CT focal point determination method and system
View Patent ↗A method for determining a CT focal point includes determining a first intensity of first radiation incident on a first detector unit of a scanner, wherein the scanner may include a non-uniform anti-scatter grid (ASG) and a radiation source, and the non-uniform ASG may be configured according to a first focal point of the radiation source. The method also includes determining a second intensity of second radiation incident on a second detector unit of the scanner, wherein the first radiation and the second radiation are emitted from the radiation source with a second focal point. The method further includes determining a displacement of the second focal point from the first focal point based on the first intensity and the second intensity.
1. A method, comprising:
determining a first intensity of first radiation incident on a first detector unit of a scanner, the scanner including a non-uniform anti-scatter grid (ASG) and a radiation source, the non-uniform ASG being configured according to a first focal point of the radiation source;
determining a second intensity of second radiation incident on a second detector unit of the scanner, wherein the first radiation and the second radiation are emitted from the radiation source with a second focal point; and
determining a displacement of the second focal point from the first focal point based on the first intensity and the second intensity,
wherein the non-uniform ASG includes at least one first cell, wherein the first detector unit and the second detector unit are included in the first cell.
2. The method of claim 1 , wherein the determining the displacement comprises:
determining a ratio of the first intensity to the second intensity; and
determining the displacement based on the ratio.
3. The method of claim 2 , further comprising:
determining a correlation between the displacement and the ratio using a pinhole positioned between the radiation source and a detector of the scanner, the detector including the first detector unit and the second detector unit, wherein the displacement is determined further based on the correlation.
4. The method of claim 1 , further comprising:
generating, based on the displacement, a calibration instruction for calibrating the scanner.
5. The method of claim 1 , further comprising:
obtaining scan data by controlling the scanner to scan a subject; and
generating an image based on the scan data and the displacement.
6. The method of claim 5 , the first radiation and the second radiation being emitted during the obtaining the scan data.
7. The method of claim 1 , the non-uniform ASG including at least one second cell and at least one third cell having different structures, the second cell and the third cell including plates of different heights, wherein the first detector unit is included in the second cell, and the second detector unit is included in the third cell.
8. The method of claim 1 , further comprising:
obtaining at least one parameter relating to the non-uniform ASG, wherein the displacement is determined based at least in part on the at least one parameter.
9. The method of claim 8 , wherein the at least one parameter comprises at least one of a height of at least a portion of the non-uniform ASG or a distance from the second focal point to a top of the portion of the non-uniform ASG.
10. The method of claim 1 , wherein the displacement includes a direction.
11. A system, comprising at least one processor and at least one storage for storing instructions, the instructions; when executed by the at least one processor, causing the system to:
determine a first intensity of first radiation incident on a first detector unit of a scanner, the scanner including a non-uniform anti-scatter grid (ASG) and a radiation source, the non-uniform ASG being configured according to a first focal point of the radiation source;
determine a second intensity of second radiation incident on a second detector unit of the scanner, wherein the first radiation and the second radiation are emitted from the radiation source with a second focal point; and
determine a displacement of the second focal point from the first focal point based on the first intensity and the second intensity,
wherein the non-uniform ASG includes at least one first cell, wherein the first detector unit and the second detector unit are included in the first cell.
12. The system of claim 11 , wherein to determine the displacement, the system is further caused to:
determine a ratio of the first intensity to the second intensity; and
determine the displacement based on the ratio.
13. The system of claim 12 , wherein the system is further caused to:
determine a correlation between the displacement and the ratio using a pinhole positioned between the radiation source and a detector of the scanner, the detector including the first detector unit and the second detector unit, wherein the displacement is determined further based on the correlation.
14. The system of claim 11 , wherein the system is further caused to:
obtain at least one parameter relating to the configuration of the ASG, wherein the displacement is determined based at least in part on the at least one parameter, and
the at least one parameter comprises at least one of a height of at least a portion of the ASG or a distance from the second focal point to a top of the portion of the ASG.
15. The system of claim 11 , the non-uniform ASG including at least one second cell and at least one third cell having different structures, the second cell and the third cell including plates of different heights, wherein the first detector unit is included in the second cell, and the second detector unit is included in the third cell.