Circuit and method for generating reference signals for hybrid analog-to-digital convertors
An embodiment circuit includes a first reference source configured to provide a first reference signal to an analog-to-digital convertor (ADC). The circuit also includes a filter coupled to an output of the first reference source and configured to filter the first reference signal to produce a filtered first reference signal. The circuit further includes a second reference source coupled to an output of the filter. The second reference source is configured to provide a second reference signal to the ADC, and the second reference signal is generated based on the filtered first reference signal.
1. A circuit configured to generate a plurality of reference signals for an analog-to-digital convertor (ADC) comprising a first stage and a second stage, the first stage and the second stage having differing ADC architectures, the circuit comprising:
a first reference source comprising a first output terminal and a second output terminal coupled to respective terminals of the first stage of the ADC, the first reference source being configured to generate a first reference voltage between the first output terminal and the second output terminal of the first reference source, the first reference voltage being configured to be provided as a first reference signal to the first stage of the ADC, the first reference voltage comprising a first transient signal generated by the first stage of the ADC;
a filter coupled to the first output terminal and the second output terminal of the first reference source and configured to filter the first transient signal from the first reference signal to produce a filtered first reference signal;
a second reference source coupled to the filter, the second reference source comprising a first output terminal and a second output terminal coupled to respective terminals of the second stage of the ADC, the second reference source configured to generate a second reference signal between the first output terminal and the second output terminal of the second reference source based on the filtered first reference signal, the second reference signal being configured to be provided as a second reference signal to the second stage of the ADC; and
a capacitive element coupled to at least one of the first output terminal or the second output terminal of the second reference source, the capacitive element being configured to shunt a second transient signal generated by the second stage of the ADC.
2. The circuit of claim 1 , wherein the first transient signal is generated in response to capacitor switching in the first stage of the ADC.
3. The circuit of claim 1 , wherein the second transient signal is generated in response to capacitor switching in the second stage of the ADC.
4. The circuit of claim 1 , wherein the first stage of the ADC is configured to receive an analog signal, wherein the first stage of the ADC is configured to determine M most significant bits of an N-bit digital representation of the analog signal, and wherein the second stage of the ADC is configured to determine (N-M) least significant bits of the N-bit digital representation of the analog signal.
5. The circuit of claim 4 , wherein the first stage of the ADC is configured to determine the M most significant bits of the N-bit digital representation of the analog signal based on the first reference signal.
6. The circuit of claim 4 , wherein the second stage of the ADC is configured to determine the (N-M) least significant bits of the N-bit digital representation of the analog signal based on the second reference signal.
7. The circuit of claim 1 , wherein the second reference source comprises a first voltage follower comprising an input terminal coupled to a first output terminal of the filter, the first voltage follower comprising an output terminal that is the first output terminal of the second reference source, and wherein the second reference source comprises a second voltage follower comprising an input terminal coupled to a second output terminal of the filter, the second voltage follower comprising an output terminal that is the second output terminal of the second reference source.
8. The circuit of claim 1 , wherein a capacitance of the capacitive element is based on a total digital-to-analog capacitance of the second stage of the ADC.
9. The circuit of claim 1 , wherein the capacitive element is coupled between the first output terminal and the second output terminal of the second reference source.
10. The circuit of claim 1 , wherein the capacitive element is coupled between the first output terminal of the second reference source and a supply voltage.
11. The circuit of claim 1 , wherein the capacitive element is configured to mitigate an effect of the second transient signal on the first reference signal.
12. A circuit configured to generate a plurality of reference signals for an analog-to-digital convertor (ADC) comprising a first stage and a second stage, the first stage and the second stage having differing ADC architectures, the circuit comprising:
a low pass filter comprising an input terminal and an output terminal;
a first reference source having an output coupled to the input terminal of the low pass filter and to the first stage of the ADC, the first reference source being configured to provide a first reference signal to the first stage of the ADC, the low pass filter being configured to filter a first transient signal generated by the first stage of the ADC;
a second reference source having an input coupled to the output terminal of the low pass filter, and an output coupled to the second stage of the ADC, the second reference source being configured to provide a second reference signal to the second stage of the ADC, the low pass filter being configured to generate the second reference signal based on the first reference signal; and
a capacitive element coupled to the output of the second reference source, the capacitive element being configured to shunt a second transient signal generated by the second stage of the ADC to mitigate an effect of the second transient signal on the first reference signal.
13. The circuit of claim 12 , wherein the first stage of the ADC is configured to receive an analog signal, wherein the first stage of the ADC is configured to determine M most significant bits of an N-bit digital representation of the analog signal, and wherein the second stage of the ADC is configured to determine (N-M) least significant bits of the N-bit digital representation of the analog signal.
14. The circuit of claim 13 , wherein a capacitance of the capacitive element is 2 N-M times greater than a total digital-to-analog capacitance of the second stage of the ADC.
15. The circuit of claim 12 , wherein a frequency of the first transient signal is proportional to a frequency of capacitor-switching in the first stage of the ADC, and wherein a cutoff frequency of the low pass filter is between about 5 times to about 10 times less than a frequency of the first transient signal.
16. The circuit of claim 12 , wherein the first stage of the ADC comprises a pipeline ADC.
17. The circuit of claim 12 , wherein the second stage of the ADC comprises at least one of a successive-approximation register (SAR) ADC, an asynchronous SAR ADC, a time-interleaved SAR ADC, or a time-interleaved asynchronous SAR ADC.
18. The circuit of claim 12 , wherein the first transient signal and the second transient signal are generated in response to capacitive switching in the first stage and the second stage of the ADC, respectively.
19. The circuit of claim 12 , wherein at least one of the first reference source or the second reference source comprises a first pair of single-ended voltage followers connected in parallel.
20. The circuit of claim 12 , wherein at least one of the first reference source or the second reference source comprises a fully differential amplifier.