Memory storage apparatus and method for testing memory storage apparatus
A memory storage apparatus including a memory cell array and a memory control circuit is provided. The memory cell array includes a plurality of memory cells. The memory cell array is configured to store data. The memory control circuit is coupled to the memory cell array. The memory control circuit is configured to apply one of a set signal and a reset signal to a target memory cell among the memory cells to generate a read current. The memory control circuit receives a read current of the target memory cell. The memory control circuit compares the read current with a reference current. The memory control circuit determines whether the target memory cell is failed according to a comparison result. In addition, a method for testing a memory storage apparatus is also provided.
1. A memory storage apparatus, comprising:
a memory cell array, comprising a plurality of memory cells, and configured to store data; and
a memory control circuit, coupled to the memory cell array, and configured to apply one of a set signal and a reset signal to a target memory cell among the memory cells to generate a first read current then apply the other one of the set signal and the reset signal to the target memory cell among the memory cells to generate a second read current, receive the first read current and the second read current of the target memory cell, compare the first read current with a first reference current and compare the second read current with a second reference current to generate a comparison result, and determine whether the target memory cell is failed according to the comparison result,
wherein the memory storage apparatus is a resistive random access memory.
2. The memory storage apparatus as recited in claim 1 , wherein the memory control circuit determines whether a state of the target memory cell is a first state or a second state.
3. The memory storage apparatus as recited in claim 2 , wherein if the state of the target memory cell is the first state, the memory control circuit applies the set signal to the target memory cell and the target memory cell changes from the first state to the second state, wherein the first read current has a first read current value and the first reference current has a first reference current value, the memory control circuit compares the first read current value with the first reference current value, and if the first read current value is less than the first reference current value, the memory control circuit determines that the target memory cell is failed.
4. The memory storage apparatus as recited in claim 3 , wherein if the first read current value is greater than or equal to the first reference current value, the memory control circuit determines that the target memory cell is not failed.
5. The memory storage apparatus as recited in claim 3 , wherein if the first read current value is greater than or equal to the first reference current value, the memory control circuit applies the reset signal to the target memory cell and the target memory cell changes from the second state to the first state, wherein the second read current has a second read current value and the second reference current has a second reference current value, the memory control circuit compares the second read current value with the second reference current value, if the second read current value is greater than the second reference current value, the memory control circuit determines that the target memory cell is failed, and if the second read current value is less than or equal to the second reference current value, the memory control circuit determines that the target memory cell is not failed.
6. The memory storage apparatus as recited in claim 2 , wherein if the state of the target memory cell is the second state, the memory control circuit applies the reset signal to the target memory cell and the target memory cell changes from the second state to the first state, wherein the first read current has a second read current value and the first reference current has a second reference current value, the memory control circuit compares the second read current value with the second reference current value, and if the second read current value is greater than the second reference current value, the memory control circuit determines that the target memory cell is failed.
7. The memory storage apparatus as recited in claim 6 , wherein and if the second read current value is less than or equal to the second reference current value, the memory control circuit determines that the target memory cell is not failed.
8. The memory storage apparatus as recited in claim 6 , wherein if the second read current value is less than or equal to the second reference current value, the memory control circuit applies the set signal to the target memory cell and the target memory cell changes from the first state to the second state, wherein the second read current has a first read current value and the second reference current has a first reference current value, the memory control circuit compares the first read current value with the first reference current value, if the first read current value is less than the first reference current value, the memory control circuit determines that the target memory cell is failed, and if the first read current value is greater than or equal to the first reference current value, the memory control circuit determines that the target memory cell is not failed.
9. A method for testing a memory storage apparatus, wherein the memory storage apparatus comprises a plurality of memory cells, configured to store data, and the method for testing comprises:
applying one of a set signal and a reset signal to a target memory cell among the memory cells to generate a first read current then applying the other one of the set signal and the reset signal to the target memory cell among the memory cells to generate a second read current;
receiving the first read current and the second read current of the target memory cell, and comparing the first read current with a first reference current and comparing the second read current with a second reference current to generate a comparison result; and
determining whether the target memory cell is failed according to the comparison result,
wherein the memory storage apparatus is a resistive random access memory.
10. The method for testing the memory storage apparatus as recited in claim 9 , further comprises:
determining whether a state of the target memory cell is a first state or a second state.
11. The method for testing the memory storage apparatus as recited in claim 10 , wherein if the state of the target memory cell is the first state, the step of applying one of the set signal and the reset signal to the target memory cell among the memory cells to generate the first read current comprises applying the set signal to the target memory cell so the target memory cell changes from the first state to the second state, wherein the first read current has a first read current value and the first reference current has a first reference current value, the step of comparing the first read current with the first reference current comprises comparing the first read current value with the first reference current value, and if the first read current value is less than the first reference current value, the step of determining whether the target memory cell is failed according to the comparison result comprises determining that the target memory cell is failed.
12. The method for testing the memory storage apparatus as recited in claim 11 , wherein if the first read current value is greater than or equal to the first reference current value, the step of determining whether the target memory cell is failed according to the comparison result further comprises determining that the target memory cell is not failed.
13. The method for testing the memory storage apparatus as recited in claim 11 , wherein if the first read current value is greater than or equal to the first reference current value, the step of applying the other one of the set signal and the reset signal to the target memory cell among the memory cells to generate the second read current further comprises applying the reset signal to the target memory cell so the target memory cell changes from the second state to the first state, wherein the second read current has a second read current value and the second reference current has a second reference current value, the step of comparing the second read current with the second reference current further comprises comparing the second read current value with the second reference current value, and if the second read current value is greater than the second reference current value, the step of determining whether the target memory cell is failed according to the comparison result further comprises determining that the target memory cell is failed, wherein if the second read current value is less than or equal to the second reference current value, the step of determining whether the target memory cell is failed according to the comparison result further comprises determining that the target memory cell is not failed.
14. The method for testing the memory storage apparatus as recited in claim 10 , wherein if the state of the target memory cell is the second state, the step of applying one of the set signal and the reset signal to the target memory cell among the memory cells to generate the first read current comprises applying the reset signal to the target memory cell so the target memory cell changes from the second state to the first state, wherein the first read current has a second read current value and the first reference current has a second reference current value, the step of comparing the first read current with the first reference current comprises comparing the second read current value with the second reference current value, and if the second read current value is greater than the second reference current value, the step of determining whether the target memory cell is failed according to the comparison result comprises determining that the target memory cell is failed.
15. The method for testing the memory storage apparatus as recited in claim 14 , wherein if the second read current value is less than or equal to the second reference current value, the step of determining whether the target memory cell is failed according to the comparison result further comprises determining that the target memory cell is not failed.
16. The method for testing the memory storage apparatus as recited in claim 14 , wherein if the second read current value is less than or equal to the second reference current value, the step of applying the other one of the set signal and the reset signal to the target memory cell among the memory cells to generate the second read current further comprises applying the set signal to the target memory cell so the target memory cell changes from the first state to the second state, wherein the second read current has a first read current value and the second reference current has a first reference current value, the step of comparing the second read current with the second reference current further comprises comparing the first read current value with the first reference current value, if the first read current value is less than the first reference current value, the step of determining whether the target memory cell is failed according to the comparison result further comprises determining that the target memory cell is failed, if the first read current value is greater than or equal to the first reference current value, the step of determining whether the target memory cell is failed according to the comparison result further comprises determining that the target memory cell is not failed.