Open loop solution in data buffer and RCD
An apparatus comprising an open loop circuit and a delay circuit. The open loop circuit may be configured to generate an in-phase clock signal by performing a phase alignment in response to (i) a clean version of a system clock and (ii) a delayed version of a strobe signal. The delay circuit may be configured to (i) generate the delayed version of the strobe signal in response to (a) the strobe signal received from a memory interface and (b) a delay amount received from a calibration circuit and (ii) adjust a delay of transferring a data signal through the apparatus in response to (a) the delay amount and (b) the in-phase clock signal. The data signal may be received from the memory interface. The delay of transferring the data signal may be implemented to keep a latency of a data transfer within a pre-defined range.
1. An apparatus comprising:
an open loop circuit configured to generate an in-phase clock signal by performing a phase alignment in response to (i) a clean version of a system clock and (ii) a delayed version of a strobe signal; and
a delay circuit configured to (i) generate said delayed version of said strobe signal in response to (a) said strobe signal received from a memory interface and (b) a delay amount received from a calibration circuit, (ii) adjust a delay of transferring a data signal through said apparatus in response to (a) said delay amount and (b) said in-phase clock signal and (iii) present said in-phase clock signal and said data signal to a host interface, wherein (A) said data signal is received from said memory interface and (B) said delay of transferring said data signal is implemented to keep a latency of a data transfer within a pre-defined range.
2. The apparatus according to claim 1 , wherein said apparatus is implemented in a data buffer of a memory module.
3. The apparatus according to claim 1 , wherein said apparatus is implemented in a registered clock driver of a memory module.
4. The apparatus according to claim 1 , wherein said apparatus is portable to different processes.
5. The apparatus according to claim 1 , wherein said apparatus reduces a power consumption compared to a PLL/DLL solution.
6. The apparatus according to claim 1 , wherein said apparatus is configured to operate at frequencies in a range of approximately 0.5 GHz and 20 GHz.
7. The apparatus according to claim 1 , wherein said apparatus is configured to reduce jitter on said strobe signal and said data signal received from a DRAM memory module.
8. The apparatus according to claim 1 , further comprising a phase detector to implement said phase alignment, wherein said phase alignment is a zero phase.
9. The apparatus according to claim 1 , further comprising a PLL circuit configured to generate said clean version of said system clock in response to said system clock.
10. The apparatus according to claim 9 , wherein said PLL circuit does not perform a locking operation.
11. The apparatus according to claim 9 , further comprising a bypass switch configured to bypass said PLL circuit when said system clock is clean enough to be used for said phase alignment.
12. The apparatus according to claim 1 , wherein said apparatus implements an open loop architecture with digital calibration.
13. The apparatus according to claim 1 , wherein said pre-defined range is approximately 0.1 ns to 10 ns.
14. The apparatus according to claim 1 , wherein said calibration circuit is configured to maintain said delay by compensating for a temperature drift and a voltage drift.
15. The apparatus according to claim 1 , wherein said delay circuit is configured to delay said strobe signal and sample said data signal using said strobe signal.
16. The apparatus according to claim 1 , wherein (i) said delay circuit further comprises a first-in first-out circuit to reduce amount of jitter on said data signal and (ii) said delay of transferring said data signal through said apparatus includes a delay from said first-in first-out circuit.
17. The apparatus according to claim 1 , wherein said delay is calibrated to 6.5 cycles of said clean version of said system clock.
18. The apparatus according to claim 1 , wherein said calibration circuit comprises a digital calibration engine, a low-dropout regulator and an oscillator.
19. The apparatus according to claim 1 , wherein a digital calibration engine and a plurality of fine tune delay circuits are implemented in said host interface to align a skew between said in-phase clock signal and said data signal.
20. The apparatus according to claim 1 , wherein said open loop circuit and said delay circuit are configured to swap said strobe signal for said clean version of said system clock on a DQS path.