Non-contact velocity measurement instruments and systems, and related methods
Methods for calibration of non-contact velocity measurements and systems for implementing the same are described. Generally, the method comprises inducing a shock wave into a sample at a stress intensity that varies across the sample's elastic limit, which corresponds to the elastic-plastic state transition of the sample. That transition state may be at the sample's Hugoniot elastic limit. The velocity of the sample is measured using a non-contact velocity measurement instrument such as a velocimeter. The measurement may be compared to a predicted velocity or a velocity measurement made by another system to determine calibration parameters.
1. A method comprising:
inducing a wave into a sample to stress the sample at or above an elastic limit;
measuring a particle velocity while the sample is stressed at or above the elastic limit;
comparing the measured particle velocity to a predicted velocity; and
determining one or more calibration parameters responsive to the comparison.
2. The method of claim 1 , wherein the elastic limit is substantially at an elastic-plastic state transition of the sample.
3. The method of claim 1 , wherein the elastic limit is a Hugoniot elastic limit of the sample.
4. The method of claim 1 , wherein measuring the particle velocity associated with the elastic limit comprises measuring by a velocimetry system.
5. The method of claim 4 , wherein the velocimetry system is one of a laser-based system, a Fabry-Perot interferometer, and Doppler velocimeter.
6. The method of claim 1 , further comprising calibrating a measurement system responsive to the comparison.
7. The method of claim 1 , wherein at least one of the one or more calibration parameters comprises a fit function.
8. The method of claim 1 , wherein the wave is induced in a manner selected from the group consisting of a laser, projectile, explosion, hammer, and plate impact.
9. A method comprising:
inducing a wave into a sample to stress the sample at or above an elastic limit;
measuring a particle velocity while the sample is stressed at or above the elastic limit by a first measurement system;
comparing the measured particle velocity to a second particle velocity measured by a second measurement system; and
determining one or more calibration parameters for the first measurement system responsive to the comparison.
10. The method of claim 9 , further comprising:
determining one or more calibration parameters for the second measurement system responsive to the comparison.
11. The method of claim 9 , further comprising:
inducing a second wave into a second sample to stress the second sample at or above an elastic limit; and
measuring the second particle velocity while the second sample is stressed at or above the elastic limit by the second measurement system.
12. The method of claim 9 , wherein the elastic limit is substantially at an elastic-plastic state transition of a wave propagating in the sample.
13. The method of claim 9 , wherein the elastic limit is a Hugoniot elastic limit of the sample.
14. The method of claim 9 , wherein the first measurement system and the second measurement system are velocimetry measurement systems.
15. The method of claim 9 , the second measurement system is a standardized velocimetry system and the first measurement system is aligned with the second measurement system.
16. A system, comprising:
a stress generation source configured to induce a stress on a sample at or above an elastic limit of the sample;
a non-contact measurement instrument configured to:
obtain a first particle velocity measurement by measuring a particle velocity of the sample as it is stressed at or above the elastic limit of the sample;
compare the first particle velocity measurement to a second particle velocity measurement; and
determine one or more calibration parameters responsive to the comparison.
17. The system of claim 16 , wherein the elastic limit is substantially at an elastic-plastic state transition of a wave propagating in the sample.
18. The system of claim 16 , wherein the elastic limit is the Hugoniot elastic limit of the sample.
19. The system of claim 16 , wherein the second particle velocity measurement is a predicted measurement value, or a velocity measurement based on a measurement by a second non-contact measurement instrument.
20. The system of claim 16 , wherein measuring the particle velocity of the sample comprises measuring a time-varying stress field within the sample.
21. The system of claim 20 , wherein measuring the time-varying stress field within the sample comprises measuring the particle velocity at a free surface of the sample.
22. The system of claim 16 , wherein the non-contact measurement instrument is configured to generate a laser to interrogate the sample, and the stress generation source is arranged to induce a shock wave at substantially a same location on the sample as the laser interrogates the sample.
23. The system of claim 16 , wherein the non-contact measurement instrument is configured to generate a laser to interrogate the sample, and the stress generation source is arranged relative to the sample to induce a shock wave at a first location on the sample and the non-contact measurement instrument is arranged relative to the sample to interrogate the sample at a second location on the sample, wherein the first location and the second location are on opposite sides of the sample.
24. A method comprising:
inducing a wave into a sample to stress the sample at or above an elastic limit;
measuring a particle velocity while the sample is stressed at or above the elastic limit by a first measurement system;
determining an elastic limit of a material responsive to the measured particle velocity;
determining a mechanical property of the material responsive to the determined elastic limit; and
determining a change in the mechanical property of the material responsive to a change in a Hugoniot elastic limit.
25. The method of claim 24 , further comprising determining a change in the mechanical property of the material responsive to the determined elastic limit.
26. The method of claim 24 , further comprising adjusting the measured particle velocity responsive to a calibration parameter.
27. The method of claim 26 , wherein the calibration parameter comprises one or more of a fit function and operating parameters of the first measurement system.
28. The method of claim 24 , wherein the elastic limit is a transition phase of the wave, the transition phase comprising an inelastic wave interfering with an elastic wave.
29. A system, comprising:
a sample; and
a monitoring system configured to monitor the sample by:
inducing a wave into the sample to stress the sample at or above an elastic limit;
measuring a particle velocity while the sample is stressed at or above the elastic limit by a measurement system;
determining an elastic limit of a material responsive to the measured particle velocity;
determining a mechanical property of the material responsive to the determined elastic limit; and
determining a change in the mechanical property of the material responsive to a change in a Hugoniot elastic limit.
30. The system of claim 29 , wherein the monitoring system is configured to monitor microstructures.
31. The system of claim 29 , wherein the monitoring system is configured to characterize materials undergoing one or more of high temperature, radiation fields, work hardening, tempering, fatigue.
32. The system of claim 29 , wherein the monitoring system is configured to perform hardness testing.