Test system and method for measuring beam characteristics

1. A test system for measuring beam characteristics, comprising:

a device under test;

a first antenna;

a switch;

a test interface configured to input test communication data to the device under test; and

a control and analyzing processor configured to control a beam steering of the device under test and to analyze signals from the device under test; and

wherein the test communication data transmitted to the device under test comprises beam steering control data in order to control the beam steering of the device under test,

wherein the test interface is configured to lock a beam generated by the device under test, and

wherein the test system is configured to move the device under test in a helical trace.

2. The test system according to claim 1 , wherein the test interface is configured to one or more of control beam steering to lock the beam in a particular direction and to unlock the beam direction, and to lock or unlock the beam in response to an input signal received by the test interface.

3. The test system according to claim 1 , wherein the switch is configured to set an operating mode of the first antenna, and wherein the operating mode is a measuring mode or a communication mode.

4. The test system according to claim 3 , wherein the measuring mode configures the first antenna to receive electro-magnetic radiation emitted by the device under test, and wherein the communication mode configures the first antenna to establish a first test communication link to the device under test.

5. The test system according to claim 4 , wherein, in the measuring mode, the control and analyzing processor is configured to receive the signals to be analyzed from the device under test through the first antenna, and wherein, in the communication mode, the control and analyzing processor is configured to one or more of receive test communication data from the device under test through the first antenna and transmit test communication data to the device under test through the first antenna.

6. The test system according to claim 1 , wherein the first antenna is one or more of movable around the device under test and an array antenna configured to receive the electro-magnetic radiation emitted by the device under test and to transmit test communication data to the device under test without moving the first antenna.

7. The test system according to claim 1 , wherein the system further comprises:

a second antenna configured to provide a second test communication link to the device under test.

8. The test system according to claim 7 , wherein the second test communication link is established when the first antenna is set to the measuring mode.

9. The test system according to claim 7 , wherein the second antenna is positioned in a near field of the radiation emitted by the device under test.

10. The test system according to claim 7 , wherein the second antenna is located inside a radiation shielding area.

11. The test system according to claim 7 , wherein the second antenna is one or more of configured for test communication data to be transmitted through it and, movable relative to the device under test.

12. The test system according to claim 1 , wherein the device under test is mounted on a mount configured to adjust the position of the device under test.

13. The test system according to claim 1 , wherein the test interface is configured to receive one or more of beam steering data and communication data in one or more of a wireless manner and via a cable connection.

14. A method for measuring beam characteristics, the method comprising:

setting an operating mode of a first antenna to a communication mode via a switch;

establishing a first test communication link to a device under test via a first antenna;

transmitting test communication data, including beam steering control data, to the device under test;

controlling a beam steering of the device under test via a control/analyzing processor;

locking a beam of the device under test at a particular direction via a test interface;

setting the operating mode of the first antenna to a measuring mode via the switch;

receiving electro-magnetic radiation emitted by the device under test via the first antenna;

analyzing the electro-magnetic radiation received by the first antenna via the control/analyzing processor;

unlocking the beam via the test interface; and

moving the device under test in a helical trace.

15. The method according to claim 14 , further comprising:

moving the first antenna to a desired measuring position via the control/analyzing processor.

16. The method according to claim 14 , further comprising one or more of:

configuring a second antenna to establish a second test communication link to the device under test; and

configuring the control/analyzing processor to control a beam steering of the device under test via the second test communication link.

17. The method according to claim 16 , further comprising one or more of:

transmitting test communication data through the second antenna; and

establishing the second test communication link when the operating mode of the first antenna is in the measuring mode.

18. The method according to claim 16 , wherein the method further comprises the step of shielding the radiation generated by the link antenna.