IP Library › Granted Patent US 11,156,576
Granted Patent B2
US 11,156,576 · App. 15/854,901 · Granted Oct 26, 2021

Gas sensor and method of using the same

Inventors: Naoki Harada (Atsugi, JP); Shintaro Sato (Atsugi, JP); Kenjiro Hayashi (Hadano, JP); Junichi Yamaguchi (Atsugi, JP)
Assignee: FUJITSU LIMITED
G01N27/127G01N27/4146G01N33/0054G01N27/4141Y02A50/20
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Quick Facts
Patent No.
US 11,156,576
App. No.
15/854,901
Granted
Oct 26, 2021
Kind
B2
Abstract

A gas sensor includes: a semiconductor layer; a graphene film provided above the semiconductor layer and having at least a portion in contact with gas; and a barrier film between the semiconductor layer and the graphene film.

Claims (26)

1. A gas sensor comprising:

a semiconductor layer;

a graphene film provided above the semiconductor layer having at least a portion in contact with gas;

a barrier film between the semiconductor layer and the graphene film;

a pair of impurity conductive regions formed on both sides of the barrier film on the surface of the semiconductor layer by implantating ion into the semiconductor layer; and

an interlayer insulating film covering the barrier film, wherein:

the graphene film is provided on the interlayer insulating film; and

the graphene film is in electrical contact with the barrier film through a conductive layer in the interlayer insulating film.

2. The gas sensor according to claim 1 , wherein the graphene film is in contact with the barrier film.

3. The gas sensor according to claim 1 , further comprising nanoparticles on the graphene film.

4. The gas sensor according to claim 1 , wherein a material of the semiconductor layer is a group IV semiconductor, a group III-V semiconductor, a group II-VI semiconductor, an oxide semiconductor, an organic semiconductor, a metal chalcogenide-based semiconductor, a laminar substance semiconductor, a semiconducting carbon nanotube, or a graphene nanoribbon.

5. The gas sensor according to claim 1 , wherein a material of the barrier film is a silicon oxide, a silicon nitride, a silicon oxynitride, a germanium oxide, a high dielectric constant insulator, or a laminar insulator.

6. The gas sensor according to claim 1 , wherein:

a material of the semiconductor layer is a first compound semiconductor;

a material of the barrier film is a second compound semiconductor; and

a band gap of the second compound semiconductor is wider than a band gap of the first compound semiconductor.

7. A method of using a gas sensor, comprising:

detecting a physical amount corresponding to a variation amount in work function of a graphene film using a gas sensor,

the gas sensor comprising:

a semiconductor layer;

a graphene film provided above the semiconductor layer having at least a portion in contact with gas;

a barrier film between the semiconductor layer and the graphene film;

a pair of impurity conductive regions formed on both sides of the barrier film on the surface of the semiconductor layer by implantating ion into the semiconductor layer; and

an interlayer insulating film covering the barrier film, wherein:

the graphene film is provided on the interlayer insulating film; and

the graphene film is in electrical contact with the barrier film through a conductive layer in the interlayer insulating film.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 23, 2018
From: HARADA, NAOKI; SATO, SHINTARO; HAYASHI, KENJIRO; YAMAGUCHI, JUNICHI
To: FUJITSU LIMITED
Reel/Frame 044700/0796 →
Priority Claims (1)
JP JP2015-131229 · Jun 30, 2015 · national
Continuity (2)
Continuation PCTJP2016069267 · Jun 29, 2016
Related Publication 20180136157A1 · May 17, 2018
Cited By (2)
US 12,369,815 US 12,604,506