim 1 , wherein forming the vertical gate contact comprises:

etching a portion of the gate capping layer exposed through the gate contact opening of the second ILD layer to expose a portion of the gate electrode layer of the gate structure, wherein etching the gate capping layer is performed using an etch process which is selective to the source/drain contact capping layer and to the gate sidewall spacer;

depositing a layer of metallic material to fill the gate contact opening of the second ILD layer with the metallic material; and

performing a planarizing process to remove an overburden portion of the layer of metallic material down to an upper surface of the second ILD layer, wherein a remaining portion of the layer of metallic material forms the vertical gate contact.

5. The method of claim 4 , wherein the source/drain contact capping layer is formed of silicon oxycarbide (SiCO), wherein the gate capping layer is formed of silicon nitride (SiN), and wherein the gate sidewall spacer is formed of silicon boron carbon nitride (SiBCN).

6. The method of claim 1 , further comprising forming a source/drain via contact in the second ILD layer in contact with the vertical source/drain contact, wherein a portion of the source/drain via contact overlaps a portion of the gate structure of the FET device, and wherein the source/drain via contact is electrically insulated from the gate electrode layer of the gate structure by the gate sidewall spacer and the gate capping layer.

7. The method of claim 1 , wherein the vertical source/drain contact and the vertical gate contact are formed of tungsten.

8. The method of claim 1 , wherein the FET device comprises a FinFET device.

9. The method of claim 1 , wherein the source/drain contact capping layer is formed of a material that has etch selectivity with respect to the gate capping layer and the gate sidewall spacer.