X-ray detectors capable of limiting diffusion of charge carriers
View Patent ↗An apparatus suitable for detecting X-ray is disclosed. In one example, the apparatus comprises an X-ray absorption layer comprising a pixel and a second pixel, and a layer of material or vacuum extending across a thickness of the X-ray absorption layer and encircling the pixel, wherein the layer of material is configured to prevent a charge carrier in the pixel from moving through the layer of material. In another example, the apparatus comprises an X-ray absorption layer comprising a plurality of columns of a semiconductor configured to absorb X-ray, and a layer of material or vacuum extending across a thickness of the X-ray absorption layer and encircling each of the columns, wherein the layer of material is configured to prevent transfer of a charge carrier between two of the columns.
1. An apparatus suitable for detecting X-ray, comprising:
an X-ray absorption layer comprising:
a pixel,
a layer of material or vacuum extending across a thickness of the X-ray absorption layer and encircling the pixel, wherein the layer of material or vacuum is configured to prevent a charge carrier in the pixel from entering a neighboring pixel of the pixel.
2. The apparatus of claim 1 , wherein the layer of material is a layer of an electrically insulating material.
3. The apparatus of claim 1 , wherein the layer of material is a layer of a gas.
4. The apparatus of claim 1 , wherein the layer of material comprises a heavily doped semiconductor.
5. The apparatus of claim 1 , wherein the apparatus comprises an array of pixels.
6. A system comprising the apparatus of claim 1 and an X-ray source, wherein the system is configured for performing X-ray radiography on human chest or abdomen.
7. A system comprising the apparatus of claim 1 and an X-ray source, wherein the system is configured for performing X-ray radiography on human mouth.
8. A cargo scanning or non-intrusive inspection (NII) system, comprising the apparatus of claim 1 and an X-ray source, wherein the cargo scanning or non-intrusive inspection (NII) system is configured for forming an image based on backscattered X-ray.
9. A cargo scanning or non-intrusive inspection (NII) system, comprising the apparatus of claim 1 and an X-ray source, wherein the cargo scanning or non-intrusive inspection (NII) system is configured for forming an image based on X-ray transmitted through an object inspected.
10. A full-body scanner system comprising the apparatus of claim 1 and an X-ray source.
11. An X-ray computed tomography (X-ray CT) system comprising the apparatus of claim 1 and an X-ray source.
12. An electron microscope comprising the apparatus of claim 1 , an electron source and an electronic optical system.
13. A system comprising the apparatus of claim 1 , wherein the system is configured for measuring dose of an X-ray source.
14. A system comprising the apparatus of claim 1 , wherein the system is an X-ray telescope, or an X-ray microscopy, or wherein the system is configured for performing mammography, industrial defect detection, microradiography, casting inspection, weld inspection, or digital subtraction angiography.
15. A system suitable for phase-contrast X-ray imaging (PCI), the system comprising:
the apparatus of claim 1 ;
a second X-ray detector; and
a spacer, wherein the apparatus and the second X-ray detector are spaced apart by the spacer.
16. The system of claim 15 , wherein the apparatus and the second X-ray detector are configured for respectively capturing an image of an object simultaneously.
17. The system of claim 15 , wherein the second X-ray detector is identical to the apparatus.
18. A system suitable for phase-contrast X-ray imaging (PCI), the system comprising the apparatus of claim 1 , wherein the apparatus is configured for moving to and capturing images of an object exposed to incident X-ray at different distances from the object.
19. The apparatus of claim 1 , wherein the pixel comprises a column of a semiconductor configured to absorb X-ray.