IP Library Granted Patent US 10,256,362
Granted Patent B2
US 10,256,362 · App. 15/665,240 · Granted Apr 9, 2019

Flexible silicon infrared emitter

Inventors: Andre Filipe Rodrigues Augusto (Tempe, AZ); Stanislau Herasimenka (Tempe, AZ); Stuart Bowden (Tempe, AZ)
Assignee: Arizona Board of Regents on Behalf of Arizona State University
H01L31/125H01L31/02008H01L31/0216H01L31/022475H01L31/03762H01L31/035281H01L31/042H01L31/0504H01L31/0547H01L31/0747H01L31/1868H01L31/1884H01L31/202H01L33/0058H01L33/0095H01L33/22H01L33/24H01L33/34H01L33/42H01L33/46H02S40/38H01L2933/0016H01L2933/0025
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Quick Facts
Patent No.
US 10,256,362
App. No.
15/665,240
Granted
Apr 9, 2019
Kind
B2
Abstract

An apparatus includes a flexible silicon (Si) substrate, such as a crystalline n-type substrate, and a heterostructure structure formed on the silicon substrate. The heterojunction structure includes a first layered structured deposited on a first side of the silicon substrate. The first layered structured includes a first amorphous intrinsic silicon layer, an amorphous n-type or p-type silicon layer, and a transparent conductive layer. The second layered structure includes a second amorphous intrinsic silicon layer, an amorphous p-type or n-type silicon layer, and a transparent conductive layer. The heterostructure structure is configured to operate as a photovoltaic cell and an infrared light emitting diode.

Claims (22)

1. A method of forming a photovoltaic cell and a light emitting diode apparatus, the method comprising:

growing a flexible crystalline silicon substrate;

depositing a first layered structure on a first side of the flexible crystalline silicon substrate, the first layered structure including a first passivation layer, a first amorphous silicon layer doped as one of n-type or p-type, and a first transparent conductive layer;

treating a portion of the first passivation layer with a first hydrogen plasma treatment before depositing the first amorphous silicon layer and the first transparent conductive layer of the first layered structure on the flexible crystalline silicon substrate;

depositing a second layered structure on a second side of the flexible crystalline silicon substrate, the second layered structure including a second passivation layer, a second amorphous silicon layer doped as one of n-type or p-type, wherein the second amorphous silicon layer is doped to be an opposite type as the first amorphous silicon layer, and a second transparent conductive layer, the first layered structure and the second layered structure together forming a heterostructure on the flexible crystalline silicon substrate;

treating a portion of the second passivation layer with a second hydrogen plasma treatment before depositing the second amorphous silicon layer and the second transparent conductive layer of the second layered structure on the flexible crystalline silicon substrate; and

applying metallization to the apparatus for conducting electricity.

2. The method of claim 1 , wherein growing the flexible crystalline silicon substrate comprises growing the flexible crystalline substrate as a p-doped or n-doped substrate.

3. The method according to claim 1 , wherein growing the flexible crystalline silicon substrate comprises:

growing a first silicon substrate to a first thickness larger than 100 micrometers; and

reducing, through wet alkaline etching and chemical washes, the first silicon substrate to a second thickness of between a few micrometers and 100 micrometers to produce the flexible crystalline silicon substrate.

4. The method according to claim 1 , wherein applying the metallization comprises:

screen printing a first layer of silver over the first side of the flexible crystalline substrate in a grid pattern; and

sputter depositing a second layer of conductive metal plating over the second side of the flexible crystalline substrate.

5. The method according to claim 1 , wherein applying the metallization comprises:

copper plating the first side of the flexible crystalline substrate; and

sputter depositing a conductive metal reflector over the second side of the flexible crystalline substrate.

6. The method of claim 1 , further comprising:

depositing the first passivation layer by:

depositing a first intrinsic amorphous silicon layer before the first hydrogen plasma treatment;

depositing a second intrinsic amorphous silicon layer after the first hydrogen plasma treatment.

7. The method of claim 6 , wherein the second intrinsic amorphous silicon layer is thicker than the first intrinsic amorphous silicon layer.

Assignments (3)
CONFIRMATORY LICENSE Recorded Apr 27, 2020
From: ARIZONA STATE UNIVERSITY, TEMPE
To: NATIONAL SCIENCE FOUNDATION
Reel/Frame 052502/0157 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 23, 2018
From: AUGUSTO, ANDRE FILIPE RODRIGUES; HERASIMENKA, STANISLAU; BOWDEN, STUART
To: ARIZONA BOARD OF REGENTS ON BEHALF OF ARIZONA STATE UNIVERSITY
Reel/Frame 044705/0393 →
CONFIRMATORY LICENSE Recorded Oct 19, 2017
From: ARIZONA STATE UNIVERSITY, TEMPE
To: NATIONAL SCIENCE FOUNDATION
Reel/Frame 044238/0529 →
Continuity (2)
Provisional Application 62368808 · Jul 29, 2016
Related Publication 20180033905A1 · Feb 1, 2018
Cited By (1)
US 12,261,237