High power laser diode test system and method of manufacture
View Patent ↗A method of characterizing the performance of laser diode is disclosed wherein at least one laser diode device configured to emit optical radiation is detachably coupled to at least one carrier device, the carrier device configured to be positioned within at least one device test module, at least one unitary clamping force is controllably applied to the laser diode device thereby coupling the carrier device to the device test module, and at least one optical characteristic of the laser diode device is measured during use.
1. A method of characterizing the performance of at least one laser diode device, comprising:
providing at least one power supply positioned within at least one device test module compartment formed within at least one housing body;
positioning at least one of at least one thermal control system, at least one system controller, and at least one device test module within the at least one device test module compartment;
coupling at least one of the at least one thermal control system, the at least one system controller, and the at least one device test module to the at least one power supply via at least one interconnect system positioned within the at least one housing body;
detachably coupling at least one laser diode device to at least one carrier device, the at least one laser diode device configured to emit optical radiation;
detachably coupling the at least one carrier device having the at least one laser diode device detachably coupled thereto to the at least one device test module;
controllably applying at least one uniform clamping force to the at least one laser diode device positioned on the at least one carrier device thereby selectively coupling the at least one laser diode device to at least one of the at least one power supply, the at least one system controller, and the at least one thermal control system via the at least one interconnect system; and
measuring at least one optical characteristic of the optical radiation emitted by the at least one laser diode device.
2. The method of claim 1 further comprising measuring an output power of the at least one laser diode device using at least one sensor positioned within the at least one device test module.
3. The method of claim 1 further comprising measuring the wavelength of at least one optical signal emitted by the at least one laser diode device using at least one sensor positioned within the at least one device test module.
4. The method of claim 1 further comprising:
positioning at least one clamp alignment body within the at least one device test module;
selectively inflating at least one inflatable compliant body positioned proximate to the at least one clamp alignment body with at least one inflation system;
biasing at least one clamp piston traversing through the at least one alignment body with the at least one inflatable compliant body when inflating the at least one inflatable compliant body;
applying at least one uniform clamping force to the at least one laser diode device positioned on the at least one carrier device thereto.
5. The method of claim 4 further comprising selectively coupling the at least one carrier device to the at least one device test module via the at least one uniform clamping force applied by the at least one inflatable compliant body and the at least one clamp piston.
6. The method of claim 4 further comprising selectively terminating the at least one uniform clamping force by deflating the at least one inflatable compliant body thereby selectively de-coupling the at least one carrier device from the at least one device test module.
7. A method of characterizing the performance of at least one laser diode device, comprising:
detachably coupling the at least one laser diode device to at least one carrier device, the at least one laser diode device configured to emit optical radiation;
detachably coupling the at least one carrier device having the at least one laser diode device detachably coupled thereto to at least one device test module;
controllably applying at least one uniform clamping force to the at least one laser diode device positioned on the at least one carrier device;
coupling the at least one laser diode device to at least one power supply; and
measuring at least one optical characteristic of the optical radiation emitted by the at least one laser diode device using at least one sensor coupled to the at least one device test module.
8. The method of claim 1 further comprising measuring an output power of the at least one laser diode device using at least one sensor positioned within the at least one device test module.
9. The method of claim 7 further comprising measuring the wavelength of at least one optical signal emitted by the at least one laser diode device using at least one sensor positioned within the at least one device test module.
10. The method of claim 7 further comprising:
positioning at least one clamp alignment body within the at least one device test module;
selectively inflating at least one inflatable compliant body positioned proximate to the at least one clamp alignment body with at least one inflation system;
biasing at least one clamp piston traversing through the at least one alignment body with the at least one inflatable compliant body when inflating the at least one inflatable compliant body;
applying at least one uniform clamping force to the at least one laser diode device positioned on the at least one carrier device thereto.
11. The method of claim 7 further comprising selectively coupling the at least one carrier device to the at least one device test module via the at least one uniform clamping force applied by the at least one inflatable compliant body and the at least one clamp piston.
12. The method of claim 7 further comprising selectively terminating the at least one uniform clamping force by deflating the at least one inflatable compliant body thereby selectively de-coupling the at least one carrier device from the at least one device test module.