IP Library Granted Patent US 10,052,734
Granted Patent B2
US 10,052,734 · App. 15/826,060 · Granted Aug 21, 2018

Laser projector with flash alignment

Inventor: Kurt D. Rueb (Kitchner, CA)
B23Q17/2423B23Q17/2404B23Q17/249G01B11/002G01B11/2513G01B11/2518G01C11/02G01C11/04G02B26/0825G02B26/105G06T7/521H04N9/317H04N9/3129H04N9/3194B23Q2717/00G06T2207/10028G06T2207/10152H04N13/204
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Quick Facts
Patent No.
US 10,052,734
App. No.
15/826,060
Granted
Aug 21, 2018
Kind
B2
Abstract

A method for aligning a laser projector for projecting a laser image onto a work surface is provided. The method includes providing a laser projector assembly with a laser source for projecting a laser image onto a work surface, a secondary light source for illuminating the work surface and a photogrammetry device for generating an image of the work surface. The method also includes affixing reflective targets onto the work surface and transmitting light from the secondary light source toward the work surface and reflecting light toward the photogrammetry device. The method further includes scanning the targets with a laser beam generated by the laser source for reflecting the laser beam toward a laser sensor and calculating a location for projecting the laser image onto the work surface from the reflected laser beam.

Claims (17)

1. A method for aligning a laser projector for projecting a laser image onto a work surface, comprising the steps of:

providing a laser projector assembly with a laser source for projecting a laser image onto a work surface, a secondary light source for illuminating the work surface, a photogrammetry device for generating an image of the work surface, and a laser sensor for sensing a laser beam;

affixing reflective targets onto the work surface;

transmitting light from the secondary light source toward the work surface and reflecting light toward the photogrammetry device from the reflective targets thereby identifying a pattern of the reflective targets on the work surface in a three dimensional coordinate system; and

after identifying the pattern of the reflective targets on the work surface in the three dimensional coordinate system, scanning the targets with a laser beam generated by the laser source as directed by the identified pattern of the reflective targets for reflecting the laser beam toward the laser sensor and calculating a precise location of the targets from the reflected laser beam for directing the laser projector where to project the laser image onto the work surface.

2. The method set forth in claim 1 , wherein said step of providing a photogrammetry device is further defined by providing stereo cameras for determining the location of the targets by triangulation.

3. The method set forth in claim 1 , wherein said step of determining a location of the targets in the three dimensional coordinate system with the photogrammetry device is further defined providing a processor being interconnected with a multi megapixel sensor.

4. The method set forth in claim 2 , further including the step of the stereo cameras each providing a view angle between about sixty and eighty degree optical field of view.

5. The method set forth in claim 1 wherein said step of transmitting light from the secondary light source is further defined by transmitting intermittent light flashes from the secondary light source.

6. The method set forth in claim 1 , further including the step of the laser source and the secondary light source transmitting light at a same wavelength.

7. The method in claim 1 , further including the step of providing a light sensor for detecting the laser beam reflected from the targets toward the laser projector thereby identifying the location of the targets.

8. The method set forth in claim 1 , further including the step of the photogrammetry assembly detecting the position of the workspace and pattern of the targets attached to the work surface for directing the laser beam toward individual targets relying on a fixed position of the photogrammetry assembly relative to the laser projector assembly.

9. The method set forth in claim 1 , further including measuring drift of the work surface from a first position from light from the secondary light source reflected from the targets toward the photogrammetry assembly.

10. The method set forth in claim 1 , further including the step of reflecting light from the secondary light source from the targets to the photogrammetry assembly for determining a position of the work surface.

11. The method set forth in claim 1 , wherein said step of providing a photogrammetry assembly is further defined by providing a single camera for generating an image of the work surface.

12. The method set forth in claim 1 , wherein the step of identifying a pattern of the targets is further defined by identifying a general location of the targets on the work surface.

13. The method set forth in claim 1 , wherein the step of affixing reflective targets onto the work surface is further defined by affixing reflective targets onto the work surface at known positions relative to the work surface.

Assignments (5)
RELEASE OF SECURITY INTEREST Recorded Oct 23, 2024
From: ALLY BANK
To: VIRTEK VISION INTERNATIONAL INC.
Reel/Frame 068985/0533 →
CHANGE OF NAME Recorded Aug 22, 2024
From: VIRTEK VISION INTERNATIONAL ULC
To: VIRTEK VISION INTERNATIONAL INC.
Reel/Frame 068749/0543 →
SECURITY AGREEMENT Recorded Jun 1, 2021
From: VIRTEK VISION INTERNATIONAL INC.
To: ALLY BANK, AS COLLATERAL AGENT
Reel/Frame 056447/0532 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 18, 2019
From: RUEB, KURT D.
To: VIRTEK VISION INTERNATIONAL ULC
Reel/Frame 050767/0467 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 17, 2019
From: RUEB, KURT D.
To: VIRTEK VISION INTERNATIONAL ULC
Reel/Frame 050751/0097 →
Continuity (4)
Continuation 15784387 · Oct 16, 2017
Continuation 15784720 · Oct 16, 2017
Provisional Application 62408944 · Oct 17, 2016
Related Publication 20180104789A1 · Apr 19, 2018