Operating frequency determination based on a warranty period
In one example in accordance with the present disclosure, a method for determining operating frequencies includes receiving a warranty period for a computer component. The method includes determining an operating frequency that will cause a predicted life cycle of the computer component operating at the operating frequency to fall within the warranty period. The method includes setting the computer component to operate at the operating frequency.
1. A method for determining operating frequencies, the method comprising:
receiving a warranty period for a computer component;
determining durability information for the computer component based on data received from a stress sensor on the computer component;
determining, based on the durability information, an operating frequency that causes a predicted life cycle of the computer component operating at the operating frequency to fall within the warranty period; and
setting the computer component to operate at the operating frequency, thereby allowing the computer component to operate at an enhanced performance level while maintaining a life cycle within the warranty period.
2. The method of claim 1 , wherein setting the computer component to operate at the operating frequency is performed by a baseboard management controller.
3. The method of claim 1 further comprising:
determining an electrical stress on the computer component at the operating frequency, wherein the electrical stress corresponds to at least one of a current setting or a voltage setting; and
determining the predicted life cycle of the computer component based further on the electrical stress.
4. The method of claim 1 further comprising:
determining a thermal stress on the computer component at the operating frequency, wherein the thermal stress corresponds to a temperature setting; and
determining the predicted life cycle of the computer component based further on the thermal stress.
5. The method of claim 1 further comprising:
determining an effect of operating under an operating environment on the computer component; and
determining the predicted life cycle of the computer component based further on the effect of operating under the operating environment.
6. The method of claim 1 , further comprising:
determining a silicon durability of the computer component based on the durability information; and
determining the predicted life cycle of the computer component based on the silicon durability.
7. The method of claim 1 , wherein the operating frequency is the highest frequency under which the computer component is capable of operating for the life cycle.
8. A system, comprising:
a processor; and
a non-transitory computer-readable storage medium storing instructions, which when executed by the processor cause the processor to perform a method for determining operating frequencies, the method comprising:
receiving a warranty period for a computer component;
determining durability information for the computer component based on data received from a stress sensor on the computer component;
determining, based on the durability information, an operating frequency for the computer component that causes a predicted life cycle of the computer component operating at the operating frequency to fall within the warranty period;
setting the computer component to operate at the operating frequency thereby allowing the computer component to operate at an enhanced performance level while maintaining a life cycle within the warranty period.
9. The system of claim 8 , further comprising a baseboard management controller configured to set the computer component to operate at the operating frequency.
10. The system of claim 8 , wherein the operating frequency is the highest frequency under which the computer component is capable of operating for the life cycle.
11. The system of claim 8 , wherein the method further comprises determining, for the computer component, the operating frequency such that a performance level of the computer component meets a performance threshold.
12. The system of claim 8 , further comprising:
an electrical stress sensor configured to receive electrical stress data of the computer component;
wherein the method further comprises:
determining an electrical stress on the computer component at the operating frequency, wherein the electrical stress corresponds to at least one of a current setting or a voltage setting; and
determining the predicted life cycle of the computer component based further on the electrical stress.
13. The system of claim 8 , wherein the method further comprises:
determining a thermal stress on the computer component at the operating frequency, wherein the thermal stress corresponds to a temperature setting; and
determining the predicted life cycle of the computer component based further on the thermal stress.
14. The system of claim 8 , wherein the method further comprises:
determining an effect of operating under an operating environment on the computer component; and
determining the predicted life cycle of the computer component based further on the effect of operating under the operating environment.
15. A non-transitory machine-readable storage medium encoded with instructions that when executed by a computer cause the computer to perform a method for determining operating frequencies, the method comprising:
receiving a warranty period for a computer component;
determining durability information for the computer component based on data received from a stress sensor on the computer component;
determining, based on the durability information, an operating frequency that causes a predicted life cycle of the computer component operating at the operating frequency to fall within the warranty period; and
setting the computer component to operate at the operating frequency, thereby allowing the computer component to operate at an enhanced performance level while maintaining a life cycle within the warranty period.
16. The non-transitory machine-readable storage medium of claim 15 , wherein the method further comprises:
determining a silicon durability of the computer component based on the durability information; and
determining the predicted life cycle of the computer component based on the silicon durability.
17. The non-transitory machine-readable storage medium of claim 15 , wherein the method comprises:
determining an effect of operating under an operating environment on the computer component; and
determining the predicted life cycle of the computer component based further on the effect of operating under the predicted operating environment.
18. The non-transitory machine-readable storage medium of claim 15 , wherein the method further comprises:
instructing a baseboard management controller to set the computer component to operate at the highest frequency under which the computer component is capable of operating for the life cycle.
19. The non-transitory machine-readable storage medium of claim 15 , wherein the operating frequency is the highest frequency under which the computer component is capable of operating for the life cycle.
20. The non-transitory machine-readable storage medium of claim 15 , wherein the method further comprises:
determining one or more of:
a thermal stress, which corresponds to a temperature setting, on the computer component at the operating frequency; and
an electrical stress, which corresponds to a current setting or a voltage setting, on the computer component at the operating frequency; and
determining the predicted life cycle of the computer component based further on the determined stress.