Scanning electron microscope
A scanning electron microscope having a charged particle device that processes a specimen using a charged particle beam, the scanning electron microscope includes: an electron source; a secondary-electron detector that detects secondary electrons generated from the specimen; a backscattered-electron detector that is disposed closer to the electron source than a detection surface of the secondary-electron detector to detect backscattered electrons generated from the specimen; a shielding plate for shielding a detection surface of the backscattered-electron detector; and a moving mechanism that moves the shielding plate. In a state where the shielding plate is moved by the moving mechanism so as to shield the detection surface of the backscattered-electron detector, the shielding plate is located between the detection surface of the backscattered-electron detector and the detection surface of the secondary-electron detector.
1. A scanning electron microscope having a charged particle device that processes a specimen using a charged particle beam, the scanning electron microscope comprising:
an electron source;
a secondary-electron detector that detects secondary electrons generated from the specimen;
a backscattered-electron detector that is disposed closer to the electron source than a detection surface of the secondary-electron detector to detect backscattered electrons generated from the specimen;
a shielding plate for shielding a detection surface of the backscattered-electron detector; and
a moving mechanism that moves the shielding plate, wherein
in a state where the shielding plate is moved by the moving mechanism so as to shield the detection surface of the backscattered-electron detector, the shielding plate is located between the detection surface of the backscattered-electron detector and the detection surface of the secondary-electron detector.
2. The scanning electron microscope according to claim 1 , further comprising:
an objective lens, wherein
the objective lens has a configuration in which the specimen is placed in a lens magnetic field generated by the objective lens.
3. The scanning electron microscope according to claim 2 , wherein
the objective lens has a first opening provided to extend in a direction orthogonal to an optical axis of the objective lens and allow the secondary-electron detector to pass therethrough and a second opening provided to extend in a direction orthogonal to the optical axis and allow the shielding plate to pass therethrough, and
each of the first opening and the second opening has a shape having a longitudinal direction along the optical axis when viewed from the direction orthogonal to the optical axis.
4. The scanning electron microscope according to claim 1 , wherein a predetermined voltage is applied to the shielding plate to cause a repulsive force between the shielding plate and the secondary electrons.
5. The scanning electron microscope according to claim 1 , wherein the charged particle device is a focused ion-beam device.
6. The scanning electron microscope according to claim 1 , wherein the secondary-electron detector detects secondary electrons generated by irradiation of the charged particle beam emitted from the charged particle device to the specimen.