IP Library Granted Patent US 10,366,760
Granted Patent B1
US 10,366,760 · App. 15/871,133 · Granted Jul 30, 2019

NAND flash memory with worldline voltage compensation using compensated temperature coefficients

Inventor: Minyi Chen (San Jose, CA)
Assignees: GigaDevice Semiconductor (Shanghai) Inc.; GigaDevice Semiconductor (Beijing) Inc.; GigaDevice Semiconductor (Hefei) Inc.
G11C16/08G11C16/0483
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Quick Facts
Patent No.
US 10,366,760
App. No.
15/871,133
Granted
Jul 30, 2019
Kind
B1
Abstract

The present application provides a NAND flash memory with wordline voltage compensate, including wordlines. Each wordline corresponds to a wordline voltage with a compensated temperature coefficient. The wordlines are divided into a plurality of groups, each group corresponds to a compensated temperature coefficient. Each wordline corresponds to a wordline address, and the groups of wordlines are divided by at least a border according to wordline addresses, or divided by zones having fixed number of wordlines.

Claims (8)

1. A NAND flash memory with wordline voltage compensate, comprising:

a plurality of wordlines, wherein each of the plurality of wordlines corresponds to a wordline voltage with a compensated temperature coefficient, wherein the plurality of wordlines are divided into a plurality of groups, each group corresponds to the compensated temperature coefficient, wherein the each wordline corresponds to a wordline address, and the groups of wordlines are divided by at least a border according to wordline addresses;

wherein the NAND flash memory further comprises a power-on read block storing a border enable parameter for enabling or disabling the compensated temperature coefficient.

2. The NAND flash memory with wordline voltage compensate according to claim 1 , wherein the plurality of wordlines are divided into three groups by two borders, each of the three groups corresponds to the compensated temperature coefficient.

3. A NAND flash memory with wordline voltage compensate, comprising:

a plurality of wordlines, wherein each of the plurality of wordlines corresponds to a wordline voltage with a compensated temperature coefficient, wherein the plurality of wordlines are divided into a plurality of groups, each group corresponds to the compensated temperature coefficient, wherein the groups of wordlines are divided by zones, each zone includes at least one wordline;

wherein the NAND flash memory further comprises a power-on read block storing a zone enable parameter for enabling or disabling the compensated temperature coefficient.

4. The NAND flash memory with wordline voltage compensate according to claim 3 , wherein said each zone includes 16 wordlines, and four zones are applied.

Assignments (3)
CHANGE OF NAME & ADDRESS Recorded Oct 13, 2022
From: GIGADEVICE SEMICONDUCTOR (BEIJING) INC.
To: GIGADEVICE SEMICONDUCTOR INC.
Reel/Frame 061668/0819 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 28, 2019
From: SHINE BRIGHT TECHNOLOGY LIMITED
To: GIGADEVICE SEMICONDUCTOR (SHANGHAI) INC.; GIGADEVICE SEMICONDUCTOR (BEIJING) INC.; GIGADEVICE SEMICONDUCTOR (HEFEI) INC.
Reel/Frame 049388/0882 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 16, 2018
From: CHEN, MINYI
To: SHINE BRIGHT TECHNOLOGY LIMITED
Reel/Frame 045072/0796 →