IP Library Granted Patent US 10,249,806
Granted Patent B2
US 10,249,806 · App. 15/699,144 · Granted Apr 2, 2019

Solid state optoelectronic device with preformed metal support substrate

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Quick Facts
Patent No.
US 10,249,806
App. No.
15/699,144
Granted
Apr 2, 2019
Kind
B2
Abstract

A wafer-level process for manufacturing solid state lighting (“SSL”) devices using large-diameter preformed metal substrates is disclosed. A light emitting structure is formed on a growth substrate, and a preformed metal substrate is bonded to the light emitting structure opposite the growth substrate. The preformed metal substrate can be bonded to the light emitting structure via a metal-metal bond, such as a copper-copper bond, or with an inter-metallic compound bond.

Claims (29)

1. A method of manufacturing a plurality of solid state lighting (“SSL”) devices, the method comprising:

providing a light emitting structure having a first semiconductor material, a second semiconductor material, and an active region between the first and second semiconductor materials;

forming a metal bonding structure on the light emitting structure; and

bonding a preformed metal substrate to the metal bonding structure, wherein the light emitting structure extends continuously over a surface of the preformed metal substrate.

2. The method of claim 1 wherein the first semiconductor material, the second semiconductor material, and the active region extend continuously over a surface of the preformed metal substrate.

3. The method of claim 1 wherein bonding a preformed metal substrate to the metal bonding structure includes forming an inter-metallic compound (IMC) bond between the preformed metal substrate and the metal bonding structure.

4. The method of claim 3 wherein the IMC bond includes a first boundary region proximate the preformed metal substrate, a second boundary region proximate the light emitting structure, and a median region between the first and second boundary regions.

5. The method of claim 1 wherein bonding a preformed metal substrate to the metal bonding structure includes subjecting at least a portion of the preformed metal substrate and metal bonding structure to heat.

6. The method of claim 1 wherein providing a light emitting structure includes:

growing the light emitting structure on a growth substrate, and

after forming the metal bonding structure on the light emitting structure, removing the growth structure from the light emitting structure by at least one of grinding, post-grinding, wet etching, or dry etching.

7. The method of claim 1 , further comprising forming one or more exterior contacts for each SSL device and over the light emitting structure.

8. The method of claim 1 , further comprising attaching the preformed metal substrate to a temporary carrier with an adhesive before bonding the preformed metal substrate to the metal bonding structure.

9. The method of claim 1 , further comprising forming the preformed metal substrate by stamping the preformed metal substrate from a metal sheet.

10. The method of claim 1 wherein the metal bonding structure includes one or more of a reflective material, a barrier material, or a copper seed layer, and wherein the metal bonding structure extends continuously over the preformed metal substrate.

11. A method of manufacturing a semiconductor wafer, the method comprising:

forming a metal bonding structure on a light emitting structure having a first semiconductor material, a second semiconductor material, and an active region between the first and second semiconductor materials; and

bonding a preformed metal substrate to the metal bonding structure, wherein the first semiconductor material, the second semiconductor material, and the active region extend continuously over a surface of the preformed metal substrate.

12. The method of claim 11 wherein the wafer is at least approximately six inches in diameter, and wherein the preformed metal substrate has a thickness of approximately 50-300 μm.

13. The method of claim 11 wherein the metal bonding structure extends continuously over a surface of the preformed metal substrate.

14. The method of claim 11 wherein bonding a preformed metal substrate to the metal bonding structure includes forming an inter-metallic compound (IMC) bond.

15. The method of claim 14 wherein the metal bonding structure and the preformed metal substrate both include copper, and wherein the IMC bond is a copper-copper bond.

16. The method of claim 14 wherein the IMC bond includes a first boundary region proximate the preformed metal substrate, a second boundary region proximate the light emitting structure, and a median region between the first and second boundary regions, wherein the median region includes a metal alloy.

17. The method of claim 11 wherein bonding a preformed metal substrate to the metal bonding structure includes forming an inter-metallic compound bond made of nickel and tin between the metal bonding structure and the preformed metal substrate.

18. The method of claim 11 wherein bonding a preformed metal substrate to the metal bonding structure includes subjecting at least a portion of the preformed metal substrate and metal bonding structure to heat at a temperature less than 300° Celsius.

19. The method of claim 11 , further comprising forming a barrier material on the light emitting structure between the light emitting structure and the metal bonding structure.

20. The method of claim 11 wherein providing a light emitting structure includes:

growing the light emitting structure on a growth substrate, and

after forming the metal bonding structure on the light emitting structure, removing the growth structure from the light emitting structure by at least one of grinding, post-grinding, wet etching, or dry etching.

Assignments (7)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050709/0838 →
RELEASE OF SECURITY INTEREST Recorded Jul 20, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 046597/0333 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 9, 2018
From: ODNOBLYUDOV, VLADIMIR
To: MICRON TECHNOLOGY, INC.
Reel/Frame 045159/0660 →
SUPPLEMENT NO. 6 TO PATENT SECURITY AGREEMENT Recorded Nov 1, 2017
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 044653/0333 →
SUPPLEMENT NO. 6 TO PATENT SECURITY AGREEMENT Recorded Nov 1, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 044348/0253 →