IP Library Granted Patent US 10,121,544
Granted Patent B2
US 10,121,544 · App. 15/692,565 · Granted Nov 6, 2018

Connecting memory cells to a data line sequentially while applying a program voltage to the memory cells

Inventors: Qiang Tang (Cupertino, CA); Ramin Ghodsi (San Jose, CA); Toru Tanzawa (Tokyo, JP)
Assignee: Micron Technology, Inc.
G11C16/10G11C11/5628G11C16/0483G11C16/08G11C16/26G11C16/3459G11C16/12G11C16/32
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Quick Facts
Patent No.
US 10,121,544
App. No.
15/692,565
Granted
Nov 6, 2018
Kind
B2
Abstract

Programming methods include applying a voltage to a selected access line commonly connected to a plurality of memory cells, and, while the voltage applied to the selected access line remains at a program voltage without being discharged, electrically connecting a subset of the plurality of memory cells to one data line so that only one memory cell of the subset of the plurality of memory cells is electrically connected to the one data line at a time.

Claims (36)

1. A programming method, comprising:

applying a voltage to a selected access line commonly connected to control gates of a plurality of memory cells, wherein each memory cell of the plurality of memory cells is contained in a respective string of series-connected memory cells of a plurality of strings of series-connected memory cells; and

while the voltage applied to the selected access line remains at a program voltage without being discharged, electrically connecting a subset of the plurality of memory cells to one data line so that only one memory cell of the subset of the plurality of memory cells is electrically connected to the one data line at a time;

wherein the subset of the plurality of memory cells comprises more than one memory cell.

2. The method of claim 1 , wherein each memory cell of the subset of the plurality of memory cells is contained in a respective string of series-connected memory cells of a subset of the plurality of strings of series-connected memory cells, wherein electrically connecting the subset of the plurality of memory cells to the one data line so that only one memory cell of the subset of the plurality of memory cells is electrically connected to the one data line at a time comprises respectively activating respective select transistors of a plurality of select transistors one at a time, wherein the respective select transistors of the plurality of select transistors are commonly connected to the data line and are respectively connected to the respective strings of series-connected memory cells of the subset of the plurality of strings of series-connected memory cells.

3. The method of claim 1 , wherein a number of memory cells in the subset of the plurality of memory cells is equal to a number of page buffers connected to the one data line.

4. The method of claim 3 , wherein each of the page buffers connected to the one data line stores data to be programmed in a respective memory cell of the subset of the plurality of memory cells.

5. The method of claim 1 , wherein a respective single bit of data is to be programmed to each memory cell in the subset of the plurality of memory cells when the memory cells in the subset of the plurality of memory cells operate in a single-bit-per-memory-cell mode and wherein a number of bits equal to a number of the memory cells in the subset of the plurality of memory cells is to be programmed to one of the memory cells of the plurality of memory cells when the memory cells of the plurality of memory cells operate in a multiple-bit-per-memory-cell mode.

6. The method of claim 1 , wherein electrically connecting the subset of the plurality of memory cells to the one data line so that only one memory cell of the subset of the plurality of memory cells is electrically connected to the one data line at a time while the voltage applied to the selected access line remains at the program voltage without being discharged programs data in each of the memory cells of the subset of the plurality of memory cells, and further comprising:

reading the data programmed in each of the memory cells of the subset of the plurality of memory cells from each of the memory cells of the subset of the plurality of memory cells; and

programming the data read from each of the memory cells of the subset of the plurality of memory cells to a single memory cell connected to an access line different than the selected access line.

7. The method of claim 6 , wherein the data programmed in each of the memory cells of the subset of the plurality of memory cells comprises a plurality of bits of data.

8. A programming method, comprising:

applying a program voltage to a selected access line commonly connected to control gates of a plurality of memory cells, wherein each memory cell of the plurality of memory cells is contained in a respective string of series-connected memory cells of a plurality of strings of series-connected memory cells; and

while the voltage applied to the selected access line remains at the program voltage without being discharged, sequentially electrically connecting a subset of the plurality of memory cells to one data line, each for a respective period of time, so that only one memory cell of the subset of the plurality of memory cells is electrically connected to the one data line at a time.

9. The method of claim 8 , further comprising:

electrically isolating all memory cells of the subset of the plurality of memory cells from the one data line between the respective periods of time.

10. The method of claim 8 , further comprising programming respective data into each of the memory cells of the subset of the plurality of memory cells during its respective period of time.

11. The method of claim 10 , further comprising:

reading the respective data programmed in each of the memory cells of the subset of the plurality of memory cells; and

programming the data read from each of the memory cells of the subset of the plurality of memory cells to a single memory cell connected to an access line different than the selected access line.

12. The method of claim 11 , wherein programming the data read from each of the memory cells of the subset of the plurality of memory cells to the single memory cell comprises programming a plurality of bits of data to the single memory cell.

13. The method of claim 8 , wherein sequentially electrically connecting the subset of the plurality of memory cells to the one data line during their respective periods of time comprises, for each of the memory cells of the subset of the plurality of memory cells, activating a respective select gate between that memory cell of the subset of the plurality of memory cells and the one data line during its respective period of time.

14. The method of claim 13 , further comprising electrically isolating all memory cells of the subset of the plurality of memory cells from the one data line between activating the respective select gate of one memory cell of the subset of the plurality of memory cells and activating the respective select gate of a next memory cell of the subset of the plurality of memory cells in sequence.

15. The method of claim 14 , wherein electrically isolating all memory cells of the subset of the plurality of memory cells from the one data line comprises deactivating the respective select gates for all memory cells of the subset of the plurality of memory cells.

16. The method of claim 8 , further comprising:

while applying the program voltage to the selected access line and while sequentially electrically connecting the subset of the plurality of memory cells to the one data line, activating each memory cell of the plurality of strings of series-connected memory cells that does not have a control gate connected to the selected access line.

17. A programming method, comprising:

applying a program voltage to a selected access line commonly connected to control gates of a plurality of memory cells, wherein each memory cell of the plurality of memory cells is contained in a respective string of series-connected memory cells of a plurality of strings of series-connected memory cells; and

while the voltage applied to the selected access line remains at the program voltage without being discharged, sequentially electrically connecting a subset of the plurality of memory cells to one data line, each for a respective period of time, so that only one memory cell of the subset of the plurality of memory cells is electrically connected to the one data line at a time;

wherein sequentially electrically connecting the subset of the plurality of memory cells to the one data line comprises:

electrically connecting one memory cell of the subset of the plurality of memory cells to the one data line during its respective period of time while electrically isolating each remaining memory cell of the subset of the plurality of memory cells from the one data line; and

electrically isolating that one memory cell of the subset of the plurality of memory cells from the one data line after its respective period of time and before electrically connecting any other memory cell of the subset of the plurality of memory cells to the one data line for its respective period of time.

18. The method of claim 17 , further comprising, for each memory cell of the subset of the plurality of memory cells, while electrically connecting that memory cell to the one data line during its respective period of time, applying a respective voltage level to the one data line corresponding to a respective desired data value to be programmed to that memory cell.

19. The method of claim 18 , wherein the respective voltage level corresponding to a particular desired data value inhibits changing a threshold voltage of its respective memory cell while applying the program voltage, and wherein the respective voltage level corresponding to a different desired data value enables changing the threshold voltage of its respective memory cell while applying the program voltage.

20. The method of claim 18 , further comprising, for each memory cell of the subset of the plurality of memory cells, storing an indication of the respective desired data value for that memory cell in a respective page buffer of a plurality of page buffers connected to the one data line.

Assignments (6)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050709/0838 →
RELEASE OF SECURITY INTEREST Recorded Jul 20, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 046597/0333 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
SUPPLEMENT NO. 6 TO PATENT SECURITY AGREEMENT Recorded Nov 1, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 044348/0253 →
SUPPLEMENT NO. 6 TO PATENT SECURITY AGREEMENT Recorded Nov 1, 2017
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 044653/0333 →
Continuity (2)
Division 15191786 · Jun 24, 2016
Related Publication 20170372784A1 · Dec 28, 2017