Substrate analysis nozzle and method for analyzing substrate
The present invention provides a substrate analysis nozzle that reliably prevents a leakage (release) of analysis solution from the nozzle even in the case of a highly hydrophilic substrate and that collects the analysis solution with a high collection ratio after scanning. The present invention is directed to a substrate analysis nozzle configured to discharge an analysis solution from a tip of the substrate analysis nozzle onto a substrate, configured to scan a surface of the substrate using the discharged analysis solution, and configured to suck the analysis solution. The substrate analysis nozzle has a triple-tube structure made up of: a pipe through which the analysis solution is discharged and sucked; a first outer tube surrounding the pipe and surrounding the analysis solution used for scanning; and a second outer tube surrounding the first outer tube. The substrate analysis nozzle includes: first exhausting means including an exhaust path defined between the pipe and the first outer tube; and second exhausting means including an exhaust path defined between the first outer tube and the second outer tube.
1. A substrate analysis nozzle configured to discharge an analysis solution from a tip of the substrate analysis nozzle onto a substrate, configured to scan a surface of the substrate using the discharged analysis solution, and configured to suck the analysis solution, wherein the substrate analysis nozzle comprises a triple-tube structure comprising a pipe through which the analysis solution is discharged and sucked; a first outer tube surrounding the pipe and surrounding the analysis solution used for scanning; and a second outer tube surrounding the first outer tube, and wherein the substrate analysis nozzle comprises: first exhausting means comprising an exhaust path defined between the pipe and the first outer tube; and second exhausting means comprising an exhaust path defined between the first outer tube and the second outer tube.
2. A method for analyzing a substrate with a substrate analysis nozzle the method comprising providing a substrate analysis nozzle according to claim 1 and discharging an analysis solution through a pipe onto a substrate; scanning a surface of the substrate using the discharged analysis solution while exhausting gas using the second exhausting means; and stopping the second exhausting means and sucking an analysis solution containing an analysis subject through the pipe while exhausting gas using the first exhausting means.