IP Library › Granted Patent US 10,739,240
Granted Patent B2
US 10,739,240 · App. 15/769,863 · Granted Aug 11, 2020

Particle analyzer

Inventor: Makoto Kawano (Ikeda, JP)
Assignee: KAWANO Lab. Inc.
G01N15/0211G01N9/00G01N15/0227G01N15/1031G01N15/1456G01N15/1468G01N27/72G01N2015/03
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,739,240
App. No.
15/769,863
Granted
Aug 11, 2020
Kind
B2
Abstract

A particle analyzer ( 1 ) includes a measurement cell ( 2 ) and a measurement section ( 10 ). The particle analyzer ( 1 ) further includes a migration section. The migration section includes magnets ( 3 a and 3 b ), electrodes ( 4 a, 4 b, and 4 c ), a power source ( 5 ), and a laser light source ( 6 ). The migration section causes migration of particles contained in a medium loaded into the measurement cell ( 2 ) by at least two of a magnetophoresis method, a dielectrophoresis method, an electromagnetophoresis method, and a photophoresis method. The measurement section ( 10 ) performs determination of a physical quantity of the particles and determination of a migration rate of the particles.

Claims (100)

1. A particle analyzer comprising:

a measurement cell configured to receive loading of a medium containing particles;

a migration section configured to cause migration of the particles in the medium in the measurement cell;

a measurement section configured to determine a physical quantity of the particles in the medium in the measurement cell and determine a moving rate of the particles during the migration caused by the migration section;

a laser light source configured to irradiate the particles in the medium in the measurement cell with laser light;

a reference light generator configured to generate reference light as a portion of the laser light by splitting the laser light before the laser light enters the measurement cell; and

an optical sensor configured to receive the reference light and light scattered from the particles irradiated with the laser light, wherein

the migration section causes the migration of the particles by at least two of a magnetophoresis method, a dielectrophoresis method, an electromagnetophoresis method, a photophoresis method, and a gravitational sedimentation method,

the measurement section determines the moving rate of the particles and determines a particle size distribution of the particles as a physical quantity of the particles, based on an output of the optical sensor, and

the measurement section performs, as the determination of a physical quantity of the particles, at least two of:

determination of a magnetic susceptibility of the particles based on the particle size distribution and the moving rate of the particles during the migration by the magnetophoresis method;

determination of a permittivity of the particles based on the particle size distribution and the moving rate of the particles during the migration by the dielectrophoresis method;

determination of an electrical conductivity of the particles based on the particle size distribution and the moving rate of the particles during the migration by the electromagnetophoresis method;

determination of a refractive index of the particles based on the particle size distribution and the moving rate of the particles during the migration by the photophoresis method; and

determination of a specific gravity or a mass of the particles based on the moving rate of the particles during the migration by the gravitational sedimentation method.

2. The particle analyzer according to claim 1 , wherein

the measurement section further performs, as the determination of a physical quantity of the particles, determination of a molecular weight of the particles based on a static light scattering method.

3. The particle analyzer according to claim 1 , further comprising:

a light source configured to generate light to be irradiated onto the particles in the medium in the measurement cell, wherein

the optical sensor detects light from the particles irradiated with the light, and

the measurement section obtains at least one of an absorption spectrum, an emission spectrum, and a scattering spectrum corresponding to wavelengths of the light irradiated onto the particles based on an output of the optical sensor.

4. The particle analyzer according to claim 1 , further comprising

a display section configured to display a screen image showing at least one physical quantity determined by the measurement section or a screen image showing a relationship between at least two physical quantities determined by the measurement section.

5. The particle analyzer according to claim 4 , further comprising

an imaging section configured to image the particles, wherein

the display section displays a screen image including the particles imaged by the imaging section.

6. The particle analyzer according to claim 5 , wherein

the display section displays a screen image including the imaged particles and a screen image that shows at least one physical quantity determined by the measurement section and that is superimposed on the imaged particles.

7. The particle analyzer according to claim 5 , wherein

the display section displays a screen image including the imaged particles in which imaged particles having a specific physical quantity that is equal to or greater than a threshold value are shown in a color, and imaged particles having the specific physical quantity that is smaller than the threshold value are shown in a different color.

8. The particle analyzer according to claim 1 , further comprising

an exterior that covers the measurement cell, wherein

the exterior includes a substance having a smaller refractive index than the measurement cell.

9. A particle analyzer comprising:

a measurement cell configured to receive loading of a medium containing particles;

a migration section configured to cause migration of the particles in the medium in the measurement cell;

a measurement section configured to determine a physical quantity of the particles in the medium in the measurement cell and determine a moving rate of the particles during the migration caused by the migration section;

a laser light source configured to irradiate the particles in the medium in the measurement cell with laser light;

a reference light generator configured to generate reference light as a portion of the laser light by splitting the laser light before the laser light enters the measurement cell; and

an optical sensor configured to receive the reference light and light scattered from the particles irradiated with the laser light, wherein

the migration section causes the migration of the particles by at least two of a dielectrophoresis method, an electromagnetophoresis method, a photophoresis method, a gravitational sedimentation method, and an electrophoresis method,

the measurement section determines the moving rate of the particles and determines a particle size distribution of the particles as a physical quantity of the particles, based on an output of the optical sensor, and

the measurement section performs, as the determination of a physical quantity of the particles, at least two of:

determination of a permittivity of the particles based on the particle size distribution and the moving rate of the particles during the migration by the dielectrophoresis method;

determination of an electrical conductivity of the particles based on the particle size distribution and the moving rate of the particles during the migration by the electromagnetophoresis method;

determination of a refractive index of the particles based on the particle size distribution and the moving rate of the particles during the migration by the photophoresis method;

determination of a specific gravity or a mass of the particles based on the moving rate of the particles during the migration by the gravitational sedimentation method; and

determination of a zeta potential of the particles based on the moving rate of the particles during the migration by the electrophoresis method.

10. The particle analyzer according to claim 9 , wherein

the measurement section further performs, as the determination of a physical quantity of the particles, determination of a molecular weight of the particles based on a static light scattering method.

11. The particle analyzer according to claim 9 , further comprising:

a light source configured to generate light to be irradiated onto the particles in the medium in the measurement cell, wherein

the optical sensor detects light from the particles irradiated with the light, and

the measurement section obtains at least one of an absorption spectrum, an emission spectrum, and a scattering spectrum corresponding to wavelengths of the light irradiated onto the particles based on an output of the optical sensor.

12. The particle analyzer according to claim 9 , further comprising

a display section configured to display a screen image showing at least one physical quantity determined by the measurement section or a screen image showing a relationship between at least two physical quantities determined by the measurement section.

13. The particle analyzer according to claim 12 , further comprising

an imaging section configured to image the particles, wherein

the display section displays a screen image including the particles imaged by the imaging section.

14. The particle analyzer according to claim 13 , wherein

the display section displays a screen image including the imaged particles and a screen image that shows at least one physical quantity determined by the measurement section and that is superimposed on the imaged particles.

15. The particle analyzer according to claim 13 , wherein

the display section displays a screen image including the imaged particles in which imaged particles having a specific physical quantity that is equal to or greater than a threshold value are shown in a color, and imaged particles having the specific physical quantity that is smaller than the threshold value are shown in a different color.

16. The particle analyzer according to claim 9 , further comprising

an exterior that covers the measurement cell, wherein

the exterior includes a substance having a smaller refractive index than the measurement cell.

17. A particle analyzer comprising:

a measurement cell configured to receive loading of a medium containing particles;

a migration section configured to cause migration of the particles in the medium in the measurement cell;

a measurement section configured to determine a physical quantity of the particles in the medium in the measurement cell and determine a moving rate of the particles during the migration caused by the migration section;

a laser light source configured to irradiate the particles in the medium in the measurement cell with laser light;

a reference light generator configured to generate reference light as a portion of the laser light by splitting the laser light before the laser light enters the measurement cell; and

an optical sensor configured to receive the reference light and light scattered from the particles irradiated with the laser light, wherein

the migration section causes the migration of the particles by a magnetophoresis method, an electrophoresis method, and at least one of a dielectrophoresis method, an electromagnetophoresis method, a photophoresis method, and a gravitational sedimentation method,

the measurement section determines the moving rate of the particles and determines a particle size distribution of the particles as a physical quantity of the particles, based on an output of the optical sensor, and

the measurement section performs, as the determination of a physical quantity of the particles:

determination of a magnetic susceptibility of the particles based on the particle size distribution and the moving rate of the particles during the migration by the magnetophoresis method,

determination of a zeta potential of the particles based on the moving rate of the particles during the migration by the electrophoresis method, and

at least one of:

determination of a permittivity of the particles based on the particle size distribution and the moving rate of the particles during the migration by the dielectrophoresis method;

determination of an electrical conductivity of the particles based on the particle size distribution and the moving rate of the particles during the migration by the electromagnetophoresis method;

determination of a refractive index of the particles based on the particle size distribution and the moving rate of the particles during the migration by the photophoresis method; and

determination of a specific gravity or a mass of the particles based on the moving rate of the particles during the migration by the gravitational sedimentation method.

18. The particle analyzer according to claim 17 , wherein

the measurement section further performs, as the determination of a physical quantity of the particles, determination of a molecular weight of the particles based on a static light scattering method.

19. The particle analyzer according to claim 17 , further comprising:

a light source configured to generate light to be irradiated onto the particles in the medium in the measurement cell, wherein

the optical sensor detects light from the particles irradiated with the light, and

the measurement section obtains at least one of an absorption spectrum, an emission spectrum, and a scattering spectrum corresponding to wavelengths of the light irradiated onto the particles based on an output of the optical sensor.

20. The particle analyzer according to claim 17 , further comprising

a display section configured to display a screen image showing at least one physical quantity determined by the measurement section or a screen image showing a relationship between at least two physical quantities determined by the measurement section.

21. The particle analyzer according to claim 20 , further comprising

an imaging section configured to image the particles, wherein

the display section displays a screen image including the particles imaged by the imaging section.

22. The particle analyzer according to claim 21 , wherein

the display section displays a screen image including the imaged particles and a screen image that shows at least one physical quantity determined by the measurement section and that is superimposed on the imaged particles.

23. The particle analyzer according to claim 21 , wherein

the display section displays a screen image including the imaged particles in which imaged particles having a specific physical quantity that is equal to or greater than a threshold value are shown in a color, and imaged particles having the specific physical quantity that is smaller than the threshold value are shown in a different color.

24. The particle analyzer according to claim 17 , further comprising an exterior that covers the measurement cell, wherein

the exterior includes a substance having a smaller refractive index than the measurement cell.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 20, 2018
From: KAWANO, MAKOTO
To: KAWANO LAB. INC.
Reel/Frame 045598/0059 →
Priority Claims (1)
JP 2015-209193 · Oct 23, 2015 · national
Continuity (1)
Related Publication 20180313738A1 · Nov 1, 2018
Cited By (1)
US 12,298,217