Non-color shifting multilayer structures
An omnidirectional multilayer thin film is provided. The multilayer thin film includes a multilayer stack having a first layer of a first material and a second layer of a second material, the second layer extending across the first layer. The multilayer stack reflects a narrow band of electromagnetic radiation having a full width at half maximum (FWHM) of less than 300 nanometers (nm) and a color of less than 50 nm when the multilayer stack is exposed to broadband electromagnetic radiation and viewed from angles between 0 and 45 degrees. In some instances, the multilayer stack has a total thickness of less than 2 microns (μm). Preferably, the multilayer thin film has a total thickness of less than 1.5 μm and more preferably less than 1.0 μm.
1. A multilayer thin film that reflects an omnidirectional structural color comprising: a multilayer stack comprising a reflector layer, a first layer extending over the reflector layer, a second layer extending over the first layer and a third layer extending over the second layer, wherein the first layer is formed from a dielectric material, the second layer is formed from an absorbing material, and the third layer is formed from a selective absorbing material that is a different material than the first layer, wherein
the first layer is a dielectric layer formed from at least one of SiO 2 , TiO 2 , ZnS, and MgF 2 ,
the second layer is formed from at least one of Cr, Ta, W, Mo, Ti, TiN, Nb, Co, Si, Ge, Ni, Pd, and V,
the third layer is a selective absorbing layer formed from at least one of Fe 2 O 3 , Cu 2 O, amorphous Si, and crystalline Si, and
the multilayer thin film reflects a single narrow band of visible light when exposed to broadband electromagnetic radiation, the single narrow band of visible light comprising: a center wavelength greater than 550 nm; a visible full width at half maximum (FWHM) width of less than 200 nm; a color shift of the reflected single narrow band of visible light is less than 50 nm when the multilayer stack is exposed to broadband electromagnetic radiation and viewed from angles between 0 and 45 degrees relative to a direction normal to an outer surface of the multilayer thin film.
2. The multilayer thin film of claim 1 , wherein the first layer is formed from ZnS, the second layer is formed from Cr, and the third layer is formed from Fe 2 O 3 .
3. The multilayer thin film of claim 1 , wherein the first layer has a thickness between 30-300 nm, the second layer has a thickness between 5-20 nm and the third layer has a thickness between 20-80 nm.
4. The multilayer thin film of claim 1 , wherein the reflected single narrow band of visible light has a hue shift of less than or equal to 30° on the CIELAB color space when the multilayer thin film is viewed at angles between 0 and 45 degrees relative to a direction normal to an outer surface of the multilayer thin film.
5. The multilayer thin film of claim 4 , wherein the hue shift is less than 25° when the multilayer stack is exposed to broadband electromagnetic radiation and viewed from angles between 0 and 45 degrees.
6. The multilayer thin film of claim 1 , wherein the multilayer stack reflects electromagnetic radiation in the IR range.
7. The multilayer thin film of claim 1 , wherein the multilayer stack reflects a color with a chroma greater than or equal to 76 and less than or equal to 91.
8. A multilayer thin film that reflects an omnidirectional structural color comprising:
a multilayer stack comprising a reflector layer, a dielectric layer extending over the reflector layer, an absorbing layer extending over the dielectric layer and a selective absorbing layer extending of the absorbing layer, wherein
the dielectric layer is formed from at least one of SiO 2 , TiO 2 , ZnS, and MgF 2 ,
the absorbing layer is formed from at least one of Cr, Ta, W, Mo, Ti, TiN, Nb, Co, Si, Ge, Ni, Pd, and V,
the selective absorbing layer is formed from at least one of Fe 2 O 3 , Cu 2 O, amorphous Si, and crystalline Si, and
the multilayer thin film reflects visible light and IR radiation when exposed to broadband electromagnetic radiation, the reflected visible light being a single narrow band of visible light comprising:
a center wavelength greater than 550 nm;
a visible full width at half maximum (FWHM) width of less than 200 nm; and
a color shift of the reflected single narrow band of visible light is less than 50 nm when the multilayer stack is exposed to broadband electromagnetic radiation and viewed from angles between 0 and 45 degrees relative to a direction normal to an outer surface of the multilayer thin film.
9. The multilayer thin film of claim 8 , wherein the dielectric layer is formed from ZnS, the absorbing layer is formed from Cr, and the selective absorbing layer is formed from Fe 2 O 3 .
10. The multilayer thin film of claim 8 , wherein the reflected single narrow band of visible light has a hue shift of less than or equal to 30° on the CIELAB color space when the multilayer thin film is viewed at angles between 0 and 45 degrees relative to a direction normal to an outer surface of the multilayer thin film.