System and method to predict a usable life of a vacuum interrupter in the field
View Patent ↗A closed and open contact method to predict a usable life of vacuum interrupters in the field can include using computer instructions in the data storage to instruct the processor to position a calculated amp or calculated pressure on an ionic or current versus pressure calibration curve for the installed vacuum interrupter and identify trend data from a library of trend data corresponding to the installed vacuum interrupter and to the calculated pressure or calculated amp of the installed vacuum interrupter; thereby determining the anticipated life expectancy.
1. A method of performing maintenance on a vacuum interrupter, the method comprising:
applying a DC potential across at least one open connection within the vacuum interrupter;
measuring a first ion current across the at least one open connection while the DC potential is applied;
if the first ion current exceeds a first threshold, reverse polarity of the DC potential applied across the at least one open connection and measure a second ion current across the at least one open connection; and
if the second ion current exceeds a second threshold, replace the vacuum interrupter.
2. The method of claim 1 , further comprising:
if the first ion current or the second ion current does not exceed the first threshold or the second threshold respectively, generate an electromagnetic field within the vacuum interrupter, apply the DC potential across the at least one open connection within the vacuum interrupter, and measure a third ion current across the at least one open connection; and
if the third ion current is greater than a third threshold, replace the vacuum interrupter.
3. The method of claim 2 , wherein the first, second, and third thresholds are equal.
4. The method of claim 2 , wherein the first and second thresholds are equal, but the third threshold is not equal to the first and second thresholds.
5. The method of claim 2 , wherein the first, second, and third thresholds are unequal.
6. A method for predicting a usable life of a vacuum interrupter, the method comprising:
generating a magnetic field around the vacuum interrupter using a magnetic field generator;
measuring ion current flow across one or more open contacts of the vacuum interrupter; and
indicating a condition of the vacuum interrupter based upon the measured iron current flow.
7. The method of claim 6 , wherein the one or more open contacts comprises an open contact between a moving contact and a vapor shield.
8. The method of claim 6 , wherein the one or more open contacts comprises an open contact between a fixed contact and a moving contact.
9. The method of claim 6 , wherein the one or more open contacts comprises an open contact between a fixed contact and a vapor shield.
10. The method of claim 6 , wherein first condition of the vacuum interrupter is that the vacuum interrupter is an acceptable condition if the measured ion current flow is less than a threshold value, the threshold value corresponding to an acceptable predicted usable life of the vacuum interrupter; and wherein the acceptable condition indicates that the vacuum interrupter is not likely to fail.
11. The method of claim 6 , wherein the condition of the vacuum interrupter is that the vacuum interrupter is in unacceptable condition if the measured ion current flow is greater than a threshold value, the threshold value corresponding to an acceptable predicted usable life of the vacuum interrupter; and wherein the unacceptable condition indicates that the vacuum interrupter is likely to fail.
12. The method of claim 6 , wherein the magnetic field generator comprises a flexible magnetic field coil.
13. A method comprising:
measuring a first ion current flow across one or more open contacts of a vacuum interrupter;
comparing the first measured ion current flow to a threshold value;
if the first measured ion current flow is greater than the threshold value, indicating a first condition of the vacuum interrupter; and
if the first measured ion current flow is less than the threshold value:
changing a magnetic field around the vacuum interrupter;
measuring a second ion current flow across the one or more open contacts;
comparing the second measured ion current flow to the threshold value; and
indicating a second condition of the vacuum interrupter based upon the comparison.
14. The method of claim 13 , wherein the indication of the first condition comprises illuminating a first light if the first condition is an unacceptable condition; and wherein the unacceptable condition indicates that the vacuum interrupter is likely to fail immediately.
15. The method of claim 13 , wherein the indication of the second condition comprises illuminating a second light if the second condition is a desirable and acceptable condition, or illuminating a third light if the second condition is an undesirable yet acceptable condition; wherein the desirable and acceptable condition indicates that the vacuum interrupter is not likely to fail; wherein the undesirable yet acceptable condition indicates that the vacuum interrupter is likely to fail in the near future yet not likely to fail immediately.
16. The method of claim 13 , wherein the threshold value corresponds to an acceptable predicted usable life of the vacuum interrupter.
17. The method of claim 13 , wherein the first condition of the vacuum interrupter is an unacceptable condition if the measured first ion current flow is greater than the threshold value.
18. The method of claim 13 , wherein the second condition of the vacuum interrupter is an undesirable yet acceptable condition if the measured second ion current flow is greater than the threshold value, and is an acceptable condition if the measured second ion current flow is less than the threshold value.
19. A system for predicting a usable life of a vacuum interrupter, the system comprising:
a magnetic field generator configured to generate a magnetic field around the vacuum interrupter;
current sensing circuitry configured to measure ion current flow across one or more open contacts of the vacuum interrupter; and
a condition indicator configured to indicate a condition of the vacuum interrupter as a function of the measured ion current flow.
20. The system of claim 19 , further comprising a high-potential testing unit configured to discharge a capacitor to apply a DC potential across the one or more open contacts of the vacuum interrupter prior to measuring of the ion current flow.
21. The system of claim 19 , wherein the condition indicates a predicted remaining usable life of the vacuum interrupter.
22. The system of claim 19 , wherein the magnetic field generator comprises a flexible magnetic field coil.
23. The system of claim 19 , further comprising control circuitry configured to cause a DC potential to be applied across the one or more open contacts of the vacuum interrupter.