IP Library Granted Patent US 10,801,828
Granted Patent B2
US 10,801,828 · App. 15/848,139 · Granted Oct 13, 2020

Magnetic angle sensing system and method for detecting a rotation angle of a magnetic field source

Inventor: Udo Ausserlechner (Villach, AT)
Assignee: Infineon Technologies AG
G01B7/30G01B7/003G01D5/142G01D5/145G01D5/24438
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Quick Facts
Patent No.
US 10,801,828
App. No.
15/848,139
Granted
Oct 13, 2020
Kind
B2
Abstract

A magnetic angle sensing system for detecting a rotation angle of a magnetic field source arranged rotatably around a rotation axis, the magnetic angle sensing system including at least two magnetic field sensing elements that are located in/on a plane, are not arranged on a single straight line through the rotation axis, and are configured to provide output signals that are functions of the same magnetic field component which is in parallel to the rotation axis. The system also including a processor that is arranged to determine the rotation angle from an angle between a pointer and a reference direction, wherein the pointer is determined based on the output signals of the at least two magnetic field sensing elements.

Claims (22)

1. A magnetic angle sensing system for detecting a rotation angle of a magnetic field source arranged rotatably around a rotation axis, comprising:

first, second, and third magnetic field sensing elements arranged in a plane and configured to provide output signals that are functions of a same magnetic field component which is in parallel to the rotation axis,

wherein the first and second magnetic field sensing elements lie in a first straight line and are used to determine a point on the first straight line where the magnetic field component vanishes, and the third magnetic field sensing element is arranged where the rotation axis intersects the plane and lies with the point in a second straight line; and

a processor configured to determine the rotation angle from an angle between the second straight line and a reference direction line.

2. The magnetic angle sensing system according to claim 1 , wherein the plane is substantially perpendicular to the rotation axis.

3. The magnetic angle sensing system according to claim 1 , wherein the plane is a plane of a semiconductor chip.

4. The magnetic angle sensing system according to claim 1 , wherein the plane is a plane of a silicon die.

5. The magnetic angle sensing system according to claim 1 , wherein the magnetic field sensing elements comprise Hall-plates.

6. The magnetic angle sensing system according to claim 1 , wherein the magnetic field sensing elements comprise MAGFETs.

7. The magnetic angle sensing system according to claim 1 , wherein the plane is an x-y plane, the first straight line is parallel to a y-axis of the x-y plane, and the reference direction line corresponds with the x-axis.

8. The magnetic angle sensing system according to claim 1 , wherein the first, second, and third magnetic field sensing elements are arranged to cancel out homogeneous background magnetic fields.

9. A method for detecting a rotation angle of a magnetic field source arranged rotatably around a rotation axis, comprising:

determining, using first and second magnetic field sensing elements that lie in a first straight line, a point on the first straight line where a magnetic field component vanishes,

wherein the first and second magnetic field sensing elements and a third magnetic field sensing element are arranged in a plane and are configured to provide output signals that are functions of the magnetic field component which is in parallel to the rotation axis, and the third magnetic field sensing element is arranged where the rotation axis intersects the plane and lies with the point in a second straight line; and

determining, by a processor, the rotation angle from an angle between the second straight line and a reference direction line.

10. The method according to claim 9 , wherein the plane is substantially perpendicular to the rotation axis.

11. The method according to claim 9 , wherein the plane is a plane of a semiconductor chip.

12. The method according to claim 9 , wherein the plane is a plane of a silicon die.

13. The method according to claim 9 , wherein the magnetic field sensing elements comprise Hall plates.

14. The method according to claim 9 , wherein the magnetic field sensing elements comprise MAGFETs.

15. The method according to claim 9 , wherein the plane is an x-y plane, the first straight line is parallel to a y-axis of the x-y plane, and the reference direction line corresponds with the x-axis.

16. The method according to claim 9 , wherein the first, second, and third magnetic field sensing elements are arranged to cancel out homogeneous background magnetic fields.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 20, 2017
From: AUSSERLECHNER, UDO
To: INFINEON TECHNOLOGIES AG
Reel/Frame 044445/0931 →
Priority Claims (1)
DE 10 2016 124 952 · Dec 20, 2016 · national
Continuity (1)
Related Publication 20180172423A1 · Jun 21, 2018