IP Library Granted Patent US 10,361,158
Granted Patent B2
US 10,361,158 · App. 15/690,200 · Granted Jul 23, 2019

Integrated assemblies having structures along a first pitch coupled with structures along a second pitch different from the first pitch

Inventor: Werner Juengling (Meridian, ID)
Assignee: Micron Technology, Inc.
H01L23/5283H01L21/568H01L23/053H01L23/291H01L23/3128H01L23/538H01L23/5329H01L23/5381H01L23/5389H01L24/19
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Quick Facts
Patent No.
US 10,361,158
App. No.
15/690,200
Granted
Jul 23, 2019
Kind
B2
Abstract

Some embodiments include methods of forming integrated assemblies. First conductive structures are formed within an insulative support material and are spaced along a first pitch. Upper regions of the first conductive structures are removed to form first openings extending through the insulative support material and over lower regions of the first conductive structures. Outer lateral peripheries of the first openings are lined with spacer material. The spacer material is configured as tubes having second openings extending therethrough to the lower regions of the first conductive structures. Conductive interconnects are formed within the tubes. Second conductive structures are formed over the spacer material and the conductive interconnects. The second conductive structures are spaced along a second pitch, with the second pitch being less than the first pitch. Some embodiments include integrated assemblies.

Claims (11)

1. An integrated assembly, comprising:

first conductive structures spaced along a first pitch along a cross-section; the first conductive structures having a first width along the cross-section;

second conductive structures over the first conductive structures and spaced along a second pitch along the cross-section, the second pitch being less than or equal to about one-half of the first pitch; the second conductive structures having a second width along the cross-section which is less than the first width; more than one of the second conductive structures being directly over each of the first conductive structures along the cross-section; and

conductive interconnects extending upwardly from each of the first conductive structures to couple each of the first conductive structures with only one of the second conductive structures directly over each of the first conductive structures; some of the second conductive structures being directly over the first conductive structures and not being coupled to the first conductive structures through the conductive interconnects; said some of the second conductive structures being vertically spaced from the first conductive structures by intervening insulative material.

2. The integrated assembly of claim 1 wherein the second pitch is less than or equal to about one-third of the first pitch.

3. The integrated assembly of claim 1 wherein the second pitch is about one-fourth of the first pitch.

4. The integrated assembly of claim 1 wherein there are additional second conductive structures which are not directly over the first conductive structures along the cross-section; wherein the intervening insulative material is a first insulative material; and wherein the additional second conductive structures are directly on a second insulative material.

5. The integrated assembly of claim 4 wherein the second insulative material is a same composition as the first insulative material.

6. The integrated assembly of claim 4 wherein the second insulative material is a different composition relative to the first insulative material.

7. The integrated assembly of claim 6 wherein the second insulative material comprises silicon dioxide and the first insulative material comprises silicon nitride.

8. The integrated assembly of claim 1 wherein the intervening insulative material is configured as hollow tubes, and wherein the conductive interconnects extend upwardly within said hollow tubes.

Assignments (7)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050709/0838 →
RELEASE OF SECURITY INTEREST Recorded Jul 20, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 046597/0333 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
SUPPLEMENT NO. 6 TO PATENT SECURITY AGREEMENT Recorded Nov 1, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 044348/0253 →
SUPPLEMENT NO. 6 TO PATENT SECURITY AGREEMENT Recorded Nov 1, 2017
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 044653/0333 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 29, 2017
From: JUENGLING, WERNER
To: MICRON TECHNOLOGY, INC.
Reel/Frame 043440/0928 →
Continuity (1)
Related Publication 20190067192A1 · Feb 28, 2019