Semiconductor dies supporting multiple packaging configurations and associated methods
A memory device configured to support multiple memory densities is provided. The memory device includes a first plurality of electrical contacts corresponding to a first command/address channel, a second plurality of electrical contacts corresponding to a second command/address channel, a third plurality of electrical contacts corresponding to a first data bus, a fourth plurality of electrical contacts corresponding to a second data bus, and mode selection circuitry configured to place the memory device in the first mode or the second mode. In the first mode, the first plurality of memory cells is operatively coupled to the first and third pluralities of electrical contacts and the second plurality of memory cells is operatively coupled to the second and fourth plurality of electrical contacts. In the second mode, the first and second pluralities of memory cells are both operatively coupled to the first and third pluralities of electrical contacts.
1. A semiconductor die comprising:
a first plurality of electrical contacts corresponding to a first command/address channel;
a second plurality of electrical contacts corresponding to a second command/address channel;
a third plurality of electrical contacts corresponding to a first data bus;
a fourth plurality of electrical contacts corresponding to a second data bus;
a memory array including first and second pluralities of memory cells; and
mode selection circuitry configured to place the semiconductor die into either a first mode or a second mode,
wherein the first mode operatively couples the first plurality of memory cells to the first and third pluralities of electrical contacts and the second plurality of memory cells to the second and fourth pluralities of electrical contacts,
wherein the second mode operatively couples the first and second pluralities of memory cells to the first and third pluralities of electrical contacts, and
wherein the first mode corresponds to a first orientation of the semiconductor die and the second mode corresponds to a second orientation of the semiconductor die different than the first orientation, wherein the second orientation of the semiconductor die is rotated about 90 degrees relative to the first orientation of the semiconductor die.
2. A semiconductor package comprising a single semiconductor die according to claim 1 , wherein the mode selection circuitry of the single semiconductor die is configured to place the semiconductor die into the first mode.
3. A semiconductor package comprising two of the semiconductor die according to claim 1 , wherein the mode selection circuitry of each of the two semiconductor dies is configured to place the corresponding semiconductor die into the second mode.
4. The semiconductor die of claim 1 , wherein the first plurality of memory cells are addressable over the first command/address channel and the second plurality of memory cells are addressable over the second command/address channel when the mode selection circuitry is configured to place the semiconductor die into the first mode.
5. The semiconductor die of claim 1 , wherein the first and second pluralities of memory cells are addressable over the first command/address channel when the mode selection circuitry is configured to place the semiconductor die into the second mode.
6. The semiconductor die of claim 1 , wherein—
the first plurality of memory cells are operatively coupled to the first data bus and the second plurality of memory cells are operatively coupled to the second data bus when the mode selection circuitry is configured to place the semiconductor die into the first mode, and
the first and second pluralities of memory cells are operatively coupled to the first data bus when the mode selection circuitry is configured to place the semiconductor die into the second mode.
7. The semiconductor die of claim 1 , wherein the first and second pluralities of memory cells are electrically disconnected from the second and fourth plurality of electrical contacts when the mode selection circuitry is configured to place the semiconductor die into the second mode.
8. The semiconductor die of claim 1 , wherein the first and second pluralities of electrical contacts are reflectively or rotationally symmetric about an axis of the semiconductor die.
9. The semiconductor die of claim 1 , wherein the third and fourth pluralities of electrical contacts are reflectively or rotationally symmetric about an axis of the semiconductor die.
10. The semiconductor die of claim 1 , wherein the mode selection circuitry is configured to—
detect a power input to the semiconductor die; and
based on the detected power input, determine whether the semiconductor die is to be placed into the first mode or the second mode.
11. The semiconductor die of claim 1 , wherein the mode selection circuitry includes one or more fuses or anti-fuses configured to place the semiconductor die into either the first mode or the second mode.
12. The semiconductor die of claim 1 wherein the first orientation is in a first semiconductor package having a first memory density, and the second orientation is in a second semiconductor package having a second memory density.
13. The semiconductor die of claim 1 wherein, in the first mode, the first plurality of memory cells are operatively coupled to the first and third pluralities of electrical contacts via a first plurality of interconnects, and the second plurality of memory cells are operatively coupled to the second and fourth pluralities of electrical contacts via a second plurality of interconnects.