IP Library Granted Patent US 10,320,145
Granted Patent B2
US 10,320,145 · App. 15/807,824 · Granted Jun 11, 2019

Solder sealing in high-power laser devices

Inventors: Parviz Tayebati (Sherborn, MA); Michael Deutsch (Derry, NH)
Assignee: TERADIODE, INC.
H01S5/02256H01S3/08009H01S5/0216H01S5/02272H01S5/142H01S5/4025H01S5/4062H01S5/4087H01S5/02423
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Quick Facts
Patent No.
US 10,320,145
App. No.
15/807,824
Granted
Jun 11, 2019
Kind
B2
Abstract

In various embodiments, laser apparatuses include thermal bonding layers between various components and sealing materials for preventing or retarding movement of thermal bonding material out of the thermal bonding layers.

Claims (55)

1. A method of sealing a laser apparatus, the method comprising:

disposing a thermal bonding layer over a surface of an electrode mount, the thermal bonding layer comprising a thermal bonding material;

thereafter, depositing an electrically conductive sealing material over at least a portion of the thermal bonding layer and at least a portion of an external surface of the electrode mount, wherein the thermal bonding material and the sealing material comprise different materials; and

disposing a beam emitter in direct mechanical contact with the thermal bonding layer,

wherein at least a portion of the sealing material is positioned to prevent or retard movement of the thermal bonding material out of the thermal bonding layer.

2. The method of claim 1 , further comprising:

covering a portion of the thermal bonding layer with a masking material before depositing the sealing material; and

after depositing the sealing material, removing the masking material before disposing the beam emitter in direct contact with the thermal bonding layer.

3. The method of claim 1 , wherein depositing the sealing material comprises at least one of electroplating or electroless deposition.

4. The method of claim 1 , wherein the thermal bonding material comprises indium.

5. The method of claim 1 , wherein the sealing material comprises at least one of copper, aluminum, nickel, or chromium.

6. The method of claim 1 , further comprising disposing a second electrode mount over the beam emitter opposite the electrode mount.

7. The method of claim 6 , further comprising:

disposing a second thermal bonding layer between the second electrode mount and the beam emitter, the second thermal bonding layer comprising a second thermal bonding material; and

positioning a second sealing material to prevent or retard movement of the second thermal bonding material out of the second thermal bonding layer.

8. The method of claim 1 , wherein the beam emitter comprises a diode bar configured to emit a plurality of discrete beams.

9. The method of claim 1 , wherein a melting point of the sealing material is higher than a melting point of the thermal bonding material.

10. The method of claim 1 , wherein no portion of the sealing material is disposed between the thermal bonding layer and the electrode mount.

11. The method of claim 1 , wherein a portion of the sealing material is in direct contact with an external surface of the beam emitter.

12. The method of claim 1 , wherein a portion of the sealing material is disposed on a portion of the external surface of the electrode mount that does not face toward the beam emitter.

13. The method of claim 1 , wherein, after the beam emitter is disposed in direct contact with the thermal bonding layer, the thermal bonding layer is surrounded on all sides by the sealing material, the electrode mount, and the beam emitter.

14. A method of sealing a laser apparatus, the method comprising:

disposing a thermal bonding layer over a surface of an electrode mount, the thermal bonding layer comprising a thermal bonding material;

disposing a beam emitter in direct mechanical contact with the thermal bonding layer; and

after the thermal bonding layer is disposed over the surface of the electrode mount, and after the beam emitter is disposed in direct contact with the thermal bonding layer, depositing an electrically conductive sealing material over at least a portion of the thermal bonding layer and at least a portion of an external surface of the electrode mount,

wherein (i) the thermal bonding material and the sealing material comprise different materials, and (ii) at least a portion of the sealing material is positioned to prevent or retard movement of the thermal bonding material out of the thermal bonding layer.

15. The method of claim 14 , further comprising:

covering a portion of the beam emitter with a masking material before depositing the sealing material; and

removing the masking material after depositing the sealing material.

16. The method of claim 14 , wherein depositing the sealing material comprises at least one of electroplating or electroless deposition.

17. The method of claim 14 , wherein the thermal bonding material comprises indium.

18. The method of claim 14 , wherein the sealing material comprises at least one of copper, aluminum, nickel, or chromium.

19. The method of claim 14 , further comprising disposing a second electrode mount over the beam emitter opposite the electrode mount.

20. The method of claim 19 , further comprising:

disposing a second thermal bonding layer between the second electrode mount and the beam emitter, the second thermal bonding layer comprising a second thermal bonding material; and

positioning a second sealing material to prevent or retard movement of the second thermal bonding material out of the second thermal bonding layer.

21. The method of claim 14 , wherein the beam emitter comprises a diode bar configured to emit a plurality of discrete beams.

22. The method of claim 14 , wherein a melting point of the sealing material is higher than a melting point of the thermal bonding material.

23. The method of claim 14 , wherein no portion of the sealing material is disposed between the thermal bonding layer and the electrode mount.

24. The method of claim 14 , wherein a portion of the sealing material is in direct contact with an external surface of the beam emitter.

25. The method of claim 14 , wherein a portion of the sealing material is disposed on a portion of the external surface of the electrode mount that does not face toward the beam emitter.

26. The method of claim 14 , wherein, after the sealing material is deposited over the at least a portion of the thermal bonding layer and the at least a portion of the external surface of the electrode mount, the thermal bonding layer is surrounded on all sides by the sealing material, the electrode mount, and the beam emitter.

27. A method of sealing a laser apparatus, the method comprising:

disposing a thermal bonding layer over a surface of an electrode mount, the thermal bonding layer comprising a thermal bonding material;

thereafter, depositing an electrically conductive sealing material over an entirety of the thermal bonding layer and at least a portion of an external surface of the electrode mount;

removing a portion of the sealing material to reveal an exposed portion of the thermal bonding layer; and

disposing a beam emitter in direct contact with the exposed portion of the thermal bonding layer,

wherein at least a portion of the sealing material is positioned to prevent or retard movement of the thermal bonding material out of the thermal bonding layer.

28. A method of sealing a laser apparatus, the method comprising:

disposing a thermal bonding layer over a surface of an electrode mount, the thermal bonding layer comprising a thermal bonding material;

disposing a beam emitter in direct contact with the thermal bonding layer;

after the thermal bonding layer is disposed over the surface of the electrode mount, and after the beam emitter is disposed in direct contact with the thermal bonding layer, depositing an electrically conductive sealing material over at least a portion of the thermal bonding layer and at least a portion of an external surface of the electrode mount;

depositing the sealing material over at least a portion of the beam emitter; and

removing at least a portion of the sealing material to reveal a portion of the beam emitter,

wherein at least a portion of the sealing material is positioned to prevent or retard movement of the thermal bonding material out of the thermal bonding layer.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 14, 2024
From: PANASONIC CORPORATION OF NORTH AMERICA
To: WBC PHOTONICS, INC.
Reel/Frame 069361/0616 →
MERGER Recorded Apr 13, 2023
From: TERADIODE, INC.
To: PANASONIC CORPORATION OF NORTH AMERICA
Reel/Frame 063311/0885 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 9, 2017
From: TAYEBATI, PARVIZ; DEUTSCH, MICHAEL
To: TERADIODE, INC.
Reel/Frame 044080/0408 →
Continuity (3)
Continuation 15006733 · Jan 26, 2016
Provisional Application 62108278 · Jan 27, 2015
Related Publication 20180069377A1 · Mar 8, 2018