Apparatus of plural charged-particle beams
A multi-beam apparatus for observing a sample with high resolution and high throughput and in flexibly varying observing conditions is proposed. The apparatus uses a movable collimating lens to flexibly vary the currents of the plural probe spots without influencing the intervals thereof, a new source-conversion unit to form the plural images of the single electron source and compensate off-axis aberrations of the plural probe spots with respect to observing conditions, and a pre-beamlet-forming means to reduce the strong Coulomb effect due to the primary-electron beam.
1. A multi-beam apparatus for observing a surface of a sample, the apparatus comprising:
an electron source that is a source of electrons of an electron beam and that is aligned with a primary optical axis of the apparatus; and
an adjustable collimating lens having a principal plane and configured to change paths of the electrons of the electron beam, wherein the adjustable collimating lens is aligned with the primary optical axis, and wherein the principal plane is moveable along the primary optical axis to vary currents of a plurality of beamlets that are derived from the electron beam.
2. The apparatus of claim 1 , wherein the adjustable collimating lens comprises a plurality of magnetic lenses that are positioned along the primary optical axis.
3. The apparatus of claim 2 , wherein the principal plane of the adjustable collimating lens is moveable along the primary optical axis by adjusting excitations of at least two of the plurality of magnetic lenses.
4. The apparatus of claim 1 , wherein the adjustable collimating lens comprises a plurality of annular electrodes that are positioned along the primary optical axis.
5. The apparatus of claim 4 , wherein the principal plane of the adjustable collimating lens is moveable along the primary optical axis by adjusting excitations of at least two of the plurality of annular electrodes.
6. The apparatus of claim 1 , wherein the adjustable collimating lens comprises a magnetic lens and an annular electrode, wherein the magnetic lens and the annular electrode are positioned along the primary optical axis.
7. The apparatus of claim 6 , wherein the principal plane of the adjustable collimating lens is moveable along the primary optical axis by adjusting excitations of the magnetic lens and the annular electrode.
8. The apparatus of claim 1 , further comprising:
a pre-beamlet-forming array including a plurality of beamlet-forming apertures to divide the electron beam into the plurality of beamlets.
9. The apparatus of claim 8 , wherein the pre-beamlet-forming array includes a plurality of beamlet-forming apertures to trim the electron beam into the plurality of beamlets.