IP Library Granted Patent US 11,067,691
Granted Patent B2
US 11,067,691 · App. 15/775,490 · Granted Jul 20, 2021

Acquisition of distance data with optical ranging systems

Inventors: Miguel Bruno Vaello Paños (Zurich, CH); Cassian Strässle (Wädenswil, CH); Bryant Hansen (Zurich, CH)
Assignee: ams Sensors Singapore Pte. Ltd.
G01S17/32G01C3/00G01S7/493G01S7/4914G01S17/08
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Quick Facts
Patent No.
US 11,067,691
App. No.
15/775,490
Granted
Jul 20, 2021
Kind
B2
Abstract

This disclosure is directed to methods for acquiring distance data using optical ranging systems. Optical ranging systems include one or more reference pixels and one or more object pixels. The methods employ operations for optimizing reference-pixel integration times and object-pixel integration times such that accurate distance data can be collected.

Claims (69)

1. A method for collecting distance data with an optical ranging system, the method comprising:

initializing the optical ranging system, the optical ranging system including at least one reference pixel operable to convert incident light to electrical charges, and at least one object pixel operable to convert incident light to electrical charges;

directing incident light to the at least one reference pixel and the at least one object pixel, collecting electrical charges with the at least one reference pixel over an initial reference-pixel integration time, and collecting electrical charges with the at least one object pixel over an initial object-pixel integration time;

correlating the electrical charges collected with the at least one reference pixel over the initial reference-pixel integration time to an initial reference signal having an initial reference signal intensity;

correlating the electrical charges collected with the at least one object pixel over the initial object-pixel integration time to an initial object signal having an initial object-signal intensity;

determining an optimal reference pixel integration time and an optimal object pixel integration time from the initial reference signal and the initial object signal;

collecting electrical charges with the at least one reference pixel over the optimal reference pixel integration time, and collecting electrical charges with the at least one object pixel over the optimal object pixel integration time;

correlating the electrical charges collected with the at least one reference pixel over the optimal reference pixel integration time to an optimal reference signal, and correlating the electrical charges collected with the at least one object pixel over the optimal object pixel integration time to an optimal object signal; and

determining distance data from the optimal reference signal and the optimal object signal,

wherein determining the optimal reference-pixel-integration time and the optimal object-pixel-integration time from the initial reference signal and the initial object signal further includes:

determining a calculated reference-pixel-integration time, and determining a calculated object-pixel-integration time;

comparing the calculated reference-pixel-integration time to a pre-established minimum integration time and a pre-established maximum integration time;

comparing the calculated object-pixel-integration time to the pre-established minimum integration time and the pre-established maximum integration time;

equating the optimal reference-pixel-integration time to the calculated reference-pixel-integration time or the calculated object-pixel-integration time; and

equating the optimal object-pixel-integration time to the calculated object-pixel-integration time; and

wherein determining the calculated-reference-pixel-integration time further includes:

comparing the initial reference-signal intensity to a pre-established reference-signal intensity threshold;

increasing the initial reference-pixel integration time for initial reference-signal intensities lower than the pre-established reference-signal intensity threshold;

decreasing the initial reference-pixel integration time for initial reference-signal intensities greater than the pre-established reference-signal intensity threshold; and

equating the initial reference-pixel integration time to the calculated-reference-pixel-integration time.

2. The method according to claim 1 , further including equating the optimal reference pixel integration time to the calculated reference pixel integration time for calculated reference pixel integration times less than the pre-established minimum integration time and greater than the pre-established maximum integration time.

3. The method according to claim 1 , further including equating the optimal reference pixel integration time to the calculated object pixel integration time for calculated reference pixel integration times equal to or between the pre-established minimum integration time and the pre-established maximum integration time.

4. The method according to claim 1 , wherein determining the calculated-object-pixel-integration time further includes:

comparing the initial object signal intensity to a pre-established object-signal intensity threshold;

increasing the initial object-pixel integration time for initial object signal intensities lower than the pre-established object-signal intensity threshold;

decreasing the initial object-pixel integration time for initial object signal intensities greater than the pre-established object-signal intensity threshold; and

equating the initial object-pixel integration time to the calculated-object-pixel-integration time.

5. The method according to claim 1 , further including:

equating the initial reference-signal intensity to an initial reference-signal signal-to-noise ratio;

equating the initial object-signal intensity to an initial object-signal signal-to-noise ratio; and

equating the pre-established reference-signal intensity threshold to a pre-stablished reference-signal signal-to-noise threshold.

6. The method according to claim 4 , further including:

equating the initial reference-signal intensity to an initial reference-signal signal-to-noise ratio;

equating the initial object-signal intensity to an initial object-signal signal-to-noise ratio; and

equating the pre-established object-signal intensity threshold to a pre-established object-signal signal-to-noise threshold.

7. The method according to claim 1 , wherein collecting electrical charges with the at least one reference pixel over an initial reference-pixel integration time, and collecting electrical charges with the at least one object pixel over an initial object-pixel integration time are initiated simultaneously.

8. The method according to claim 7 , wherein collecting electrical charges with the at least one reference pixel over the optimal reference pixel integration time, and collecting electrical charges with the at least one object pixel over the optimal object pixel integration time are initiated simultaneously.

9. The method according to claim 1 , wherein directing incident light to the at least one reference pixel and the at least one object pixel includes modulating the incident light with a particular modulation frequency.

10. The method according to claim 9 , wherein at least one reference pixel is a demodulation pixel and at least one object pixel is a demodulation pixel.

11. The method according to claim 10 , wherein determining distance data from the optimal reference signal and the optimal object signal includes determining distance data by the indirect time-of-flight technique.

12. The method according to claim 11 , further including equating the optimal reference pixel integration time to the calculated reference pixel integration time for calculated reference pixel integration times less than the pre-established minimum integration time and greater than the pre-established maximum integration time.

13. The method according to claim 11 , further including equating the optimal reference pixel integration time to the calculated object pixel integration time for calculated reference pixel integration times equal to or between the pre-established minimum integration time and the pre-established maximum integration time.

14. The method according to claim 11 , wherein:

collecting electrical charges with the at least one reference pixel over an initial reference-pixel integration time, and collecting electrical charges with the at least one object pixel over an initial object-pixel integration time are initiated simultaneously; and

collecting electrical charges with the at least one reference pixel over the optimal reference pixel integration time, and collecting electrical charges with the at least one object pixel over the optimal object pixel integration time are initiated simultaneously.

15. A method for collecting distance data with an optical ranging system, the method comprising:

initializing the optical ranging system, the optical ranging system including at least one reference pixel operable to convert incident light to electrical charges, and at least one object pixel operable to convert incident light to electrical charges;

directing incident light to the at least one reference pixel and the at least one object pixel, collecting electrical charges with the at least one reference pixel over an initial reference-pixel integration time, and collecting electrical charges with the at least one object pixel over an initial object-pixel integration time;

correlating the electrical charges collected with the at least one reference pixel over the initial reference-pixel integration time to an initial reference signal having an initial reference-signal intensity;

correlating the electrical charges collected with the at least one object pixel over the initial object-pixel integration time to an initial object signal having an initial object-signal intensity;

determining an optimal reference pixel integration time and an optimal object pixel integration time from the initial reference signal and the initial object signal;

collecting electrical charges with the at least one reference pixel over the optimal reference pixel integration time, and collecting electrical charges with the at least one object pixel over the optimal object pixel integration time;

correlating the electrical charges collected with the at least one reference pixel over the optimal reference pixel integration time to an optimal reference signal, and correlating the electrical charges collected with the at least one object pixel over the optimal object pixel integration time to an optimal object signal; and

determining distance data from the optimal reference signal and the optimal object signal;

wherein determining the optimal reference-pixel-integration time and the optimal object-pixel-integration time from the initial reference signal and the initial object signal further includes

determining a calculated reference-pixel-integration time, and determining a calculated object-pixel-integration time,

comparing the calculated reference-pixel-integration time to a pre-established minimum integration time and a pre-established maximum integration time,

comparing the calculated object-pixel-integration time to the pre-established minimum integration time and the pre-established maximum integration time,

equating the optimal reference-pixel-integration time to the calculated reference-pixel-integration time or the calculated object-pixel-integration time, and

equating the optimal object-pixel-integration time to the calculated object-pixel-integration time; and

wherein determining the calculated-object-pixel-integration time further includes

comparing the initial object signal intensity to a pre-established object-signal intensity threshold,

increasing the initial object-pixel integration time for initial object signal intensities lower than the pre-established object-signal intensity threshold,

decreasing the initial object-pixel integration time for initial object signal intensities greater than the pre-established object-signal intensity threshold, and

equating the initial object-pixel integration time to the calculated-object-pixel-integration time.

16. The method according to claim 15 , further including equating the initial reference-signal intensity to an initial reference-signal signal-to-noise ratio, equating the initial object-signal intensity to an initial object-signal signal-to-noise ratio, and equating the pre-established object-signal intensity threshold to a pre-established object-signal signal-to-noise threshold.

17. The method according to claim 15 , wherein determining the calculated-reference-pixel-integration time further includes comparing the initial reference-signal intensity to a pre-established reference-signal intensity threshold, increasing the initial reference-pixel integration time for initial reference-signal intensities lower than the pre-established reference-signal intensity threshold, decreasing the initial reference-pixel integration time for initial reference-signal intensities greater than the pre-established reference-signal intensity threshold, and equating the initial reference-pixel integration time to the calculated-reference-pixel-integration time.

18. The method according to claim 17 , further including equating the initial reference-signal intensity to an initial reference-signal signal-to-noise ratio, equating the initial object-signal intensity to an initial object-signal signal-to-noise ratio, and equating the pre-established reference-signal intensity threshold to a pre-stablished reference-signal signal-to-noise threshold.

19. The method according to claim 15 , wherein collecting electrical charges with the at least one reference pixel over an initial reference-pixel integration time, and collecting electrical charges with the at least one object pixel over an initial object-pixel integration time are initiated simultaneously.

Assignments (3)
CHANGE OF NAME Recorded Nov 3, 2025
From: AMS SENSORS SINGAPORE PTE. LTD.
To: AMS-OSRAM ASIA PACIFIC PTE. LTD.
Reel/Frame 073476/0659 →
CHANGE OF NAME Recorded Feb 8, 2019
From: HEPTAGON MICRO OPTICS PTE. LTD.
To: AMS SENSORS SINGAPORE PTE. LTD.
Reel/Frame 049222/0062 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 14, 2018
From: VAELLO PAÑOS, MIGUEL BRUNO; STRÄSSLE, CASSIAN; HANSEN, BRYANT
To: HEPTAGON MICRO OPTICS PTE. LTD.
Reel/Frame 045793/0225 →