IC chips containing a mixture of standard cells obtained from an original set of design rules and enhanced standard cells that are a substantially uniform variant of the original set of design rules and methods for making the same

1. An integrated circuit, comprising:

an original set of at least twenty side-by-side abutting standard cells disposed within at least a first location of the integrated circuit and obtained from an original set of design rules, wherein the original set of standard cells is rectangular in shape, with a first height dimension defined by first opposing elongated rectangular power and ground rails that extend longitudinally along an entire cell width dimension, and wherein the original set of standard cells is further constrained with original regularity restrictions; and

an enhanced set of at least twenty side-by-side abutting enhanced standard cells disposed within at least a second location of the integrated circuit that is non-overlapping with the first location, wherein the enhanced set of standard cells is rectangular in shape, with a second height dimension defined by second opposing elongated rectangular power and ground rails that extend longitudinally along an entire cell width dimension, wherein the enhanced standard cells are obtained from an enhanced set of design rules, wherein the enhanced set of standard cells is further constrained with enhanced regularity restrictions, and wherein the enhanced set of standard cells is substantially uniform variant of the original set of standard cells.

2. The integrated circuit according to claim 1 wherein the substantially uniform variant includes an increased height-of transistor gates.

3. The integrated circuit according to claim 2 wherein the increased height of transistor gates is proportionally larger for all the enhanced standard cells of the enhanced set of enhanced standard cells as compared to an original functionally identical set of original standard cells obtained from the original set of design rules.

4. The integrated circuit according to claim 2 wherein the increased height of transistor gates is not the same for all the enhanced standard cells of the enhanced set of enhanced standard cells.

5. The integrated circuit according to claim 1 wherein the substantially uniform variant further includes a lengthening of metal conductor lines of the second opposing elongated rectangular power and ground rails of the enhanced standard cells as compared to the first opposing elongated rectangular power and ground rails of the original standard cells.

6. The integrated circuit according to claim 5 wherein the substantially uniform variant further includes an increased width of a power rail and a ground rail in the second opposing elongated rectangular power and ground rails of the enhanced standard cells as compared to the first opposing elongated rectangular power and ground rails of the original standard cells.

7. The integrated circuit according to claim 1 wherein the second location is a contiguous area that is adjacent the first location that is another contiguous area.

8. The integrated circuit according to claim 1 wherein a function of the enhanced set of enhanced standard cells includes at least one of AND, OR, NOT, NAND, NOR, XOR, XNOR, AOI, or OAI cells.