Automatic device detection and connection verification

1. A test and measurement instrument comprising:

a plurality of ports configured to:

source a test signal toward a device under test (DUT), and

receive a signal response from the DUT;

a measurement unit device having a power source to generate the test signal and configured to measure the signal response as one of either voltage or current; and

a processor configured to:

access a stored data structure;

compare the signal response to the data structure, and

determine a classification of at least one DUT component coupled to at least one of the ports based on results of the comparison.

2. The test and measurement instrument of claim 1 , further comprising a memory to store a mapping of DUT components to the plurality of ports, and wherein the processor is further configured to correct the mapping based on the determined classification.

3. The test and measurement instrument of claim 1 , wherein the processor is further configured to:

receive a mapping of DUT components coupled to the plurality of ports, and

employ the classification of the at least one DUT component to verify the mapping.

4. The test and measurement instrument of claim 1 , wherein the processor is further configured to:

cause the power source to source the test signal on a first of the ports; and

determine the classification of the DUT component by comparing the signal response on a second of the ports.

5. The test and measurement instrument of claim 1 , further comprising a display, wherein the processor is further configured to suggest to a user, via the display, a component test for the DUT component based on the classification of the DUT component.

6. The test and measurement instrument of claim 1 , wherein the processor is further configured cause the measurement unit to perform a component test for the DUT component based on the classification of the DUT component.

7. The test and measurement instrument of claim 1 , wherein sourcing the test signal toward the DUT includes sourcing a plurality of test signals across the ports, and the processor is further configured to determine a pathing between a plurality of DUT components by comparing the signal response to the data structure.

8. The test and measurement instrument of claim 1 , wherein the data structure is a decision tree, a plurality of DUT component profiles, a neural network, a database, or combinations thereof.

9. The test and measurement instrument of claim 1 , wherein the processor is further configured to determine a sub-classification of the at least one DUT component based on the classification of the at least one DUT component by causing the ports to source a second test signal, causing the measurement unit to measure a second signal response, and comparing the second signal response to the data structure.

10. A method comprising:

sourcing a plurality of test signals toward a device under test (DUT) over a plurality of ports;

measuring a plurality of signal responses from the DUT;

accessing a stored data structure;

comparing the signal responses to the data structure; and

determining classifications of one or more DUT components coupled to the ports based on results of the comparisons.

11. The method of claim 10 , further comprising:

storing a mapping of DUT components to the plurality of ports; and

remapping the mapping based on the determined classifications.

12. The method of claim 10 , further comprising:

receiving a mapping of DUT components coupled to the plurality of ports, and

employing the classifications of the DUT components to verify the mapping.

13. The method of claim 10 , further comprising suggesting one or more component tests for the one or more DUT components based on the classifications of the DUT components.

14. The method of claim 10 , further comprising performing a component test for the one or more DUT components based on the classifications of the DUT components.

15. The method of claim 10 , further comprising determining a pathing between DUT components by comparing the signal responses to the data structure.

16. A computer readable storage medium having instructions stored thereon that, when executed by a processor, cause the processor to:

source at least one test signal toward a device under test (DUT) over at least one of a plurality of ports;

measure a signal response from the DUT;

access a stored data structure;

compare the signal response to a data structure; and

determine a classification of at least one DUT component coupled ports based on results of the comparison.

17. The computer readable storage medium of claim 16 , wherein the instructions further cause the processor to:

source the test signal on a first of the ports; and

determine the classification of the DUT component by comparing the signal response on a second of the ports.

18. The computer readable storage medium of claim 16 , wherein the instructions further cause the processor to suggest to a user, via a display, a component test for the DUT component based on the classification of the DUT component.

19. The computer readable storage medium of claim 16 , wherein the instructions further cause the processor to determine a sub-classification of the at least one DUT component based on the classification of the at least one DUT component by sourcing a second test signal, measuring a second signal response, and comparing the second signal response to the data structure.

20. The computer readable storage medium of claim 16 , wherein the instructions further cause the processor to:

receive a mapping of DUT components coupled to the plurality of ports, and

employ the classification of the DUT component to verify the mapping.