IP Library Granted Patent US 11,125,731
Granted Patent B2
US 11,125,731 · App. 15/882,473 · Granted Sep 21, 2021

Detection of a suspect counterfeit part by chromatography

Inventor: Mark Northrup (Rochester, NY)
Assignee: IEC Electronics Corp.
G01N30/56B01D15/36G01N30/06G01N30/8675G01N30/8686G01N30/88G01R31/2896H01L23/57H01L24/01G01N30/96G01N2030/042G01N2030/062G01N2030/8859G01N2030/8886H01L2924/14
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Quick Facts
Patent No.
US 11,125,731
App. No.
15/882,473
Granted
Sep 21, 2021
Kind
B2
Abstract

Parts are exposed to liquid chromatography to generate a corresponding chromatogram, wherein the chromatogram is compared to a chromatogram of a genuine part to determine if the tested part is suspect counterfeit. Depending on the selected predetermined target analytes, the generated chromatogram can be used to assess an associated manufacturing process as conforming or non-conforming.

Claims (32)

1. A method of assessing a suspect part, the method comprising:

(a) adjusting a volume of a solvent to correspond to a volume of a suspect part such that the volume of the suspect part is at least 20% of the volume of the solvent;

(b) forming a mixture by nondestructively exposing a portion of the suspect part to the solvent by contacting a sealing interface with a surface of the suspect part to form a reservoir volume partly defined by the portion of the suspect part and disposing a fixed volume of solvent in the reservoir volume to contact the portion of the suspect part partly defining the reservoir volume, the solvent configured to dissolve at least one predetermined target analyte in a predetermined residence time;

(c) generating a first chromatogram, by ion chromatography, corresponding to the formed mixture; and

(d) comparing the first chromatogram to a preexisting chromatogram to output an indicator, wherein the preexisting chromatogram is based on the at least one predetermined target analyte dissolved by the solvent, and wherein the preexisting chromatogram corresponds to a known genuine part and a conforming manufacturing process, the indicator corresponding to a level of the predetermined target analyte in the first chromatogram relative to a predetermined threshold of the predetermined target analyte in the preexisting chromatogram, wherein the indicator identifies whether the level of the predetermined target analyte in the first chromatogram is (i) below the predetermined threshold outside a set range, (ii) within the set range above or below the predetermined threshold, or (iii) above the predetermined threshold outside of the set range.

2. The method of claim 1 , further comprising one of rejecting or accepting the suspect part based on the indicator.

3. The method of claim 1 , wherein the at least one predetermined target analyte includes at least one target anion and one target cation.

4. The method of claim 1 , wherein the at least one predetermined target analyte includes at least three target anions and three target cations.

5. The method of claim 1 , further comprising adjusting a volume of the solvent corresponding to a volume of the suspect part.

6. The method of claim 1 , further comprising determining a status of the suspect part as at least one of a genuine part and a counterfeit part based on the compared first chromatogram and the preexisting chromatogram.

7. The method of claim 1 , wherein the solvent is an aqueous solution.

8. The method of claim 1 , wherein the solvent is nondestructive to the suspect part.

9. The method of claim 1 , wherein the sealing interface exposes only the portion of the part to the solvent.

10. A method for a manufacturing process, the method comprising:

(a) adjusting a volume of a first solvent to correspond to a volume of a part such that the volume of the part is at least 20% of the volume of the solvent;

(b) adjusting a volume of a different second solvent to correspond to the volume of the part such that the volume of the part is at least 20% of the volume of the different second solvent;

(c) connecting a part and a board to form an assembly;

(d) contacting the first solvent with a first portion of the assembly for a first predetermined residence time, the first solvent configured to dissolve a first predetermined target analyte;

(e) generating a first chromatogram corresponding to the first predetermined target analyte carried by the first solvent contacting the first portion of the assembly;

(f) contacting the different second solvent with a second portion of the assembly for a second predetermined residence time, the second solvent configured to dissolve a second predetermined target analyte;

(g) generating a second chromatogram corresponding to the second predetermined target analyte carried by the second solvent contacting the second portion of the assembly; and

(h) comparing the first chromatogram to a third chromatogram to output an indicator, wherein the third chromatogram corresponds to a conforming manufacturing process, wherein the third chromatogram is based on the first predetermined target analyte dissolved by the first solvent, the indicator corresponding to a level of the first predetermined target analyte in the first chromatogram relative to a predetermined threshold of the first predetermined target analyte in the third chromatogram, wherein the indicator identifies whether the level of the first predetermined target analyte in the first chromatogram is (i) below the predetermined threshold outside a set range, (ii) within the set range above or below the predetermined threshold, or (iii) above the predetermined threshold outside the set range.

11. The method of claim 10 , wherein the first chromatogram provides an indicator of the manufacturing process being in compliance with a protocol.

12. The method of claim 10 , wherein the first predetermined target analyte includes target analytes to identify the manufacturing process as conforming.

13. The method of claim 10 , wherein the first predetermined target analyte includes target analytes to identify either of the part and the board as counterfeit.

14. The method of claim 10 , wherein the first predetermined target analyte includes at least three anions and three cations.

15. The method of claim 10 , wherein connecting the part and the board includes electrically connecting the part and the board.

16. The method of claim 10 , wherein the first predetermined target analyte is selected to produce an ion chromatogram corresponding to one of the part, the board and the assembly.

17. The method of claim 10 , further comprising adjusting a volume of the first solvent in response to a volume of the assembly.

18. The method of claim 10 , wherein connecting the part and the board includes connecting a plurality of parts to the board and further comprising exposing a subset of the plurality of parts to the second solvent.

19. The method of claim 10 , further comprising contacting a third solvent with the part prior to connecting to form at least a portion of the assembly, the third solvent configured to dissolve a third predetermined target analyte.

20. The method of claim 10 , wherein the first solvent is nondestructive to the first portion of the assembly.

Assignments (4)
U.S. ABL INTELLECTUAL PROPERTY SECURITY AGREEMENT Recorded Oct 6, 2021
From: IEC ELECTRONICS CORP.
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 057725/0452 →
U.S. FIRST LIEN TERM LOAN INTELLECTUAL PROPERTY SECURITY AGREEMENT Recorded Oct 6, 2021
From: IEC ELECTRONICS CORP.
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 057725/0484 →
SECURITY INTEREST Recorded Jun 5, 2020
From: IEC ELECTRONICS CORP.
To: MANUFACTURERS AND TRADERS TRUST COMPANY
Reel/Frame 052855/0258 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 29, 2018
From: NORTHRUP, MARK
To: IEC ELECTRONICS CORP.
Reel/Frame 045179/0856 →
Continuity (2)
Provisional Application 62518874 · Jun 13, 2017
Related Publication 20180356374A1 · Dec 13, 2018