IP Library Granted Patent US 10,531,574
Granted Patent B2
US 10,531,574 · App. 15/858,791 · Granted Jan 7, 2020

Contact structures with porous networks for solder connections, and methods of fabricating same

Inventors: Liang Wang (Milpitas, CA); Rajesh Katkar (San Jose, CA); Hong Shen (Palo Alto, CA); Cyprian Emeka Uzoh (San Jose, CA)
Assignee: Invensas Corporation
H05K3/4007H01L24/81H05K1/111H05K3/3431H01L2224/81193H01L2924/3841
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,531,574
App. No.
15/858,791
Granted
Jan 7, 2020
Kind
B2
Abstract

A contact pad includes a solder-wettable porous network ( 310 ) which wicks the molten solder ( 130 ) and thus restricts the lateral spread of the solder, thus preventing solder bridging between adjacent contact pads.

Claims (24)

1. An assembly comprising:

a first component comprising a substrate and circuitry supported by the substrate, the circuitry comprising one or more contact pads; and

a second component underlying the first component and comprising a substrate and circuitry supported by the substrate, the circuitry of the second component comprising one or more contact pads each of which is attached to an overlying contact pad of the first component by a connection comprising:

an open-pore porous network which, in top view, has a lateral boundary and fills an area inside the lateral boundary, the open-pore porous network having a porosity of at least 70%; and

solder in pores of the open-pore porous network;

wherein in the open-pore porous network, any solid material between any adjacent pores is electrically conductive.

2. The assembly of claim 1 wherein each said connection comprises a segment within which an entire exterior surface of the connection is in physical contact with first dielectric.

3. The assembly of claim 1 , wherein in at least one connection, the solder extends from a non-porous layer in the first component to a non-porous layer in the second component.

4. The assembly of claim 3 wherein the non-porous layers of the first and second components are metal layers.

5. The assembly of claim 1 wherein any solid material between any adjacent pores is metal.

6. The assembly of claim 1 wherein in at least one connection, the open-pore porous network extends from a non-porous layer in the first component to a non-porous layer in the second component.

7. The assembly of claim 6 wherein the non-porous layers of the first and second components are metal layers.

8. The assembly of claim 1 , wherein the solder does not reach at least one of the contact pads.

9. The assembly of claim 1 , wherein the open-pore porous network is nanoporous or mesoporous.

10. An assembly comprising:

a first component comprising circuitry comprising one or more first contact pads; and

a second component underlying the first component and comprising circuitry comprising one or more second contact pads each of which is attached to an overlying first contact pad by solder;

wherein each second contact pad comprises a porous protrusion comprising an open-pore porous network which, in top view, has a lateral boundary and has pores inside the lateral boundary that contain at least some of the solder, the porous protrusion being electrically conductive and having, in addition to pores, only electrically conductive material, the porous protrusion having a porosity of at least 70%.

11. The assembly of claim 10 wherein in at least one connection, the solder extends from a non-porous layer in the first component to a non-porous layer in the second component.

12. The assembly of claim 11 wherein the non-porous layers of the first and second components are metal layers.

13. The assembly of claim 10 wherein in at least one connection, the open-pore porous network extends from a non-porous layer in the first component to a non-porous layer in the second component.

14. The assembly of claim 13 wherein the non-porous layers of the first and second components are metal layers.

15. The assembly of claim 10 wherein any solid material between any adjacent pores is metal.

16. The assembly of claim 10 , wherein the open-pore porous network is a nanoporous or mesoporous.

Assignments (4)
CHANGE OF NAME Recorded Nov 24, 2025
From: INVENSAS CORPORATION
To: INVENSAS LLC
Reel/Frame 073508/0668 →
CHANGE OF NAME Recorded Nov 24, 2025
From: INVENSAS LLC
To: ADEIA SEMICONDUCTOR TECHNOLOGIES LLC
Reel/Frame 073508/0751 →
SECURITY INTEREST Recorded Jun 1, 2020
From: ROVI SOLUTIONS CORPORATION; ROVI TECHNOLOGIES CORPORATION; ROVI GUIDES, INC.; TIVO SOLUTIONS INC.; VEVEO, INC.; INVENSAS CORPORATION; INVENSAS BONDING TECHNOLOGIES, INC.; TESSERA, INC.; TESSERA ADVANCED TECHNOLOGIES, INC.; DTS, INC.; PHORUS, INC.; IBIQUITY DIGITAL CORPORATION
To: BANK OF AMERICA, N.A.
Reel/Frame 053468/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 29, 2017
From: WANG, LIANG; KATKAR, RAJESH; SHEN, HONG; UZOH, CYPRIAN EMEKA
To: INVENSAS CORPORATION
Reel/Frame 044508/0371 →
Continuity (3)
Division 14942781 · Nov 16, 2015
Provisional Application 62098925 · Dec 31, 2014
Related Publication 20180124927A1 · May 3, 2018