Depth measurement using scanning diffractive optical elements
A depth measurement assembly (DMA) measures depth information of an object in a local area. The DMA includes structured light projector, a depth camera assembly, and a controller. The structured light projector projects structured light patterns into the local area. The structured light projector includes a diffractive optical unit that includes diffractive optical elements (DOEs) and selects a DOE. The selected DOE is illuminated by light from a light source and converts the light into a structured light pattern. In some embodiment, the diffractive optical units selects multiple DOEs associated with multiple structured light patterns. The structured light pattern is projected into the local area by a projection assembly of the structured light projector and illuminates the object. The depth camera assembly captures images of the object. The controller uses the captured images to determine depth information of the object.
1. A depth measurement assembly (DMA) comprising:
a structured light projector configured to project a structured light pattern into a local area in accordance with depth instructions, wherein the structured light projector comprises:
a diffractive optical unit, the diffractive optical unit including a plurality of diffractive optical elements (DOEs), and each of the plurality of DOEs are associated with a corresponding structured light pattern, and the diffractive optical unit selects a DOE of the plurality of DOEs,
a light source that illuminates the selected DOE, the illuminated DOE generating a first structured light pattern, and
a projection assembly that projects the first structured light pattern into the local area,
wherein the plurality of DOEs are associated with a first pattern for an angular field of view occupying a region of space beyond a first overall threshold distance from the structured light projector and a second pattern for an angular field of view occupying a region of space within a second overall threshold distance from the structured light projector, and the second pattern is different from the first pattern; and
a depth camera assembly configured to capture one or more images of a portion of the local area illuminated with the first structured light pattern in accordance with depth instructions; and
a controller configured to:
generate the depth instructions;
provide the depth instructions to the structured light projector and the depth camera assembly, and
determine depth information of an object in the local area based in part on the one or more captures images.
2. The DMA of claim 1 , wherein the diffractive optical unit comprises a plate configured to spin in accordance with the depth instructions, and the plurality of DOEs are mounted on the plate.
3. The DMA of claim 2 , wherein the plate is configured to continuously spin at a speed specified in accordance with the depth instructions.
4. The DMA of claim 1 , wherein the diffractive optical unit selects a DOE of the plurality of DOEs for illumination by the light source in accordance with the depth instructions.
5. The DMA of claim 1 , wherein the plurality of DOEs are in an ordered sequence, and the diffractive optical unit selects each of the plurality of DOEs in accordance with the ordered sequence.
6. The DMA of claim 1 , wherein each of the DOEs is associated with a different structured light pattern.
7. The DMA of claim 1 , wherein some of the DOEs are associated with a same structured light pattern.
8. The DMA of claim 1 , wherein the first pattern is a dot pattern and the second pattern is a line pattern.
9. The DMA of claim 1 , wherein the structured light pattern corresponding to a DOE is selected from a list including: dot pattern, line pattern, sinusoid pattern, grid pattern, multi-tone pattern, diffuse light, other types of structured light patterns, or some combination thereof.
10. A structured light projector comprising:
a diffractive optical unit, the diffractive optical unit including a plurality of diffractive optical elements (DOEs), and each of the plurality of DOEs are associated with a corresponding structured light pattern, and the diffractive optical unit selects a DOE of the plurality of DOEs in accordance with depth instructions from a controller of a depth measurement assembly,
wherein the plurality of DOEs are associated with a first pattern for an angular field of view occupying a region of space beyond a first overall threshold distance from the structured light projector and a second pattern for an angular field of view occupying a region of space within a second overall threshold distance from the structured light projector, and the second pattern is different from the first pattern; and
a light source that illuminates the selected DOE, the illuminated DOE generating a first structured light pattern; and
a projection assembly that projects the first structured light pattern into a local area.
11. The structured light projector of claim 10 , wherein the diffractive optical unit comprises a plate configured to spin in accordance with the depth instructions, and the plurality of DOEs are mounted on the plate.
12. The structured light projector of claim 11 , wherein the plate is configured to continuously spin at a speed specified in accordance with the depth instructions.
13. The structured light projector of claim 10 , wherein the diffractive optical unit selects a DOE of the plurality of DOEs for illumination by the light source in accordance with the depth instructions.
14. The structured light projector of claim 10 , wherein the plurality of DOEs are in an ordered sequence, and the diffractive optical unit selects each of the plurality of DOEs in accordance with the ordered sequence.
15. The structured light projector of claim 10 , wherein each of the DOEs is associated with a different structured light pattern.
16. The structured light projector of claim 10 , wherein some of the DOEs are associated with a same structured light pattern.
17. The structured light projector of claim 10 , wherein the first pattern is a dot pattern and the second pattern is a line pattern.
18. The structured light projector of claim 10 , wherein the structured light pattern corresponding to a DOE is selected from a list including: dot pattern, line pattern, sinusoid pattern, grid pattern, multi-tone pattern, diffuse light, other types of structured light patterns, or some combination thereof.