IP Library Granted Patent US 10,571,514
Granted Patent B2
US 10,571,514 · App. 15/792,170 · Granted Feb 25, 2020

Single simulation-based structure function mapping

Inventors: Byron Blackmore (Dartmouth, CA); Joseph Charles Proulx (New Boston, NH); Robin Bornoff (Herefordshire, GB); Andras Vass-Varnai (Seoul, KR)
Assignee: Mentor Graphics Corporation
G01R31/2874G01K7/42G01K7/425G06F17/5009G06F17/5031G01R31/2848G06F2217/40G06F2217/78G06F2217/80
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Quick Facts
Patent No.
US 10,571,514
App. No.
15/792,170
Granted
Feb 25, 2020
Kind
B2
Abstract

A thermal transient response simulation is performed for a structure having a plurality of thermal model elements. The thermal transient response simulation determines a relation between transient thermal impedance of the structure and time and a relation between maximum temperature change of each of the thermal model elements and time. An onset time at which energy reaches each of the thermal model elements is determined based on the relation between maximum temperature change of each of the thermal model elements and time and a predetermined maximum temperature change threshold. An influence onset resistance value for each of the thermal model elements is determined by looking up a thermal resistance value corresponding to the onset time based on the relation between transient thermal impedance of the structure and time. A structural function is mapped based on the influence onset resistance value for each of the thermal model elements.

Claims (43)

1. A method, executed by at least one processor of a computer, comprising: performing a thermal transient response simulation for a structure having a plurality of

thermal model elements, a heat flow path in the structure passing through layers of the thermal model elements, the thermal transient response simulation determining a relation between transient thermal impedance of the structure and time and a relation between maximum temperature change of each of the thermal model elements and time;

determining an onset time at which energy reaches each of the thermal model elements based on the relation between maximum temperature change of each of the thermal model elements and time and a predetermined maximum temperature change threshold; and

determining an influence onset resistance value for each of the thermal model elements by looking up a thermal resistance value corresponding to the onset time based on the relation between transient thermal impedance of the structure and time.

2. The method recited in claim 1 , further comprising:

associating portions of a structural function with the thermal model elements based on the influence onset resistance value for each of the thermal model elements, the structural function being determined by the thermal transient response simulation.

3. The method recited in claim 1 , further comprising:

calibrating a thermal model of the structure used by the thermal transient response simulation based on the influence onset resistance value for each of the thermal model elements and a structure function derived from an experimental measurement.

4. The method recited in claim 1 , wherein the thermal model elements and an order of the layers of the thermal model elements through which the heat flow passes are identified by analyzing design data of the structure.

5. The method recited in claim 1 , wherein the predetermined maximum temperature threshold is a predetermined percentage of a maximum temperature change of the structure.

6. The method recited in claim 5 , wherein the predetermined percentage of the maximum temperature change of the structure is less than 2% of the maximum temperature change of the structure.

7. The method recited in claim 1 , wherein the relation between transient thermal impedance of the structure and time is represented by a Zth(t)-curve (normalized transient thermal impedance function).

8. One or more non-transitory computer-readable media storing computer-executable instructions for causing one or more processors to perform a method, the method comprising:

performing a thermal transient response simulation for a structure having a plurality of thermal model elements, a heat flow path in the structure passing through layers of the thermal model elements, the thermal transient response simulation determining a relation between transient thermal impedance of the structure and time and a relation between maximum temperature change of each of the thermal model elements and time;

determining an onset time at which energy reaches each of the thermal model elements based on the relation between maximum temperature change of each of the thermal model elements and time and a predetermined maximum temperature change threshold; and

determining an influence onset resistance value for each of the thermal model elements by looking up a thermal resistance value corresponding to the onset time based on the relation between transient thermal impedance of the structure and time.

9. The one or more non-transitory computer-readable media recited in claim 8 , wherein the method further comprises:

associating portions of a structural function with the thermal model elements based on the influence onset resistance value for each of the thermal model elements, the structural function being determined by the thermal transient response simulation.

10. The one or more non-transitory computer-readable media recited in claim 8 , wherein the method further comprises:

calibrating a thermal model of the structure used by the thermal transient response simulation based on the influence onset resistance value for each of the thermal model elements and a structure function derived from an experimental measurement.

11. The one or more non-transitory computer-readable media recited in claim 8 , wherein the thermal model elements and an order of the layers of the thermal model elements through which the heat flow passes are identified by analyzing design data of the structure.

12. The one or more non-transitory computer readable media recited in claim 8 , wherein the predetermined maximum temperature threshold is a predetermined percentage of a maximum temperature change of the structure.

13. The one or more non-transitory computer-readable media recited in claim 12 , wherein the predetermined percentage of the maximum temperature change of the structure is less than 2% of the maximum temperature change of the structure.

14. The one or more non-transitory computer-readable media recited in claim 8 , wherein the relation between transient thermal impedance of the structure and time is represented by a Zth(t)-curve (normalized transient thermal impedance function).

15. A system, comprising:

one or more processors, the one or more processors programmed to perform a method, the method comprising:

performing a thermal transient response simulation for a structure having a plurality of thermal model elements, a heat flow path in the structure passing through layers of the thermal model elements, the thermal transient response simulation determining a relation between transient thermal impedance of the structure and time and a relation between maximum temperature change of each of the thermal model elements and time;

determining an onset time at which energy reaches each of the thermal model elements based on the relation between maximum temperature change of each of the thermal model elements and time and a predetermined maximum temperature change threshold; and

determining an influence onset resistance value for each of the thermal model elements by looking up a thermal resistance value corresponding to the onset time based on the relation between transient thermal impedance of the structure and time.

16. The system recited in claim 15 , wherein

the method further comprises:

associating portions of a structural function with the thermal model elements based on

the influence onset resistance value for each of the thermal model elements, the structural

function being determined by the thermal transient response simulation.

17. The system recited in claim 15 wherein

the method further comprises:

calibrating a thermal model of the structure used by the thermal transient response simulation based on the influence onset resistance value for each of the thermal model elements and a structure function derived from an experimental measurement.

18. The system recited in claim 15 , wherein

the relation between transient thermal impedance of the structure and time is represented by a Zth(t)-curve (normalized transient thermal impedance function).

19. The system recited in claim 15 , wherein

the predetermined maximum temperature threshold is a predetermined percentage of a maximum temperature change of the structure.

20. The system recited in claim 19 , wherein

the predetermined percentage of the maximum temperature change of the structure is less than 2% of the maximum temperature change of the structure.

Assignments (2)
MERGER AND CHANGE OF NAME Recorded Jun 29, 2021
From: MENTOR GRAPHICS CORPORATION; SIEMENS INDUSTRY SOFTWARE INC.
To: SIEMENS INDUSTRY SOFTWARE INC.
Reel/Frame 056713/0076 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 25, 2017
From: BLACKMORE, BYRON; PROULX, JOSEPH CHARLES; BORNOFF, ROBIN; VASS-VARNAI, ANDRAS
To: MENTOR GRAPHICS CORPORATION
Reel/Frame 043947/0394 →