DEVICE AND COMPONENTS OVERHEATING EVALUATION
A method for measuring temperature of a device includes measuring temperatures for each of a plurality of components or zones of the device and combining the temperatures measured into a device total temperature. A system for measuring temperature of a device includes a processor and a non-transitory memory component operatively coupled with the processor. The non-transitory memory component has, recorded thereto, computer readable instructions configured to cause the processor to measure temperatures for each of a plurality of components or zones of the device and combine the temperatures measured into a device total temperature.
1 . A method for evaluating overheating of a device, comprising:
obtaining a plurality of temperature measurements for the device;
combining the obtained temperature measurements into a device total temperature; and
issuing an overheating notification when the device total temperature exceeds a threshold temperature.
2 . The method as set forth in claim 1 , wherein obtaining the temperature measurements further comprises obtaining temperature measurements for a plurality of components of the device.
3 . The method as set forth in claim 1 , wherein obtaining the temperature measurements further comprises reading temperature measurements from heat sensors configured to individually measure temperature of a plurality of components of the device.
4 . The method as set forth in claim 1 , wherein obtaining the temperature measurements further comprises reading one or more surface temperatures.
5 . The method as set forth in claim 1 , wherein obtaining the temperature measurements further comprises applying a load to each of a plurality of components of the device.
6 . The method as set forth in claim 1 , wherein combining the obtained temperature measurements further comprises forming a linear regression model representing the device total temperature.
7 . The method as set forth in claim 6 , further comprising determining coefficients of the linear regression model with one or more machine learning algorithms.
8 . A system for evaluating overheating of a device, comprising:
a database containing threshold temperatures for a plurality of devices;
a processor;
a non-transitory memory component operatively coupled with the processor and, having recorded thereto, computer readable instructions configured to cause the processor to:
obtain a plurality of temperature measurements for the device being evaluated;
combine the obtained temperature measurements into a device total temperature;
retrieve from the database, a threshold temperature associated with the device being evaluated; and
issue an overheating notification when the device total temperature exceeds a threshold temperature associated with the device being evaluated.
9 . The system as set forth in claim 8 , wherein the computer readable instructions are configured to cause the processor to obtain the temperature measurements by obtaining temperature measurements for a plurality of components of the device.
10 . The system as set forth in claim 8 , further comprising:
a plurality of heat sensors configured to individually measure temperature of a plurality of components of the device; and
wherein the computer readable instructions are configured to cause the processor to obtain the plurality of temperature measurements by reading temperature measurements of the plurality of heat sensors.
11 . The system as set forth in claim 8 , wherein the computer readable instructions are further configured to cause the processor to obtain the temperature measurements by reading a plurality of surface temperatures.
12 . The system as set forth in claim 8 , wherein the computer readable instructions are configured to cause the processor to apply a load to each of a plurality of components of the device.
13 . The system as set forth in claim 8 , wherein the computer readable instructions are configured to cause the processor to form a linear regression model representing the device total temperature.
14 . The system as set forth in claim 13 , wherein the computer readable instructions are configured to cause the processor to determine coefficients of the linear regression model with one or more machine learning algorithms.
15 . A non-transitory computer-readable storage medium, having recorded thereto, computer readable instructions configured to evaluate overheating of a device, wherein the instructions, when executed, cause one or more processors to:
obtain a plurality of temperature measurements for the device;
combine the obtained temperature measurements into a device total temperature; and
issue an overheating notification when the device total temperature exceeds a threshold temperature associated with the device.
16 . The non-transitory computer-readable storage medium as set forth in claim 15 , wherein the computer readable instructions are configured to cause the processor to obtain the temperature measurements by obtaining temperature measurements for a plurality of components of the device.
17 . The non-transitory computer-readable storage medium as set forth in claim 15 , wherein the computer readable instructions are configured to cause the processor to obtain the plurality of temperature measurements by reading temperature measurements of a plurality of heat sensors configured to individually measure temperature of a plurality of components of the device.
18 . The non-transitory computer-readable storage medium as set forth in claim 15 , wherein the computer readable instructions are further configured to cause the processor to obtain the temperature measurements by reading a plurality of surface temperatures.
19 . The non-transitory computer-readable storage medium as set forth in claim 15 , wherein the computer readable instructions are further configured to cause the processor to apply a load to each of the plurality of components.
20 . The non-transitory computer-readable storage medium as set forth in claim 15 , wherein the computer readable instructions are further configured to cause the processor to form a linear regression model representing the device total temperature.
21 . The non-transitory computer-readable storage medium as set forth in claim 20 , wherein the computer readable instructions are further configured to cause the processor to determine coefficients of the linear regression model with one or more machine learning algorithms.
22 . A system for measuring temperature of a device, comprising:
a processor; and
a non-transitory memory component operatively coupled with the processor and having, recorded thereto, computer readable instructions configured to cause the processor to measure temperatures for each of a plurality of components of the device and combine the temperatures measured for the plurality of components into a device total temperature.