Probe card for a testing apparatus of electronic devices with enhanced filtering properties
A probe card for a testing apparatus of electronic devices comprises at least one testing head housing a plurality of contact probes, each contact probe having at least one contact tip abutting onto contact pads of a device under test, as well as at least one space transformer realizing a spatial transformation of the distances between contact pads made on its opposite sides and connected by means of suitable conductive tracks or planes, as well as a plurality of filtering capacitors provided between the space transformer and a PCB, which comprises direct conductive tracks or planes contacting conductive portions of the filtering capacitors.
1. A probe card for a testing apparatus of electronic devices, comprising:
a testing head housing a plurality of contact probes having respective contact tips configured to abut onto contact pads of a device under test,
a space transformer comprising:
first contact pads made on a first side of the space transformer;
second contact pads made on a second side, opposite to the first side, of the space transformer; and
conductive tracks or planes connecting at least some of the first contact pads to the second contact pads, the space transformer realizing a spatial transformation of distances between the first contact pads and distances between the second contact pads,
a printed circuit board (PCB), and
a first plurality of filtering capacitors positioned between the space transformer and the PCB,
wherein the PCB comprises direct conductive tracks or planes directly electrically contacting conductive portions of the filtering capacitors, and at least some of the conductive tracks or planes of the space transformer electrically contact the conductive portions of the filtering capacitors, and at least some of the conductive portions of the filter capacitors provide a conductive path from the conductive tracks or planes of the space transformer to the direct conductive tracks or planes of the PCB.
2. The probe card of claim 1 , wherein heights of the filtering capacitors are substantially equal to each other between the space transformer and the PCB.
3. The probe card of claim 2 , wherein the heights of the filtering capacitors are comparable to heights of further electrical contact structures realized between the space transformer and the PCB.
4. The probe card of claim 1 , wherein the conductive portions are metal leads of the filtering capacitors.
5. The probe card of claim 1 , wherein the filtering capacitors are realized in correspondence of contact probes, of the plurality of contact probes, carrying supply signals.
6. The probe card of claim 1 , further comprising a second plurality of filtering capacitors realized inside an area of the space transformer facing the testing head.
7. The probe card of claim 1 , further comprising:
a third plurality of filtering capacitors realized outside an area of the space transformer corresponding to the testing head and on the first side which faces the testing head.
8. The probe card of claim 1 , wherein the filtering capacitors are chosen between ceramic and silicon based capacitors.
9. The probe card of claim 1 , wherein the filtering capacitors are soldered to the space transformer, in correspondence with at least some of the second contact pads of the space transformer, which face the PCB.
10. The probe card of claim 1 , further comprising a plurality of interconnecting levels, wherein:
the space transformer is one of a plurality of space transformers realizing a plurality of spatial transformation levels,
the space transformers are interconnected to each other by the plurality of interconnecting levels and are arranged between the testing head and the PCB,
the first plurality of filtering capacitors is one plurality of plural pluralities of filtering capacitors, each interconnecting level comprising a respective plurality of the plural pluralities of filtering capacitors and respective electrical contact structures.
11. The probe card of claim 10 , wherein each of the space transformers comprises respective conductive tracks or planes connecting respective metal portions of the filtering capacitors.
12. A probe card for a testing apparatus of electronic devices, comprising:
a testing head housing a plurality of contact probes having respective contact tips configured to abut onto contact pads of a device under test;
a space transformer comprising:
first contact pads made on a first side of the space transformer;
second contact pads made on a second side, opposite to the first side, of the space transformer; and
conductive tracks or planes connecting at least some of the first contact pads to the second contact pads,
the space transformer realizing a spatial transformation of distances between the first contact pads and distances between the second contact pads,
a printed circuit board (PCB),
a first plurality of filtering capacitors positioned between the space transformer and the PCB, wherein the PCB comprises direct conductive tracks or planes electrically contacting conductive portions of the filtering capacitors; and
a conductive flexible interface electrically interconnecting the space transformer and the PCB by pressure.
13. The probe card of claim 12 , wherein the conductive flexible interface electrically interconnects the conductive portions of the filtering capacitors to the conductive tracks or planes of the PCB.
14. The probe card of claim 12 , wherein the conductive flexible interface is a conductive silicone rubber.
15. The probe card of claim 12 , wherein the conductive flexible interface has a shape that compensates height differences between the filtering capacitors and electrical contact structures included between the space transformer and the PCB.
16. The probe card of claim 12 , wherein the filtering capacitors and the electrical contact structures between the space transformer and the PCB comprise surface portions having an improved electrical contact.
17. The probe card of claim 14 , wherein the surface portions having an improved electrical contact are gold-plated.
18. A probe card for a testing apparatus of electronic devices comprising:
a testing head housing a plurality of contact probes having respective contact tips configured to abut onto contact pads of a device under test,
a space transformer comprising:
first contact pads made on a first side of the space transformer;
second contact pads made on a second side, opposite to the first side, of the space transformer; and
conductive tracks or planes connecting at least some of the first contact pads to the second contact pads,
the space transformer realizing a spatial transformation of distances between the first contact pads and distances between the second contact pads,
a printed circuit board (PCB), and
a first plurality of filtering capacitors positioned between the space transformer and the PCB, each filtering capacitor comprising a body and conductive portions arranged at sides of the body, the conductive portions electrically contacting the conductive tracks or planes,
wherein the PCB comprises conductive tracks or planes that directly electrically contact the conductive portions of the filtering capacitors, and at least some of the conductive portions of the filter capacitors provide a conductive path from the conductive tracks or planes of the space transformer to the direct conductive tracks or planes of the PCB.
19. The probe card of claim 18 , wherein heights of the filtering capacitors are substantially equal to each other between the space transformer and the PCB.
20. The probe card of claim 19 , further comprising:
electrical contact structures arranged between the space transformer and the PCB,
the heights of the filtering capacitors being comparable to heights of the electrical contact structures.
21. The probe card of claim 18 , wherein the conductive portions are metal leads of the filtering capacitors.
22. The probe card of claim 18 , wherein the filtering capacitors are realized in correspondence of contact probes, of the plurality of contact probes, carrying supply signals.
23. The probe card of claim 18 , further comprising a second plurality of filtering capacitors realized inside an area of the space transformer facing the testing head.
24. The probe card of claim 23 , further comprising:
a third plurality of filtering capacitors provided outside the area and on the first side which faces the testing head.
25. The probe card of claim 18 , wherein the filtering capacitors are chosen between ceramic and silicon based capacitors.
26. The probe card of claim 18 , wherein the filtering capacitors are soldered to the space transformer, in correspondence with at least some of the second contact pads of the space transformer, which face the PCB.