IP Library Granted Patent US 10,242,742
Granted Patent B2
US 10,242,742 · App. 15/690,497 · Granted Mar 26, 2019

Segmented memory and operation

Inventors: Toru Tanzawa (Tokyo, JP); Han Zhao (Santa Clara, CA)
Assignee: Micron Technology, Inc.
G11C16/0483G11C16/08G11C16/10G11C16/26
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Quick Facts
Patent No.
US 10,242,742
App. No.
15/690,497
Granted
Mar 26, 2019
Kind
B2
Abstract

Apparatus having a plurality of strings of series-connected memory cells, and methods of their operation, where each string of the plurality of strings is selectively connected to a common data line through a corresponding respective select gate. A first set of access lines are each coupled to a respective memory cell of each string of series-connected memory cells of the plurality of strings of series-connected memory cells. A second set of access lines are each coupled to a respective memory cell of each string of series-connected memory cells of only a portion of the plurality of strings of series-connected memory cells.

Claims (55)

1. An apparatus, comprising:

a plurality of strings of series-connected memory cells, each string of series-connected memory cells of the plurality of strings of series-connected memory cells selectively connected to a common data line through a corresponding respective select gate;

a first set of access lines each coupled to a respective memory cell of each string of series-connected memory cells of the plurality of strings of series-connected memory cells; and

a second set of access lines each coupled to a respective memory cell of each string of series-connected memory cells of only a portion of the plurality of strings of series-connected memory cells;

wherein each access line of the first set of access lines is between a first access line of the second set of access lines and a second access line of the second set of access lines.

2. The apparatus of claim 1 , wherein each access line of the first set of access lines is between a first access line of the second set of access lines and a second access line of the second set of access lines, and between a first access line of the third set of access lines and a second access line of the third set of access lines.

3. An apparatus, comprising:

a plurality of strings of series-connected memory cells, each string of series-connected memory cells of the plurality of strings of series-connected memory cells selectively connected to a common data line through a corresponding respective select gate;

a first set of access lines each coupled to a respective memory cell of each string of series-connected memory cells of the plurality of strings of series-connected memory cells; and

a second set of access lines each coupled to a respective memory cell of each string of series-connected memory cells of only a portion of the plurality of strings of series-connected memory cells;

wherein the portion of the plurality of strings of series-connected memory cells is a first portion of the plurality of strings of series-connected memory cells, the apparatus further comprising a third set of access lines each coupled to a respective memory cell of each string of series-connected memory cells of only a second portion of the plurality of strings of series-connected memory cells; and

wherein the second portion of the plurality of strings of series-connected memory cells is mutually exclusive to the first portion of the plurality of strings of series-connected memory cells.

4. An apparatus, comprising:

a plurality of strings of series-connected memory cells, each string of series-connected memory cells of the plurality of strings of series-connected memory cells selectively connected to a common data line through a corresponding respective select gate;

a first set of access lines each coupled to a respective memory cell of each string of series-connected memory cells of the plurality of strings of series-connected memory cells; and

a second set of access lines each coupled to a respective memory cell of each string of series-connected memory cells of only a portion of the plurality of strings of series-connected memory cells;

wherein the portion of the plurality of strings of series-connected memory cells is a first portion of the plurality of strings of series-connected memory cells, the apparatus further comprising a third set of access lines each coupled to a respective memory cell of each string of series-connected memory cells of only a second portion of the plurality of strings of series-connected memory cells;

wherein a union of the first portion of the plurality of strings of series-connected memory cells and the second portion of the plurality of strings of series-connected memory cells includes each string of series-connected memory cells of the first portion of the plurality of strings of series-connected memory cells; and

wherein each access line of the first set of access lines is between an access line of the second set of access lines and an access line of the third set of access lines.

5. An apparatus, comprising:

a plurality of strings of series-connected memory cells, each string of series-connected memory cells of the plurality of strings of series-connected memory cells selectively connected to a common data line through a corresponding respective select gate;

a first set of access lines each coupled to a respective memory cell of each string of series-connected memory cells of the plurality of strings of series-connected memory cells; and

a second set of access lines each coupled to a respective memory cell of each string of series-connected memory cells of only a portion of the plurality of strings of series-connected memory cells;

wherein an access line of the second set of access lines and an access line of the third set of access lines are formed at a same physical level of the plurality of strings of series-connected memory cells.

6. An apparatus, comprising:

a plurality of strings of series-connected memory cells, each string of series-connected memory cells of the plurality of strings of series-connected memory cells selectively connected to a common data line through a corresponding respective select gate;

a first set of access lines each coupled to a respective memory cell of each string of series-connected memory cells of the plurality of strings of series-connected memory cells; and

a second set of access lines each coupled to a respective memory cell of each string of series-connected memory cells of only a portion of the plurality of strings of series-connected memory cells;

wherein each access line of the second set of access lines is formed at a same physical level of the plurality of strings of series-connected memory cells.

7. A method of operating a memory, comprising:

activating a respective memory cell of each string of series-connected memory cells of a plurality of strings of series-connected memory cells;

selectively activating a target memory cell of a selected string of series-connected memory cells of the plurality of strings of series-connected memory cells depending upon its data state;

deactivating a respective memory cell of each string of series-connected memory cells of a first subset of the plurality of strings of series-connected memory cells; and

activating a respective memory cell of each string of series-connected memory cells of a second subset of the plurality of strings of series-connected memory cells formed at a same physical level as the respective memory cell of each string of series-connected memory cells of the first subset of the plurality of strings of series-connected memory cells.

8. The method of claim 7 , wherein activating the respective memory cell of each string of series-connected memory cells of the second subset of the plurality of strings of series-connected memory cells comprises applying a particular voltage level to a control gate of the respective memory cell of each string of series-connected memory cells of the second subset of the plurality of strings of series-connected memory cells comprises, and wherein deactivating the respective memory cell of each string of series-connected memory cells of the first subset of the plurality of strings of series-connected memory cells comprises applying a different voltage level, lower than the particular voltage level, to a control gate of the respective memory cell of each string of series-connected memory cells of the first subset of the plurality of strings of series-connected memory cells.

9. The method of claim 8 , wherein applying the different voltage level comprises applying a voltage level that is between the particular voltage level and a reference potential.

10. The method of claim 8 , wherein applying the different voltage level comprises applying a voltage level that is midway between the particular voltage level and a reference potential.

11. The method of claim 7 , wherein the second subset of the plurality of strings of series-connected memory cells comprises the selected string of series-connected memory cells.

12. The method of claim 11 , further comprising:

disconnecting each string of series-connected memory cells of the first subset of the plurality of strings of series-connected memory cells from a source while selectively activating the target memory cell; and

connecting each string of series-connected memory cells of the second subset of the plurality of strings of series-connected memory cells to the source while selectively activating the target memory cell.

13. The method of claim 11 , further comprising:

connecting the selected string of series-connected memory cells to a data line while selectively activating the target memory cell;

disconnecting each string of series-connected memory cells of the second subset of the plurality of strings of series-connected memory cells other than the selected string of series-connected memory cells from the data line while selectively activating the target memory cell; and

disconnecting each string of series-connected memory cells of the first subset of the plurality of strings of series-connected memory cells from the data line while selectively activating the target memory cell.

14. An apparatus, comprising:

an array of memory cells comprising a block of memory cells; and

a controller for access of memory cells of the array of memory cells;

wherein the block of memory cells comprises:

a plurality of strings of series-connected memory cells, wherein each string of series-connected memory cells of the plurality of strings of series-connected memory cells is selectively connected to a common data line by a respective select gate;

a first set of access lines each coupled to a respective memory cell of each string of series-connected memory cells of the plurality of strings of series-connected memory cells;

a second set of access lines each coupled to a respective memory cell of each string of series-connected memory cells of a first subset of the plurality of strings of series-connected memory cells; and

a third set of access lines each coupled to a respective memory cell of each string of series-connected memory cells of a second subset of the plurality of strings of series-connected memory cells,

wherein the first subset of the plurality of strings of series-connected memory cells and the second subset of the plurality of strings of series-connected memory cells are mutually exclusive.

15. The apparatus of claim 14 , wherein a union of the first subset of the plurality of strings of series-connected memory cells and the second subset of the plurality of strings of series-connected memory cells includes each string of series-connected memory cells of the first subset of the plurality of strings of series-connected memory cells.

Assignments (6)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050709/0838 →
RELEASE OF SECURITY INTEREST Recorded Jul 20, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 046597/0333 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
SUPPLEMENT NO. 6 TO PATENT SECURITY AGREEMENT Recorded Nov 1, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 044348/0253 →
SUPPLEMENT NO. 6 TO PATENT SECURITY AGREEMENT Recorded Nov 1, 2017
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 044653/0333 →
Continuity (2)
Continuation 15241740 · Aug 19, 2016
Related Publication 20180053552A1 · Feb 22, 2018