COSMETIC DEFECT EVALUATION
A method for evaluating cosmetic defects of a device includes capturing a plurality of images of the device under a plurality of lighting conditions, processing the images of the device into one or more final images, identifying one or more defects of the device and computing a defect index from the one or more defects. The method may be performed with a system including one or more light sources, one or more cameras configured to capture a plurality of images of a device illuminated by the one or more light sources and one or more processors configured to control the lights sources and cameras, analyze the images captured by the one or more cameras, combine the images into a final image, identify one or more defects of the device and compute a defect index from the one or more defects.
1 . A method for evaluating cosmetic defects of a device comprising:
capturing a plurality of images of an exterior of the device under a plurality of lighting conditions;
processing the images of the device into one or more final images;
identifying one or more defects of the device from the final images;
computing a defect index based upon the identified one or more defects; and
issuing an evaluation of the device based upon the defect index in accordance with user-configured standards.
2 . The method as set forth in claim 1 , wherein capturing the plurality of images of the device further comprises adjusting lighting conditions with a plurality of light sources.
3 . The method as set forth in claim 1 , wherein capturing the plurality of images of the device further comprises capturing the plurality of images with a plurality of noncoplanar cameras.
4 . The method as set forth in claim 1 , wherein capturing the plurality of images of the device further comprises capturing images of all sides of the exterior without movement of the device.
5 . The method as set forth in claim 1 , wherein identifying one of more defects further comprises distinguishing between unevenness, scratches, wear, dents, cracks or discoloration.
6 . The method as set forth in claim 1 , further comprising identifying a location for one or more of the identified defects of the device.
7 . The method as set forth in claim 1 , further comprising determining a surface area of a bounding box delineating one or more of the defects of the device.
8 . The method as set forth in claim 1 , wherein computing the defect index further comprises computing the defect index from one or more of a location for one or more of the identified defects and a surface area of a bounding box delineating one or more of the identified defects.
9 . A system for evaluating cosmetic defects of a device comprising:
at least one test rig configured to capture a plurality of images of an exterior of the device; and
a processor configured to:
process images of the device captured by the at least one test rig into one or more final images;
identify one or more defects of the device from the final images;
compute a defect index based upon the identified one or more defects; and
issue an evaluation of the device based upon the defect index in accordance with user-configured standards.
10 . The system as set forth in claim 9 , wherein the at least one test rig further comprises a plurality of light sources.
11 . The system as set forth in claim 9 , wherein the test rig further comprises a plurality of noncoplanar cameras.
12 . The system as set forth in claim 9 , wherein the test rig is configured to capture the plurality of images of the exterior of the device from all sides without movement of the device.
13 . The system as set forth in claim 9 , wherein one or more defects are identified by distinguishing between unevenness, scratches, wear, dents, cracks or discoloration.
14 . The system as set forth in claim 9 , wherein the processor is further configured to identify a location for one or more of the identified defects of the device.
15 . The system as set forth in claim 9 , wherein the processor is further configured to determine a surface area of a bounding box delineating one or more of the identified defects of the device.
16 . The system as set forth in claim 9 , wherein the processor is further configured to compute the defect index from one or more of a location for one or more of the identified defects and a surface area of a bounding box delineating one or more of the identified defects.
17 . A computer program product including a non-transitory computer-readable storage medium storing computer-executable code for evaluating cosmetic defects of a device, wherein the code, when executed, is configured to cause one or more computers to:
record a plurality of images of an exterior of the device under a plurality of lighting conditions;
process the images of the device into one or more final images;
identify one or more defects of the device from the final images;
compute a defect index based upon the identified one or more defects; and
issue an evaluation of the device based upon the defect index in accordance with user-configured standards.
18 . The computer program product as set forth in claim 17 , wherein the code configured to cause the one or more computers to record a plurality of images of the device is further configured to cause the one or more computers to adjust lighting conditions with a plurality of light sources.
19 . The computer program product as set forth in claim 17 , wherein the code configured to cause the one or more computers to record the plurality of images is further configured to cause the one or more computers to record the plurality of images with a plurality of noncoplanar cameras.
20 . The computer program product as set forth in claim 17 , wherein the code configured to cause the one or more computers to record the plurality of images is further configured to cause the one or more computers to record images of all sides of the exterior without movement of the device.
21 . The computer program product as set forth in claim 17 , wherein the code configured to cause one or more computers to identify one of more defects is further configured to cause one or more computers to distinguish between unevenness, scratches, wear, dents, cracks or discoloration.
22 . The computer program product as set forth in claim 17 , wherein the code, when executed, is further configured to cause one or more computers to identify a location for one or more of the identified defects of the device.
23 . The computer program product as set forth in claim 17 , wherein the code, when executed, is further configured to cause one or more computers to determine a surface area of a bounding box delineating one or more of the defects of the device.
24 . The computer program product as set forth in claim 17 , wherein the code configured to cause one or more computers to compute the defect index is further configured to cause the one or more computers to compute the defect index from one or more of a location for one or more of the identified defects and a surface area of a bounding box delineating one or more of the defects of the device.
25 . A method for evaluating cosmetic defects of a device comprising:
recording a plurality of images of the device under a plurality of lighting conditions;
processing the images of the device into one or more final images;
identifying one or more defects of the device from the one or more final images; and
computing a defect index from the one or more identified defects.