Multi-junction detector device and method of use
A novel multi-junction detector device and method of use is disclosed, which includes a housing, at least one mount system body positioned within the housing, at least one beam dump region formed in the mount system body, with a first detector having a first wavelength responsivity range positioned on the mount system body and at least a second detector having a second wavelength responsivity range positioned on the mount system body in optical communication with the first detector.
1. A multi-junction detector device, comprising:
at least one housing;
at least one mount system body configured to be positioned within the housing;
at least one beam dump region formed in the mount system body;
a first detector having a first wavelength responsivity range and positioned on the mount system body, the first detector is configured to absorb a portion of an incident optical signal within the first wavelength responsivity range and to reflect a portion of the incident optical signal within at least the second wavelength responsivity; and
at least a second detector positioned on the mount system body in optical communication with the first detector, the second detector configured to absorb a portion of the optical signal within the second wavelength responsivity range and reflect at least a portion of the optical signal to the beam dump region.
2. The multi-junction detector device of claim 1 , wherein the beam dump region has an arcuate shape.
3. The multi-junction detector device of claim 1 wherein the beam dump region has an arcuate shape of varying radius.
4. The multi-junction detector device of claim 1 where the beam dump region has a polygonal shape.
5. The multi-junction detector device of claim 1 wherein the beam dump region has a polyhedral shape.
6. The multi-junction detector device of claim 1 , wherein the first detector has a wavelength responsivity range from about 800 nanometers to about 1800 nanometers.
7. The multi-junction detector device of claim 1 , wherein the first detector is a Germanium-based detector.
8. The multi-junction detector device of claim 1 , wherein the first detector is an array of detectors.
9. The multi-junction detector device of claim 1 , wherein at least one of the first detector or the second detector is selected from a group consisting of Silicon (Si), Germanium (Ge), Indium Gallium Arsenide (In GaAs), Gallium Arsenide (GaAs), Lead (II) Sulfide (PbS), Mercury Cadmium Telluride (HgCdTe), Gallium Nitride (GaN), Gallium Phosphide (GaP) and Cadmium Zinc Telluride (CdZnTe).
10. The multi-junction detector device of claim 1 , wherein the second detector has a wavelength responsivity range from about 180 nanometers to about 1100 nanometers.
11. The multi-junction detector device of claim 1 , wherein the at least second detector is a Silicon-based detector.
12. The multi-junction detector device of claim 1 , wherein the second detector is an array of detectors.
13. The multi-junction detector device of claim 1 , wherein at least one additional detector is positioned on the mount system body and in optical communication with at least one of the first detector and the second detector.
14. The multi-junction detector device of claim 1 , wherein at least one of the first and second detectors is electrically connected to a processor device.
15. A multi-junction detector device, comprising:
at least one mount system body comprising at least one beam dump region;
a first detector having a first wavelength responsivity range positioned on the mount system body and configured to absorb light of a first spectral range of an incident optical signal and to reflect light of a second spectral range;
at least a second detector having at least a second wavelength responsivity range, the at least a second detector in optical communication with the first detector and configured to absorb light of a second spectral range of the optical signal and reflect an unabsorbed portion of the optical signal to the at least one beam dump region in optical communication with the at least a second detector.
16. The multi-junction detector device of claim 15 , wherein the beam dump region has an arcuate shape, an arcuate shape of varying radius, a polygonal shape, or a polyhedral shape.
17. The multi-junction detector device of claim 15 , wherein the first detector has a wavelength responsivity range from about 800 nanometers to about 1800 nanometers.
18. The multi-junction detector device of claim 15 , wherein the first detector is a Germanium-based detector.
19. The multi-junction detector device of claim 15 , wherein the first detector is an array of detectors.
20. The multi-junction detector device of claim 15 , wherein the first detector or the second detector is selected from a group consisting of Silicon (Si), Germanium (Ge), Indium Gallium Arsenide (In GaAs), Gallium Arsenide (GaAs), Lead (II) Sulfide (PbS), Mercury Cadmium Telluride (HgCdTe), Gallium Nitride (GaN), Gallium Phosphide (GaP) and Cadmium Zinc Telluride (CdZnTe).
21. The multi-junction detector device of claim 15 , wherein the at least a second detector has a wavelength responsivity range from about 180 nanometers to about 1100 nanometers.
22. The multi-junction detector device of claim 15 , wherein the second detector is a Silicon-based detector.
23. The multi-junction detector device of claim 15 , wherein the second detector is an array of detectors.