In situ environmentally-isolated wear tester
View Patent ↗The present invention relates to an in situ testing system, which includes a wear tester and an enclosure. The wear tester is configured to apply a normal load, by way of a tip, to a surface of the test sample. Use of an enclosure allows such wear testing to be conducted in a controlled environment.
1. An in situ testing system comprising:
a wear tester, wherein the tester comprises:
a sample mount configured to hold a sample;
a first positioner configured to position the sample mount;
a tip configured to contact a surface of the sample; and
a load cell configured to apply a normal load to the tip and to measure a friction arising from contact between the tip and the surface of the sample; and
an enclosure configured to house the tester, wherein the enclosure comprises:
a base plate;
a plurality of side walls and a top wall configured to provide an internal chamber;
a sealing surface formed between a portion of the surface of the base plate and an edge of each of the plurality of side walls;
a vacuum exchange port configured to introduce an additional sample to the tester without changing an environment maintained within the internal chamber; and
an overpressure valve configured to release one or more fluids within the internal chamber of the enclosure.
2. The system of claim 1 , wherein the tester further comprises:
one or more capacitive probes configured to measure one or more electrical signals transmitted by the load cell.
3. The system of claim 1 , wherein the load cell is a cantilever load cell.
4. The system of claim 1 , wherein the tip comprises a spherical ball or spherical pin.
5. The system of claim 1 , wherein the tester further comprises:
a second positioner configured to position the tip and/or the load cell relative to the sample mount.
6. The system of claim 1 , further comprising:
a surface detector configured to measure one or more surface measurements of the sample during contact with the tip.
7. The system of claim 6 , wherein the surface detector comprises an interferometer.
8. The system of claim 1 , wherein the first positioner is configured to provide rotational movement and/or linear movement of the sample.
9. The system of claim 8 , wherein the first positioner comprises a rotary stage.
10. The system of claim 8 , wherein the first positioner comprises a linear translation stage.
11. The system of claim 1 , wherein the enclosure further comprises:
one or more feedthroughs disposed within at least one of plurality of side walls and/or the top wall of the enclosure, wherein at least on feedthrough is configured to provide one or more power sources or instrumentation sources.
12. The system of claim 1 , wherein at least one of the one or more fluids is selected from the group consisting of oxygen, nitrogen, argon, an inert gas, as well as mixtures thereof.
13. The system of claim 1 , wherein the enclosure further comprises:
a lifting handle disposed above the sealing surface.
14. An in situ testing system comprising:
a wear tester, wherein the tester comprises:
a sample mount configured to hold a sample;
a first positioner configured to position the sample mount
a tip configured to contact a surface of the sample; and
a load cell configured to apply a normal load to the tip and to measure a friction arising from contact between the tip and the surface of the sample;
an enclosure configured to house the tester, wherein the enclosure comprises:
a base plate;
a plurality of side walls and a top wall configured to provide an internal chamber;
a sealing surface formed between a portion of the surface of the base plate and an edge of each of the plurality of side walls; and
a vacuum exchange port configured to introduce an additional sample to the tester without changing an environment maintained within the internal chamber; and
a remote control box unit disposed within the internal chamber of the enclosure, wherein the remote control box unit is configured to open and close one or more ports configured to deliver a fluid into or out of the internal chamber.
15. The system of claim 14 , further comprising:
an external control box unit disposed outside of the enclosure, wherein the external control box unit is configured to open and close one or more ports configured to deliver a fluid into or out of the internal chamber.
16. The system of claim 14 , wherein the enclosure further comprises:
one or more feedthroughs disposed within at least one of plurality of side walls and/or the top wall of the enclosure, wherein at least on feedthrough is configured to provide one or more power sources or instrumentation sources.
17. An in situ testing system comprising:
a wear tester, wherein the tester comprises:
a sample mount configured to hold a sample;
a first positioner configured to position the sample mount;
a tip configured to contact a surface of the sample;
a load cell configured to apply a normal load to the tip and to measure a friction arising from contact between the tip and the surface of the sample; and
one or more capacitive probes configured to measure one or more electrical signals transmitted by the load cell;
an enclosure configured to house the tester, wherein the enclosure comprises:
a base plate;
a plurality of side walls and a top wall configured to provide an internal chamber;
a sealing surface formed between a portion of the surface of the base plate and an edge of each of the plurality of side walls; and
a vacuum exchange port configured to introduce an additional sample to the tester without changing an environment maintained within the internal chamber;
a remote control box unit disposed within the internal chamber of the enclosure, wherein the remote control box unit is configured to open and close one or more ports configured to deliver a fluid into or out of the internal chamber; and
an external control box unit disposed outside of the enclosure, wherein the external control box unit is configured to open and close one or more ports configured to deliver a fluid into or out of the internal chamber.
18. The system of claim 17 , wherein the tester is a tribometer.
19. The system of claim 17 , further comprising one or more temperature sensors, pressure sensors, oxygen sensors, moisture sensors, valves, and/or ports.
20. The system of 17 , further comprising:
a surface detector configured to measure one or more surface measurements of the sample during contact with the tip.