IP Library Granted Patent US 10,780,522
Granted Patent B2
US 10,780,522 · App. 15/809,883 · Granted Sep 22, 2020

Method for automatable or automated determination of the focal position of a laser beam generated by an exposure device

Inventors: Florian Bechmann (Lichtenfels, DE); Markus Stark (Waizenburg, DE); Fabian Zeulner (Lichtenfels, DE)
Assignee: Concept Laser GmbH
B23K26/032B22F3/1055B23K26/046B23K26/34B23K26/362B29C64/00B29C64/153B29C64/393B33Y10/00B33Y50/02G02B7/36B22F2003/1057B22F2999/00Y02P10/295
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Quick Facts
Patent No.
US 10,780,522
App. No.
15/809,883
Granted
Sep 22, 2020
Kind
B2
Abstract

A method for automatable or automated determination of the focal position of a laser beam ( 2 ) including the following steps: —arranging a substrate ( 10 ) in a first exposure position (z 1 ), and exposing the substrate ( 10 ) with at least one exposure vector ( 13 ) in the first exposure position (z 1 ), —moving the substrate ( 10 ) into several other exposure positions, in which the substrate ( 10 ) is respectively arranged in another certain z-axis position (z n ) relative to the reference point ( 11 ), and respectively exposing the substrate ( 10 ) with at least one exposure vector ( 13 ) in the respective other exposure positions (z n ), —optically evaluating the exposure pattern ( 12 ) by detecting different contrast sections in the exposure pattern ( 12 ) that can be optically detected, —determining the focal position of the laser beam ( 2 ) based on the detected optical contrast sections.

Claims (33)

1. A method for automated determination of a focal position of a laser beam generated by an exposure device of an apparatus for additive manufacturing of three-dimensional objects, wherein the apparatus comprises an x-axis horizontally oriented, a y-axis horizontally oriented, and a z-axis vertically oriented, the method comprising:

exposing the substrate with at least one exposure vector while in a first exposure position on the z-axis to form a first exposure pattern;

exposing the substrate with at least one exposure vector while in a second exposure position on the z-axis to form a second exposure pattern;

optically evaluating an optical contrast between the first exposure and the second exposure; and,

determining the focal position of the laser beam based at least in part on the optical evaluation.

2. The method of claim 1 , wherein the optical contrast comprises a difference in darkness.

3. The method of claim 1 , wherein the optical contrast comprises a difference in color.

4. The method of claim 1 , further comprising:

exposing the substrate with at least one exposure vector while in a plurality of different positions on the z-axis to form a plurality of exposure patterns;

optically evaluating the optical contrast between at least some of the plurality of exposure patterns; and,

determining the focal position of the laser beam base at least in part on the optical evaluation.

5. The method of claim 1 , wherein at least one of the first exposure pattern and the second exposure pattern comprises an optically detectable geometric assignment feature assigned to a certain exposure position.

6. The method of claim 5 , where the at least one of the first exposure pattern and the second exposure pattern comprises a tooth-shaped or pinnacle-shaped exposure pattern, and wherein the optically detectable geometric assignment feature comprises a tip of the tooth-shaped or pinnacle-shaped exposure pattern.

7. The method of claim 5 , wherein the optically detectable geometric assignment feature comprises a line protecting beyond the rest of the exposure pattern.

8. The method of claim 1 , wherein a distance between the first exposure position and the second exposure position is from 0.5 mm to 1 mm.

9. The method of claim 1 , wherein a distance on the z-axis between the first exposure position and the second exposure position is at least 0.1 mm.

10. The method of claim 9 , wherein a distance on the z-axis between the first exposure position and the second exposure position is from 0.5 mm to 1 mm.

11. The method of claim 1 , wherein the exposure vector used in the first exposure position and the exposure vector used in the second exposure position are parallel.

12. The method of claim 1 , wherein the exposure vector used in the first exposure position and the exposure vector used in the second exposure position are displaced by an offset of 0.1 mm to 1 mm.

13. The method of claim 12 , wherein the offset is about 0.2 mm.

14. The of claim 1 , further comprising adjusting the exposure device based determining the focal position of the laser beam.

15. The method of claim 1 , wherein the substrate is arranged on a carrying element movably supported along the z-axis.

16. An apparatus for additive manufacturing three-dimensional objects, wherein the apparatus comprises an x-axis horizontally oriented, a y-axis horizontally oriented, and a z-axis vertically oriented, the apparatus comprising:

an exposure device configured to generate a laser beam; and,

a control device for generating one or more control commands, the control commands comprising:

exposing a substrate with at least one exposure vector while in a first exposure position on the z-axis to form a first exposure pattern;

exposing the substrate with at least one exposure vector while in a second exposure position on the z-axis to form a second exposure pattern;

optically evaluating an optical contrast between the first exposure and the second exposure; and,

determining a focal position of the laser beam based at least in part on the optical evaluation.

17. The apparatus of claim 16 , further comprising a detection and determination device for optically evaluating the optical contrast.

18. The apparatus of claim 16 , further comprising a carrying element for supporting the substrate, wherein the carrying element is moveable along the z-axis.

19. The apparatus of claim 16 , wherein the control commands further comprise moving the carrying element along the z-axis.

20. The apparatus of claim 16 , wherein the substrate is arranged on a carrying element movably supported along the z-axis.

Assignments (2)
MERGER AND CHANGE OF NAME Recorded Feb 28, 2020
From: CL SCHUTZRECHTSVERWALTUNGS GMBH; CONCEPT LASER GMBH
To: CONCEPT LASER GMBH
Reel/Frame 052048/0706 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 5, 2018
From: STARK, MARKUS; ZEULNER, FABIAN; BECHMANN, FLORIAN
To: CL SCHUTZRECHTSVERWALTUNGS GMBH
Reel/Frame 044549/0128 →
Priority Claims (1)
DE 10 2016 121 649 · Nov 11, 2016 · national
Continuity (1)
Related Publication 20180133836A1 · May 17, 2018