IP Library Granted Patent US 10,564,632
Granted Patent B2
US 10,564,632 · App. 15/883,497 · Granted Feb 18, 2020

Systems and methods for sensory automated material handing

Inventors: Yung-Lin Hsu (Hsin-Chu, TW); Richard Lin (Keelung, TW); Chiung-Min Lin (Zhubei, TW); Alan Yang (Hsinchu, TW)
Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
G05B19/41815H01L21/67703G05B2219/45031
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Quick Facts
Patent No.
US 10,564,632
App. No.
15/883,497
Granted
Feb 18, 2020
Kind
B2
Abstract

In an embodiment an automated material handling system (AMHS) for a semiconductor fabrication facility (FAB) includes: a sensor supported by a rail, wherein the sensor is configured to collect sensor data characterizing a vehicle that moves along the rail, wherein the vehicle is configured to carry at least one wafer; and a monitoring module configured to: detect a trigger event based on the sensor data, and initiate a remediation action in response to the trigger event.

Claims (39)

1. An automated material handling system (AMHS) for a semiconductor fabrication facility (FAB), comprising:

a sensor supported by a rail, wherein the sensor is configured to collect sensor data characterizing a vehicle that moves along the rail, wherein the sensor is mounted on a sensor extension structure supported by the stationary rail and the vehicle is configured to carry at least one wafer; and

a monitoring module configured to:

detect a trigger event based on the sensor data, and

initiate a remediation action in response to the trigger event.

2. The system of claim 1 , wherein the vehicle is configured to carry a wafer carrier that stores the at least one wafer.

3. The system of claim 1 , wherein the vehicle is movable on the rail via rolling movement.

4. The system of claim 1 , wherein the rail is stationary and the vehicle is suspended from the rail via a trolley.

5. The system of claim 1 , wherein the monitoring module is configured to:

determine the trigger event based on an analysis of historical sensor data, wherein the analysis is at least one of: an octave analysis, a spectrum analysis, a Fourier transform analysis, a joint time frequency analysis, an order analysis, an order tracking analysis, a bode plot analysis, a frequency response analysis, a vibration analysis, and a stress analysis.

6. The system of claim 5 , wherein the analysis determines the trigger event as a threshold value for the sensor data.

7. The system of claim 6 , wherein the threshold value is an outlier.

8. A system, comprising:

a sensor supported by a stationary rail, wherein the sensor is configured to collect sensor data characterizing a vehicle that moves along the stationary rail while suspended from the stationary rail via a trolley, wherein the vehicle is configured to carry at least one wafer while moving along the stationary rail via rolling movement; and

a monitoring module configured to:

determine a trigger event based on historical sensor data from the sensor,

detect the trigger event based on the sensor data, and

initiate a remediation action in response to the trigger event, wherein the trigger event is based on a noise, vibration, and harshness (NVH) study of the historical sensor data.

9. The system of claim 8 , wherein the sensor data is at least one of a transient response and steady-state response of at least one of noise and vibrations.

10. The system of claim 8 , wherein the sensor is located on an external surface of the stationary rail.

11. The system of claim 8 , wherein the sensor is mounted on a sensor extension structure supported by the stationary rail.

12. The system of claim 8 , wherein the stationary rail extends vertically within a vertical shaft.

13. A method, comprising:

collecting sensor data from a sensor supported by a rail, wherein the sensor data characterizes a vehicle that moves along the rail, wherein the vehicle is configured to carry at least one wafer while moving along the rail;

detecting a trigger event based on the sensor data; and

initiating a remediation action in response to the trigger event, wherein the trigger event is based on a noise, vibration, and harshness (NVH) study of the sensor data.

14. The method of claim 13 , comprising:

detecting another trigger event based on the sensor data; and

initiating a different remediation action in response to the another trigger event.

15. The method of claim 13 , further comprising:

determining the trigger event based on historical sensor data from the sensor.

16. The method of claim 15 , further comprising:

determining the trigger event by performing, based on the historical sensor data, at least one of: an octave analysis, a spectrum analysis, a Fourier transform analysis, a joint time frequency analysis, an order analysis, an order tracking analysis, a bode plot analysis, a frequency response analysis, a vibration analysis, and a stress analysis.

17. The method of claim 13 , wherein the trigger event is a sensor data value collected from the sensor that exceeds a threshold value.

18. The method of claim 17 , wherein the threshold value is an outlier.

19. The method of claim 13 , further comprising:

controlling the vehicle to move to a remediation area along the rail in response to the trigger event.

20. The method of claim 13 , further comprising:

collecting at least one of a transient response and steady-state response of at least one of noise and vibrations.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 3, 2020
From: HSU, YUNG-LIN; LIN, CHEN MIN; LIN, CHIUNG-MIN; YANG, YAO CHEN
To: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Reel/Frame 051409/0028 →
Continuity (2)
Provisional Application 62592010 · Nov 29, 2017
Related Publication 20190163170A1 · May 30, 2019
Cited By (4)
US 12,286,306 US 12,438,026 US 12,666,911 US 12,666,914