Spectrum measuring device, spectroscopic device, and spectroscopic system

1. A spectrum measuring device comprising:

a ribbon element including

a first light reflector including a plurality of first light reflection surfaces configured to be translated in an out-of-plane direction, and

a second light reflector including a plurality of second light reflection surfaces that are stable;

a light detection element configured to detect, on a single light receiving surface, light quantity data indicating a light quantity of light reflected by the first light reflection surfaces and the second light reflection surfaces;

circuitry to:

supply a drive signal to the ribbon element in such a manner that a change of a displacement amount difference between the first light reflection surfaces and the second light reflection surfaces corresponds to a predetermined frequency; and

acquire the light quantity data detected by the light detection element at a predetermined sampling frequency.

2. The spectrum measuring device according to claim 1 ,

wherein the predetermined frequency is equal to a frequency of the drive signal.

3. The spectrum measuring device according to claim 1 ,

wherein the light detection element detects, of light reflected by the ribbon element, a component other than a component of incident light that is regularly reflected by the ribbon element.

4. The spectrum measuring device according to claim 1 ,

wherein the first light reflector and the second light reflector are adjacent to each other in the ribbon element.

5. The spectrum measuring device according to claim 1 ,

wherein, in a state in which the drive signal is not supplied to the ribbon element, the first light reflection surfaces and the second light reflection surfaces are at different locations in the out-of-plane direction.

6. The spectrum measuring device according to claim 1 ,

wherein the circuitry further calculates, on the basis of a data stream of the light quantity data acquired, an intensity of light that is input to the ribbon element at each wavelength.

7. The spectrum measuring device according to claim 6 ,

wherein the circuitry further calculates, at each time when the light quantity is acquired, an average of a plurality of light quantity data items detected by the light detection element around the timing, and

wherein the circuitry further calculates, on the basis of a data stream of the average of the light quantity data items, the intensity of light that is input to the ribbon element at each wavelength.

8. The spectrum measuring device according to claim 1 ,

wherein the drive signal is a signal having a triangular waveform.

9. The spectrum measuring device according to claim 1 ,

wherein the drive signal is a signal having a sinusoidal waveform.

10. The spectrum measuring device according to claim 8 ,

wherein the ribbon element further includes a piezoelectric body formed in a vicinity of the first light reflector, and

wherein the circuitry supplies the drive signal to the piezoelectric body to change the displacement amount difference between the first light reflection surfaces and the second light reflection surfaces.

11. A spectroscopic device comprising:

the spectrum measuring device according to claim 1 ; and

a light source,

wherein a measurement target is irradiated with light from the light source, and light reflected by the measurement target is incident on the spectrum measuring device.

12. The spectroscopic device according to claim 11 ,

wherein the circuitry further transmits the light quantity data acquired by the light detection element, to an external device.

13. A spectroscopic system comprising:

the spectrum measuring device of claim 1 ; and

an information processing apparatus to calculate, on the basis of a data stream of the light quantity data acquired by the light detection element, an intensity of light that is input to the ribbon element at each wavelength.