MICRO LIGHT EMITTING DIODE TESTING
Methods and systems for testing a display having an array of microdrivers arranged in multiple of rows and columns including setting a testing mode of a microdriver of the array of microdrivers using multiple pins of the microdriver that are used in scanning or operation modes of the microdriver. The microdriver is configured to light one or more connected micro light emitting diode pixels coupled to the microdriver during the testing mode. Testing also includes operating the microdriver in the testing mode and determining functionality of the one or more connected micro light emitting diode pixels or the microdriver based on the testing mode.
1 . A method of testing a display having an array of microdrivers arranged in a plurality of rows and columns, comprising:
setting a testing mode of a microdriver of the array of microdrivers using a plurality of pins of the microdriver that are used in scanning or operation modes of the microdriver, wherein the microdriver is configured to light one or more connected micro light emitting diode pixels coupled to the microdriver during the testing mode;
operating the microdriver in the testing mode; and
determining functionality of the one or more connected micro light emitting diode pixels or the microdriver based on the testing mode.
2 . The method of claim 1 , wherein determining the functionality of the one or more connected micro light emitting diode pixels or the microdriver comprises optically scanning using an optical scanner the one or more connected micro light emitting diode pixels.
3 . The method of claim 2 , wherein the one or more connected light emitting diode pixels are placed in an emission state simultaneously.
4 . The method of claim 3 , wherein the one or more connected light emitting diode pixels comprise a plurality of colors.
5 . The method of claim 4 , wherein the plurality of colors comprises green and blue.
6 . The method of claim 4 , wherein the optical scanner filters the plurality of colors into individual colors.
7 . The method of claim 1 , wherein the recited steps are performed prior to affixing disposing any micro light emitting diodes (microLEDs) to the display.
8 . The method of claim 7 , comprising the step of disposing microLEDs on the display in connection with only non-defective microdrivers.
9 . The method of claim 1 , wherein determining functionality of the one or more connected micro light emitting diode pixels or the microdriver based on the testing mode comprises:
attributing a failures of a number of micro LEDs less than a threshold to micro LED failure; and
attributing failures of a number of micro LEDs greater than or equal to microdriver failure.
10 . The method of claim 9 , comprising the step of programming the display to avoid any defective microdrivers.
11 . An electronic display comprising:
an array of microdrivers arranged in a plurality of rows and columns each microdriver having a plurality of pins to control operation of the microdriver in operating or scanning modes; and
processing circuitry operably coupled to the array and being configured to:
set a testing mode of a microdriver of the array of microdrivers using the plurality of pins of the microdriver, wherein the microdriver is configured to light one or more connected micro light emitting diode pixels coupled to the microdriver during the testing mode;
operate the microdriver in the testing mode; and
determine functionality of the one or more connected micro light emitting diode pixels or the microdriver based on the testing mode.
12 . The display of claim 10 , wherein the processing circuitry is configured to determine whether any microdrivers based at least in part on optically scanned data.
13 . The display of claim 10 , wherein the processing circuitry comprises a timing controller.
14 . The display of claim 11 , wherein the processing circuitry is configured to perform the recited steps prior to any microLEDs being disposed on the display.
15 . The display, as set forth in claim 11 , wherein the processing circuitry is configured to program the display to avoid any defective microdrivers.
16 . An electronic device comprising:
a processor; and
an array of microdrivers each microdriver having a plurality of pins to control operation of the microdriver in operating or scanning modes; and
display processing circuitry operably coupled to the array and configured to:
set a testing mode of a microdriver of the array of microdrivers using the plurality of pins of the microdriver, wherein the microdriver is configured to light one or more connected micro light emitting diode pixels coupled to the microdriver during the testing mode;
operate the microdriver in the testing mode; and
determine functionality of the one or more connected micro light emitting diode pixels or the microdriver based on the testing mode.
17 . The method of claim 16 , wherein the plurality of pins comprises:
a scan enable pin configured to enable scan modes of the array; and
a scan mode pin configured to set a scan mode of a plurality of scan modes, wherein the plurality of scan modes includes the testing mode.
18 . The method of claim 16 , wherein the plurality of pins comprises:
a data pin configured to receive data during the operation mode of the array; and
a partial update enable pin that enable partial data updates to the microdriver during the operation mode of the array.
19 . The method of claim 16 , wherein the display processing circuitry is configured to program the display to avoid any defective microdrivers.
20 . The method of claim 19 , wherein avoiding any defective microdrivers comprises using a redundant microdriver in place of the defective microdriver.