Non-destructive testing of integrated circuit chips
Semiconductor devices and electronics packaging methods include integrated circuit chips having redundant signal bond pads along with signal bond pads connected to the same signal port for non-destructive testing of the integrated circuit chips prior to packaging. Electrical testing is made via the redundant signal bond after which qualified integrated circuit chips can be attached to a pristine and bumped final interposer or printed circuit board to provide increased reliability to the assembled electronic package.
1. A method of packaging an integrated circuit chip, comprising:
fabricating an integrated circuit chip comprising at least one redundant signal bond pad and at least one final signal bond pad, wherein the at least one redundant signal bond pad and at least one final signal bond pad are connected to a common signal port;
providing a test interposer including a test socket in electrical communication with a bond pad including a solder bump thereon, wherein the test socket is coupled to an electrical evaluation device in electrical communication with the at least one redundant signal bond pad;
aligning the at least one redundant signal bond pad of the integrated circuit chip with the solder bump on the test interposer and subjecting the chip and test interposer to thermal compression bonding to bond the solder bump to the chip redundant bond pad;
electrically testing the integrated circuit chip with the electrical evaluation device;
removing the test interposer from the chip by heating the integrated circuit chip to a temperature effective to reflow the solder bump; and
attaching the integrated circuit chip to a final interposer, wherein the final interposer includes a solder bump disposed on a final signal bond pad thereon and the signal bond pad on the integrated circuit chip is thermally compression bonded to the solder bump.
2. The method of claim 1 , wherein the at least one redundant signal bond pad and the at least one signal bond pad on the chip are formed of a superconducting material.
3. The method of claim 1 , wherein the at least one redundant signal bond pad and the at least one signal bond pad are of different sizes.
4. The method of claim 1 , wherein the solder bump on the test interposer is electrically coupled to the test socket formed on about an end perimeter surface of the test interposer.