On-wafer calibration device
An on-wafer calibration device comprises on a substrate at least a first measuring port, at least a first switch element, at least two calibration standards, and a controller unit or a control interface for control of the first switch element. The first switch element is controlled in a manner that it selectively connects a wafer probe tip connectable to the first measuring port to the at least two calibration standards.
1. An on-wafer calibration device comprising on a substrate:
a first measuring port,
a first switch element,
at least two calibration standards, and
a controller unit or a control interface for control of the first switch element,
wherein the first switch element is controlled in a manner that it selectively connects a wafer probe tip connectable to the first measuring port to the at least two calibration standards.
2. The on-wafer calibration device according to claim 1 ,
wherein the first measuring port is implemented as a probe tip pad.
3. The on-wafer calibration device according to claim 1 ,
wherein the on-wafer calibration device comprises a second measuring port being arranged non-in-line with respect to the first measuring port.
4. The on-wafer calibration device according to claim 3 ,
wherein the second measuring port is arranged in a perpendicular or side-by-side manner with respect to the first measuring port.
5. The on-wafer calibration device according to claim 1 ,
wherein the on-wafer calibration device comprises at least two measuring ports, wherein the at least two measuring ports are arranged in groups of two to calibrate for mixed mode signals comprising common mode or differential mode signals.
6. The on-wafer calibration device according to claim 1 ,
wherein the on-wafer calibration device comprises at least four measuring ports, wherein the at least four measuring ports are arranged in groups of two to calibrate for mixed mode signals comprising common mode or differential mode signals.
7. The on-wafer calibration device according to claim 1 ,
wherein the at least two calibration standards comprise thru, open, match, short, reflect, line, attenuator or a predefined network.
8. The on-wafer calibration device according to claim 1 ,
wherein the on-wafer calibration device comprises a monolithic combination of switches and calibration standards on the same substrate.
9. The on-wafer calibration device according to claim 1 ,
wherein the on-wafer calibration device, especially the controller unit, comprises a temperature sensor for measuring the calibration device temperature.
10. The on-wafer calibration device according to claim 1 ,
wherein the on-wafer calibration device, especially the controller unit, comprises counter means for counting the numbers of calibration events.
11. The on-wafer calibration device according to claim 1 ,
wherein the substrate is a gallium arsenide substrate.
12. The on-wafer calibration device according to claim 1 ,
wherein the first switch element is a diode.
13. The on-wafer calibration device according to claim 12 ,
wherein the diode is an aluminum gallium arsenide diode.
14. The on-wafer calibration device according to claim 1 ,
wherein the on-wafer calibration device comprises a coating based on benzocyclobutene above the substrate.
15. The on-wafer calibration device according to claim 1 ,
wherein the controller unit is coated with a resin.
16. The on-wafer calibration device according to claim 1 ,
wherein the first measuring port comprises gold contacts.
17. The on-wafer calibration device according to claim 1 ,
wherein the controller unit uses an unused portion of the first measuring port to be calibrated with aid of the on-wafer calibration device for communication and power supply over at least one radio frequency cable.
18. A carrier comprising:
at least two on-wafer calibration devices on a substrate, each on-wafer calibration device comprising:
a first measuring port,
a first switch element,
at least two calibration standards, and
a controller unit or a control interface for control of the first switch element,
wherein the first switch element is controlled in a manner that it selectively connects a wafer probe tip connectable to the first measuring port to the at least two calibration standards.
19. A wafer measuring system comprising:
a temperature controlled wafer chuck comprising a support;
an on-wafer calibration device on a substrate, the on-wafer calibration device supported by the support and the on-wafer calibration device comprises:
a first measuring port,
a first switch element,
at least two calibration standards, and
a controller unit or a control interface for control of the first switch element,
wherein the first switch element is controlled in a manner that it selectively connects a wafer probe tip connectable to the first measuring port to the at least two calibration standards, and
wherein the chuck is settable to a predefined calibration temperature.