Fault isolation system and method for detecting faults in a circuit
View Patent ↗The present invention provides a method and a fault isolation system for detecting errors in an integrated circuit. One feature of the present invention is using a movable second probe to scan and acquire an output signal through the vias or metal line structure of a diagnostic area along a detecting line, so as to find the fault location precisely, and another feature of the present invention is using a cutter in conjunction with the above method to narrow down the fault range. The cutter is used to electrically isolate the portion of diagnostic area step by step for approaching the fault location. This method can help to save a lot of analysis time and also makes the minor fault localization possible.
1. A method for detecting faults in a circuit, comprising:
touching with a first probe one terminal of a detecting line having a fault portion to provide an input signal to a diagnostic area through the detecting line, and touching another terminal of the detecting line with a second probe to receive an output signal;
removing a segment of the detecting line to define a remaining detecting line; and
moving the second probe to touch a terminal of the remaining detecting line to obtain a new output signal comprising a first signal, which is within a predetermined range set by a user if the fault portion is not within the remaining detecting line, and the new output signal is a second signal, which is out of the predetermined range set by the user if the fault portion is within the remaining detecting line.
2. The method of claim 1 , wherein removing the segment of the detecting line comprises removing less than one-tenth of a length of the detecting line.
3. The method of claim 1 , wherein removing the segment of the detecting line comprises electrically isolating the segment from the remaining detecting line without completely removing the segment from a substrate bearing the detecting line.
4. The method of claim 1 , further comprising:
repeating the removing a segment of the detecting line and the moving of the second probe to touch a terminal of the remaining detecting line until the new output signal comprises the first signal and a fault localized segment having the fault portion disposed therein is located.
5. The method of claim 4 , wherein the new output signal comprises the first signal when the fault portion corresponds to the removed segment of the detecting line.
6. The method of claim 1 , wherein removing comprises cutting or milling with an instrument.
7. The method of claim 6 , wherein removing comprises cutting, the cutting comprising applying a downward force with the instrument to the diagnostic area of the detecting line.
8. The method of claim 1 , wherein the new output signal comprises the first signal when the fault portion corresponds to the removed segment of the detecting line.
9. The method of claim 1 , further comprising providing the first probe with power from an alternating current (AC) power supply.
10. The method of claim 1 , further comprising driving the second probe with a piezo closed-loop system.
11. A fault isolation system, comprising:
a first probe for touching a terminal of a detecting line of a diagnostic area of a circuit having a fault portion and providing an input signal to the diagnostic area through the detecting line;
a second probe for touching, scanning and sensing along the detecting line for receiving an output signal of the detecting line; and
a tool for electrically isolating a portion of the diagnostic area that is within the detecting line.
12. The fault isolation system of claim 11 , wherein the tool comprises a cutting tool or a milling tool.
13. The fault isolation system of claim 12 , wherein the tool is a cutting tool configured to apply a downward force with the tool to the diagnostic area.
14. The fault isolation system of claim 12 , wherein the tool is a cutting tool comprising a rod portion and a tip portion.
15. The fault isolation system of claim 14 , wherein a width of the tip portion of the cutting tool is relatively less than a depth of the tip portion.
16. The fault isolation system of claim 15 , wherein the tip portion is configured as a conical shape structure or a pyramidal shape structure.
17. The fault isolation system of claim 11 , wherein the first probe and the second probe have an end portion, respectively, the end portion of each of the first probe and the second probe comprising a tip having a cross-sectional area relatively less than a base thereof.
18. The fault isolation system of claim 11 , further comprising an alternating current (AC) power source operably coupled to the first probe.
19. The fault isolation system of claim 11 , further comprising a piezo closed-loop drive system operably coupled to the second probe.
20. The fault isolation system of claim 11 , wherein the second probe is movable along the detecting line.