IP Library › Granted Patent US 10,028,719
Granted Patent B1
US 10,028,719 · App. 15/856,160 · Granted Jul 24, 2018

Adjusting an X-ray parameter of an X-ray unit

Inventors: Philipp Bernhardt (Forchheim, DE); Rudolf Leiblein (Weisendorf, DE)
Assignee: SIEMENS HEALTHCARE GMBH
A61B6/545A61B6/5205G01N23/20008G01N2223/306
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Quick Facts
Patent No.
US 10,028,719
App. No.
15/856,160
Granted
Jul 24, 2018
Kind
B1
Abstract

An X-ray projection of a region of examination and an associated X-ray parameter are received via an interface, the X-ray projection including X-ray intensities in a first pixel set. The X-ray parameter relates to at least one X-ray voltage from an X-ray source. Scattered radiation intensity is determined in a second pixel set, the second pixel set being a subset of the first pixel set. A first calculation of first exposure parameters in the second pixel set then occurs, each of the first exposure parameters in a pixel of the second pixel set being based on the X-ray intensity in the pixel and the scattered radiation intensity in the pixel. Furthermore, a second calculation of a scalar second exposure parameter occurs based on the first exposure parameters and an adjustment of the X-ray parameter is performed by comparing the scalar second exposure parameter with a reference value.

Claims (40)

1. A method for adjusting an X-ray parameter of an X-ray unit, the X-ray unit including an X-ray source and an X-ray detector, the method comprising:

receiving, via an interface, an X-ray projection of a region of interest and an associated X-ray parameter, the X-ray projection including X-ray intensities in a first pixel set and the X-ray parameter relating to at least one X-ray voltage from the X-ray source;

determining scattered radiation intensities in a second pixel set via a computing unit, the second pixel set being a subset of the first pixel set;

calculating, via the computing unit, first exposure parameters in the second pixel set, each of the first exposure parameters in a pixel of the second pixel set being respectively based on the X-ray intensity in the respective pixel and the scattered radiation intensity in the respective pixel;

calculating, via the computing unit, a scalar second exposure parameter based on the first exposure parameters; and

adjusting the X-ray parameter by comparing, via the computing unit, the scalar second exposure parameter with a reference value.

2. The method of claim 1 , wherein each of the first exposure parameters corresponds to a primary radiation intensity and wherein the respective primary radiation intensity in a respective pixel of the second pixel set is a difference between the X-ray intensity in the respective pixel and the scattered radiation intensity in the respective pixel.

3. The method of claim 1 , wherein each of the first exposure parameters in a respective pixel of the second pixel set corresponds to a ratio of the primary radiation intensity in the respective pixel to the scattered radiation intensity in the respective pixel.

4. The method of claim 1 , wherein the determining of the scalar second exposure parameter includes averaging the first exposure parameters of a third pixel set, the second pixel set including the third pixel set.

5. The method of claim 1 , wherein the scalar second exposure parameter is a quantile of a distribution of the first exposure parameters in a third pixel set, the second pixel set including the third pixel set.

6. The method of claim 1 , further comprising:

receiving an anatomical parameter of the region of interest,

wherein the determining of the scattered radiation intensities includes retrieving a reference dataset from a reference database, the reference dataset being selected using a comparison with the anatomical parameter and the X-ray parameter.

7. The method of claim 1 , further comprising:

receiving an anatomical parameter of the region of interest, wherein the determining of the scattered radiation intensity takes place by way of a Monte-Carlo simulation using the anatomical parameter and the X-ray parameter.

8. The method of claim 6 , wherein the anatomical parameter includes an extension of the region of interest with respect to a direction of projection of the X-ray projection.

9. The method of claim 6 , wherein the anatomical parameter includes a three-dimensional model of the region of interest and wherein the three-dimensional model is determined by way of the X-ray image dataset.

10. The method of claim 1 , wherein the determining takes place by measuring the scattered radiation intensities.

11. The method of claim 10 , wherein the measuring of the scattered radiation intensities takes place by introducing an X-ray-absorbing object in a beam path between the X-ray source and the region of interest,

wherein the X-ray-absorbing object absorbs at least 90% of the incident X-rays, and

wherein the scattered radiation intensities correspond to the X-ray intensities in the shadow pixels of the image of the X-ray-absorbing object in the X-ray projection.

12. A parameter-adjusting unit for adjusting an X-ray parameter of an X-ray unit, the X-ray unit including an X-ray source and an X-ray detector, parameter-adjusting unit comprising:

an interface, configured to receive an X-ray projection of a region of interest and an associated X-ray parameter, the X-ray projection including X-ray intensities in a first pixel set and the X-ray parameter relating to at least one X-ray voltage from the X-ray source; and

a computing unit, configured to

determine scattered radiation intensities in a second pixel set, the second pixel set being a subset of the first pixel set,

calculate first exposure parameters in the second pixel set, each of the respective first exposure parameters in a respective pixel of the second pixel set being based on the X-ray intensity in the respective pixel and the scattered radiation intensity in the respective pixel,

calculate a scalar second exposure parameter based on the first exposure parameters, and

adjust the X-ray parameter by comparing the scalar second exposure parameter with a reference value.

13. The parameter-adjusting unit of claim 12 , wherein each of the first exposure parameters corresponds to a primary radiation intensity and wherein the respective primary radiation intensity in a respective pixel of the second pixel set is a difference between the X-ray intensity in the respective pixel and the scattered radiation intensity in the respective pixel.

14. An X-ray unit configured to record X-ray projections of a region of interest, comprising the parameter-adjusting unit of claim 12 .

15. A non-transitory computer program product including a computer program, directly loadable into a memory unit of a parameter-adjusting unit, the computer program including program sections to carry out the method of claim 1 when the program sections are executed by the parameter-adjusting unit.

16. A non-transitory computer-readable storage medium including program sections, readable and executable by a parameter-adjusting unit, stored to carry out the method of claim 1 when the program sections are executed by the parameter-adjusting unit.

17. The method of claim 2 , wherein the determining of the scalar second exposure parameter includes averaging the first exposure parameters of a third pixel set, the second pixel set including the third pixel set.

18. The method of claim 3 , wherein the determining of the scalar second exposure parameter includes averaging the first exposure parameters of a third pixel set, the second pixel set including the third pixel set.

19. The method of claim 2 , wherein the scalar second exposure parameter is a quantile of a distribution of the first exposure parameters in a third pixel set, the second pixel set including the third pixel set.

20. The method of claim 3 , wherein the scalar second exposure parameter is a quantile of a distribution of the first exposure parameters in a third pixel set, the second pixel set including the third pixel set.

21. The method of claim 7 , wherein the anatomical parameter includes an extension of the region of interest with respect to a direction of projection of the X-ray projection.

22. The method of claim 7 , wherein the anatomical parameter includes a three-dimensional model of the region of interest and wherein the three-dimensional model is determined by way of the X-ray image dataset.

23. An X-ray unit configured to record X-ray projections of a region of interest, comprising the parameter-adjusting unit of claim 13 .

24. A non-transitory computer-readable storage medium including program sections, readable and executable by a parameter-adjusting unit, stored to carry out the method of claim 2 when the program sections are executed by the parameter-adjusting unit.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 21, 2018
From: BERNHARDT, PHILIPP; LEIBLEIN, RUDOLF
To: SIEMENS HEALTHCARE GMBH
Reel/Frame 044984/0658 →
Priority Claims (1)
DE 10 2017 200 677 · Jan 17, 2017 · national